{"id":"https://openalex.org/W2148147181","doi":"https://doi.org/10.1093/jmicro/dfq027","title":"Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun","display_name":"Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun","publication_year":2010,"publication_date":"2010-06-27","ids":{"openalex":"https://openalex.org/W2148147181","doi":"https://doi.org/10.1093/jmicro/dfq027","mag":"2148147181","pmid":"https://pubmed.ncbi.nlm.nih.gov/20581425"},"language":"en","primary_location":{"id":"doi:10.1093/jmicro/dfq027","doi":"https://doi.org/10.1093/jmicro/dfq027","is_oa":false,"landing_page_url":"https://doi.org/10.1093/jmicro/dfq027","pdf_url":null,"source":{"id":"https://openalex.org/S145845511","display_name":"Journal of Electron Microscopy","issn_l":"0022-0744","issn":["0022-0744","1477-9986"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310311648","host_organization_name":"Oxford University Press","host_organization_lineage":["https://openalex.org/P4310311648","https://openalex.org/P4310311647"],"host_organization_lineage_names":["Oxford University Press","University of Oxford"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electron Microscopy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022229043","display_name":"Takeo Sasaki","orcid":"https://orcid.org/0000-0001-7838-7741","observed_orcids":["https://orcid.org/0000-0001-7838-7741"]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"T. Sasaki","raw_affiliation_strings":["Japan Science and Technology Agency, CREST, Chiyoda-ku, Tokyo, Japan. tasasaki@jeol.co.jp","JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, Chiyoda-ku, Tokyo, Japan. tasasaki@jeol.co.jp","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]},{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065977516","display_name":"Hidetaka Sawada","orcid":"https://orcid.org/0000-0002-6078-2695","observed_orcids":["https://orcid.org/0000-0002-6078-2695"]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Sawada","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]},{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113373881","display_name":"F. Hosokawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"F. Hosokawa","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102753699","display_name":"Yuji Kohno","orcid":"https://orcid.org/0009-0002-7863-1833","observed_orcids":["https://orcid.org/0009-0002-7863-1833"]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Kohno","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108901796","display_name":"T. Tomita","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Tomita","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]},{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110099337","display_name":"T. Kaneyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kaneyama","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]},{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031085745","display_name":"Yosuke Kondo","orcid":"https://orcid.org/0000-0001-6354-3270","observed_orcids":["https://orcid.org/0000-0001-6354-3270"]},"institutions":[{"id":"https://openalex.org/I129923673","display_name":"JEOL (Japan)","ror":"https://ror.org/02zme4e72","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Kondo","raw_affiliation_strings":["JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan","institution_ids":["https://openalex.org/I129923673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013335201","display_name":"Koji Kimoto","orcid":"https://orcid.org/0000-0002-3927-0492","observed_orcids":["https://orcid.org/0000-0002-3927-0492"]},"institutions":[{"id":"https://openalex.org/I205401836","display_name":"National Institute for Materials Science","ror":"https://ror.org/026v1ze26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I205401836"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kimoto","raw_affiliation_strings":["Advanced Nano-Characterization Center, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan","Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Nano-Characterization Center, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan","institution_ids":["https://openalex.org/I205401836"]},{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072163128","display_name":"Yuta Sato","orcid":"https://orcid.org/0000-0002-4231-6287","observed_orcids":["https://orcid.org/0000-0002-4231-6287"]},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sato","raw_affiliation_strings":["Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 5, Higashi 1-1-1 Tsukuba, Ibaraki 305-8565, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 5, Higashi 1-1-1 Tsukuba, Ibaraki 305-8565, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062940537","display_name":"Kazu Suenaga","orcid":"https://orcid.org/0000-0002-6107-1123","observed_orcids":["https://orcid.org/0000-0002-6107-1123"]},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Suenaga","raw_affiliation_strings":["Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 5, Higashi 1-1-1 Tsukuba, Ibaraki 305-8565, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 5, Higashi 1-1-1 Tsukuba, Ibaraki 305-8565, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022229043"],"corresponding_institution_ids":["https://openalex.org/I129923673","https://openalex.org/I4210086780"],"apc_list":null,"apc_paid":null,"fwci":3.8853,"has_fulltext":false,"cited_by_count":103,"citation_normalized_percentile":{"value":0.97185607,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":100},"biblio":{"volume":"59","issue":"S1","first_page":"S7","last_page":"S13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-voltage-electron-microscopy","display_name":"low-voltage electron microscopy","score":0.8379999995231628},{"id":"https://openalex.org/keywords/cold-field-emission-gun","display_name":"cold field emission gun","score":0.9229999780654907},{"id":"https://openalex.org/keywords/astigmatism-correction","display_name":"astigmatism correction","score":0.8230000138282776},{"id":"https://openalex.org/keywords/high-angle-annular-dark-field-imaging","display_name":"high-angle annular dark-field imaging","score":0.8450000286102295},{"id":"https://openalex.org/keywords/radiation-damage-reduction","display_name":"radiation damage reduction","score":0.6600000262260437},{"id":"https://openalex.org/keywords/atomic-resolution-imaging","display_name":"atomic resolution imaging","score":0.6399999856948853},{"id":"https://openalex.org/keywords/single-walled-carbon-nanotubes","display_name":"single-walled carbon nanotubes","score":0.8809999823570251},{"id":"https://openalex.org/keywords/amorphous-germanium-films","display_name":"amorphous