{"id":"https://openalex.org/W2145991447","doi":"https://doi.org/10.1109/3dim.2005.68","title":"Registration of Multiple Range Scans as a Location Recognition Problem: Hypothesis Generation, Refinement and Verification","display_name":"Registration of Multiple Range Scans as a Location Recognition Problem: Hypothesis Generation, Refinement and Verification","publication_year":2005,"publication_date":"2005-06-28","ids":{"openalex":"https://openalex.org/W2145991447","doi":"https://doi.org/10.1109/3dim.2005.68","mag":"2145991447"},"language":"en","primary_location":{"id":"doi:10.1109/3dim.2005.68","doi":"https://doi.org/10.1109/3dim.2005.68","is_oa":false,"landing_page_url":"https://doi.org/10.1109/3dim.2005.68","pdf_url":null,"source":{"id":"https://openalex.org/S4210179741","display_name":"International Conference on 3-D Digital Imaging and Modeling (3DIM)","issn_l":"1550-6185","issn":["1550-6185"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifth International Conference on 3-D Digital Imaging and Modeling (3DIM'05)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081207591","display_name":"Bradford J. King","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.J. King","raw_affiliation_strings":["Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067498868","display_name":"Tomasz Malisiewicz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Malisiewicz","raw_affiliation_strings":["Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035964079","display_name":"Charles V. Stewart","orcid":"https://orcid.org/0000-0001-6532-6675","observed_orcids":["https://orcid.org/0000-0001-6532-6675"]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.V. Stewart","raw_affiliation_strings":["Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"[Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA]","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049207791","display_name":"Richard J. Radke","orcid":"https://orcid.org/0000-0001-5064-7775","observed_orcids":["https://orcid.org/0000-0001-5064-7775"]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.J. Radke","raw_affiliation_strings":["Department of ECSE, Rensselaer Polytechnic Institute, Troy, NY, USA","Rensselaer Polytechnic Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECSE, Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I165799507"],"apc_list":null,"apc_paid":null,"fwci":3.425,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.92579847,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"180","last_page":"187"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9574999809265137,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9574999809265137,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.024299999698996544,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.012299999594688416,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/place-recognition","display_name":"place recognition","score":0.6899999976158142},{"id":"https://openalex.org/keywords/keypoint-matching","display_name":"feature point matching","score":0.7089999914169312},{"id":"https://openalex.org/keywords/spin-images","display_name":"spin images","score":0.9290000200271606},{"id":"https://openalex.org/keywords/iterative-closest-point","display_name":"iterative closest point","score":0.746999979019165},{"id":"https://openalex.org/keywords/region-growing","display_name":"region growing","score":0.8050000071525574},{"id":"https://openalex.org/keywords/visibility","display_name":"visibility","score":0.4269999861717224},{"id":"https://openalex.org/keywords/randomness-measures","display_name":"randomness measures","score":0.7400000095367432},{"id":"https://openalex.org/keywords/3d-reconstruction","display_name":"3D reconstruction","score":0.44600000977516174}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7292085886001587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.703514039516449},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.6786988973617554},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.6572046279907227},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6389358043670654},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.6291177272796631},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.6105738878250122},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.5647097229957581},{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.5635104775428772},{"id":"https://openalex.org/C126795593","wikidata":"https://www.wikidata.org/wiki/Q7333813","display_name":"Rigid transformation","level":2,"score":0.49021202325820923},{"id":"https://openalex.org/C166704113","wikidata":"https://www.wikidata.org/wiki/Q861092","display_name":"Image