{"id":"https://openalex.org/W2149337256","doi":"https://doi.org/10.1109/dft.2006.45","title":"Multi-Site and Multi-Probe Substrate Testing on an ATE","display_name":"Multi-Site and Multi-Probe Substrate Testing on an ATE","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W2149337256","doi":"https://doi.org/10.1109/dft.2006.45","mag":"2149337256"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2006.45","doi":"https://doi.org/10.1109/dft.2006.45","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2006.45","pdf_url":null,"source":{"id":"https://openalex.org/S4210201526","display_name":"Proceedings","issn_l":"1550-5774","issn":["1550-5774","2377-7966"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W2149337256"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062123396","display_name":"Xiaojun Ma","orcid":"https://orcid.org/0000-0001-6851-3644","observed_orcids":["https://orcid.org/0000-0001-6851-3644"]},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaojun Ma","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245","observed_orcids":["https://orcid.org/0000-0003-3152-3245","https://orcid.org/0000-0002-3478-3766"]},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fabrizio Lombardi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I12912129"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"3","issue":null,"first_page":"495","last_page":"506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9580000042915344,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9580000042915344,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.03519999980926514,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"automatic test equipment","score":0.7889999747276306},{"id":"https://openalex.org/keywords/multi-site-testing","display_name":"multi-site testing","score":0.7770000100135803},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.6610000133514404},{"id":"https://openalex.org/keywords/test-time-reduction","display_name":"test time reduction","score":0.6029999852180481}],"concepts":[{"id":"https://openalex.org/C2983696493","wikidata":"https://www.wikidata.org/wiki/Q7705730","display_name":"Test site","level":2,"score":0.4874908924102783},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41362494230270386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.40422332286834717},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.385653018951416},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33859187364578247},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3252136707305908},{"id":"https://openalex.org/C16674752","wikidata":"https://www.wikidata.org/wiki/Q1370637","display_name":"Mining engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2006.45","doi":"https://doi.org/10.1109/dft.2006.45","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2006.45","pdf_url":null,"source":{"id":"https://openalex.org/S4210201526","display_name":"Proceedings","issn_l":"1550-5774","issn":["1550-5774","2377-7966"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1986027887","https://openalex.org/W2093113615","https://openalex.org/W2106752233","https://openalex.org/W2109664674","https://openalex.org/W2110542770","https://openalex.org/W2111560049","https://openalex.org/W2126108161","https://openalex.org/W2167837882","https://openalex.org/W3148996927","https://openalex.org/W4248881643"],"related_works":["https://openalex.org/W2050826986","https://openalex.org/W2106752233","https://openalex.org/W2140787031","https://openalex.org/W2360235167","https://openalex.org/W2105295095","https://openalex.org/W3021433722","https://openalex.org/W2110542770","https://openalex.org/W2137111541","https://openalex.org/W2052114799","https://openalex.org/W2156412034"],"abstract_inverted_index":{"This":[0,57],"paper":[1],"presents":[2],"a":[3,22,34,79,92,105,113],"novel":[4],"method":[5,103,115],"that":[6,47,70],"utilizes":[7],"multi-site":[8,62],"and":[9,38],"multi-probe":[10],"facilities":[11],"in":[12,109],"an":[13,31,84],"ATE":[14,32,85,100],"for":[15,21,83,98],"substrate":[16],"testing.":[17],"The":[18],"test":[19,42,53,110],"time":[20,54,111],"batch":[23,52,68],"can":[24],"be":[25,75],"considerably":[26],"reduced":[27],"by":[28],"efficiently":[29],"utilizing":[30],"with":[33,86],"number":[35],"of":[36,91,107,119],"flying-probes":[37],"multiple":[39,72],"substrates":[40],"under":[41],"(SUTs).":[43],"An":[44],"analytical":[45],"model":[46,58],"predicts":[48],"very":[49],"accurately":[50],"the":[51,60,67,101,120],"is":[55],"proposed.":[56],"establishes":[59],"optimal":[61],"configuration":[63],"as":[64,89],"corresponding":[65],"to":[66,74],"size":[69],"allow":[71],"SUTs":[73],"simultaneously":[76],"tested":[77],"on":[78],"ATE.":[80],"Simulation":[81],"results":[82],"12":[87],"flying-probe":[88],"example":[90],"commercially":[93],"available":[94],"tester":[95],"are":[96],"provided;":[97],"this":[99],"proposed":[102],"achieves":[104],"reduction":[106],"54.66%":[108],"over":[112],"single-site":[114],"(at":[116],"complete":[117],"coverage":[118],"modeled":[121],"faults)":[122]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}