germanium films","score":0.765999972820282}],"concepts":[{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.7542513012886047},{"id":"https://openalex.org/C2776808300","wikidata":"https://www.wikidata.org/wiki/Q5446996","display_name":"Field emission gun","level":3,"score":0.7359492182731628},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.706829309463501},{"id":"https://openalex.org/C122802935","wikidata":"https://www.wikidata.org/wiki/Q829575","display_name":"Acceleration voltage","level":4,"score":0.7036049365997314},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.6405901908874512},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5942327976226807},{"id":"https://openalex.org/C70638346","wikidata":"https://www.wikidata.org/wiki/Q2913798","display_name":"Spherical aberration","level":3,"score":0.592828631401062},{"id":"https://openalex.org/C179156687","wikidata":"https://www.wikidata.org/wiki/Q1128174","display_name":"Electron gun","level":4,"score":0.5484828948974609},{"id":"https://openalex.org/C53120450","wikidata":"https://www.wikidata.org/wiki/Q899540","display_name":"Dark field microscopy","level":3,"score":0.526943564414978},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.4369894564151764},{"id":"https://openalex.org/C178423520","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Conventional transmission electron microscope","level":4,"score":0.4334045648574829},{"id":"https://openalex.org/C161368742","wikidata":"https://www.wikidata.org/wiki/Q874906","display_name":"High-resolution transmission electron microscopy","level":3,"score":0.42489269375801086},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33242321014404297},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.326797217130661},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.3135470449924469},{"id":"https://openalex.org/C95312477","wikidata":"https://www.wikidata.org/wiki/Q207340","display_name":"Cathode ray","level":3,"score":0.30662375688552856},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16519752144813538},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13352108001708984},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1093/jmicro/dfq027","doi":"https://doi.org/10.1093/jmicro/dfq027","is_oa":false,"landing_page_url":"https://doi.org/10.1093/jmicro/dfq027","pdf_url":null,"source":{"id":"https://openalex.org/S145845511","display_name":"Journal of Electron Microscopy","issn_l":"0022-0744","issn":["0022-0744","1477-9986"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310311648","host_organization_name":"Oxford University Press","host_organization_lineage":["https://openalex.org/P4310311648","https://openalex.org/P4310311647"],"host_organization_lineage_names":["Oxford University Press","University of Oxford"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electron Microscopy","raw_type":"journal-article"},{"id":"pmid:20581425","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/20581425","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of electron microscopy","raw_type":"Journal Article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.870.9036","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.870.9036","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://jmicro.oxfordjournals.org/content/59/S1/S7.full.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.879.1259","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.879.1259","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://jmicro.oxfordjournals.org/content/early/2010/06/27/jmicro.dfq027.full.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1576173514","https://openalex.org/W1876297499","https://openalex.org/W1966272533","https://openalex.org/W2015279717","https://openalex.org/W2039739820","https://openalex.org/W2043316095","https://openalex.org/W2048864519","https://openalex.org/W2058478696","https://openalex.org/W2078778940","https://openalex.org/W2083638794","https://openalex.org/W2088538141","https://openalex.org/W2136237632","https://openalex.org/W2140137456","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W7099280967","https://openalex.org/W2087124106","https://openalex.org/W2161603942","https://openalex.org/W2066593994","https://openalex.org/W3117119187","https://openalex.org/W2744737199","https://openalex.org/W2529806012","https://openalex.org/W2032193416","https://openalex.org/W2017658203","https://openalex.org/W2051585761"],"abstract_inverted_index":{"To":[0],"reduce":[1],"radiation":[2],"damage":[3],"caused":[4],"by":[5,164],"the":[6,87],"electron":[7,23,50,77,82],"beam":[8],"and":[9,32,38,65,80,114,119,123,144,149],"to":[10,58,109,140],"obtain":[11],"high-contrast":[12],"images":[13,101,128],"of":[14,94,102,112,125,129,142],"specimens,":[15],"we":[16],"have":[17],"developed":[18],"a":[19,27,103],"highly":[20],"stabilized":[21],"transmission":[22,49,76,81],"microscope":[24],"equipped":[25],"with":[26,134,167],"cold":[28],"field":[29,99],"emission":[30],"gun":[31],"spherical":[33,63],"aberration":[34,54,64],"correctors":[35],"for":[36,61],"image-":[37],"probe-forming":[39],"systems,":[40],"which":[41,157],"operates":[42],"at":[43,117,147],"lower":[44],"acceleration":[45],"voltages":[46],"than":[47],"conventional":[48],"microscopes.":[51],"A":[52],"delta-type":[53],"corrector":[55],"is":[56],"designed":[57],"simultaneously":[59],"compensate":[60],"third-order":[62],"fifth-order":[66],"6-fold":[67],"astigmatism.":[68],"Both":[69],"were":[70,161],"successfully":[71,162],"compensated":[72],"in":[73,86],"both":[74],"scanning":[75],"microscopy":[78,83],"(STEM)":[79],"(TEM)":[84],"modes":[85],"range":[88],"30-60":[89],"kV.":[90],"The":[91],"Fourier":[92],"transforms":[93],"raw":[95,126],"high-angle":[96],"annular":[97],"dark":[98],"(HAADF)":[100],"Si[110]":[104],"sample":[105],"revealed":[106],"spots":[107,138],"corresponding":[108,139],"lattice":[110],"spacings":[111,141],"111":[113],"96":[115],"pm":[116,146],"30":[118,148],"60":[120,150],"kV,":[121,151],"respectively,":[122],"those":[124],"TEM":[127],"an":[130,168],"amorphous":[131],"Ge":[132],"film":[133],"gold":[135],"particles":[136],"showed":[137],"91":[143],"79":[145],"respectively.":[152],"Er@C(82)-doped":[153],"single-walled":[154],"carbon":[155],"nanotubes,":[156],"are":[158],"carbon-based":[159],"samples,":[160],"observed":[163],"HAADF-STEM":[165],"imaging":[166],"atomic-level":[169],"resolution.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":11},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":16}],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2016-06-24T00:00:00"}