registration","level":3,"score":0.477710485458374},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.46299538016319275},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.4278801679611206},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3243783712387085},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24017122387886047},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07201644778251648},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/3dim.2005.68","doi":"https://doi.org/10.1109/3dim.2005.68","is_oa":false,"landing_page_url":"https://doi.org/10.1109/3dim.2005.68","pdf_url":null,"source":{"id":"https://openalex.org/S4210179741","display_name":"International Conference on 3-D Digital Imaging and Modeling (3DIM)","issn_l":"1550-6185","issn":["1550-6185"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifth International Conference on 3-D Digital Imaging and Modeling (3DIM'05)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.150.2469","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.150.2469","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.cmu.edu/~tmalisie/projects/3dim05/king-3dim05.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.61.1150","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.61.1150","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.vision.cs.rpi.edu/research/../publications/pdfs/king-3ddim05.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.61.1184","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.61.1184","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.vision.cs.rpi.edu/publications/pdfs/king-3ddim.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309500","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1564871316","https://openalex.org/W1857000355","https://openalex.org/W1883517952","https://openalex.org/W2025529320","https://openalex.org/W2049981393","https://openalex.org/W2050551672","https://openalex.org/W2063549868","https://openalex.org/W2075690349","https://openalex.org/W2085100338","https://openalex.org/W2087063852","https://openalex.org/W2099088762","https://openalex.org/W2119851068","https://openalex.org/W2123963008","https://openalex.org/W2125989410","https://openalex.org/W2129116707","https://openalex.org/W2136614571","https://openalex.org/W2137990555","https://openalex.org/W2139291719","https://openalex.org/W2144473577","https://openalex.org/W2145828616","https://openalex.org/W2151103935","https://openalex.org/W2158391005","https://openalex.org/W2163210958","https://openalex.org/W2172188317","https://openalex.org/W3152336969"],"related_works":["https://openalex.org/W2514807011","https://openalex.org/W7096621460","https://openalex.org/W2041011661","https://openalex.org/W2107916636","https://openalex.org/W1998690376","https://openalex.org/W7096275927","https://openalex.org/W2130086590","https://openalex.org/W25422038","https://openalex.org/W1980967702","https://openalex.org/W7100292835"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,7,49,52,169,209],"following":[4],"version":[5],"of":[6,25,51,168,208],"multiple":[8],"range":[9,71,109],"scan":[10,154],"registration":[11],"problem.":[12],"A":[13,107,142],"scanner":[14],"with":[15,174],"an":[16],"associated":[17],"intensity":[18,73,133],"camera":[19],"is":[20,39,59,94,112,145,162,183,185],"placed":[21],"at":[22,34],"a":[23,28,79,90,149,156,165,180,194],"series":[24],"locations":[26,69],"throughout":[27],"large":[29],"environment;":[30],"scans":[31,44,207],"are":[32,99,126],"acquired":[33],"each":[35,83],"location.":[36],"The":[37],"problem":[38],"to":[40,47,105,118,138,155],"decide":[41],"automatically":[42],"which":[43],"overlap":[45],"and":[46,64,72,77,86,136,161,193],"estimate":[48,81,93],"parameters":[50],"transformations":[53],"aligning":[54],"these":[55,97,199],"scans.":[56],"Our":[57],"technique":[58,111],"based":[60,186],"on":[61,187],"(1)":[62],"detecting":[63],"matching":[65,148],"keypoints":[66,125],"-":[67],"distinctive":[68],"in":[70,121,172,205],"images,":[74],"(2)":[75],"generating":[76],"refining":[78],"transformation":[80,144,182],"from":[82,152,159],"keypoint":[84,110,151,158],"match,":[85],"(3)":[87],"deciding":[88],"if":[89],"given":[91],"refined":[92,163,181],"correct.":[95],"While":[96],"steps":[98,201],"familiar,":[100],"we":[101],"present":[102],"novel":[103,195],"approaches":[104],"each.":[106],"new":[108],"presented":[113],"that":[114],"uses":[115],"spin":[116],"images":[117],"describe":[119],"holes":[120],"smooth":[122],"surfaces.":[123],"Intensity":[124],"detected":[127],"using":[128,132,164],"multiscale":[129],"filters,":[130],"described":[131],"gradient":[134],"histograms,":[135],"backprojected":[137],"form":[139,167],"3D":[140],"keypoints.":[141],"hypothesized":[143],"generated":[146],"by":[147],"single":[150,157],"one":[153],"another,":[160],"robust":[166],"ICP":[170],"algorithm":[171],"combination":[173],"controlled":[175],"region":[176],"growing.":[177],"Deciding":[178],"whether":[179],"correct":[184],"three":[188,200],"criteria:":[189],"alignment":[190],"accuracy,":[191],"visibility,":[192],"randomness":[196],"measure.":[197],"Together":[198],"produce":[202],"good":[203],"results":[204],"test":[206],"Rensselaer":[210],"campus.":[211]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}