{"id":"https://openalex.org/W2145852042","doi":"https://doi.org/10.1109/82.539002","title":"Analog fault diagnosis based on ramping power supply current signature clusters","display_name":"Analog fault diagnosis based on ramping power supply current signature clusters","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W2145852042","doi":"https://doi.org/10.1109/82.539002","mag":"2145852042"},"language":"en","primary_location":{"id":"doi:10.1109/82.539002","doi":"https://doi.org/10.1109/82.539002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/82.539002","pdf_url":null,"source":{"id":"https://openalex.org/S81140365","display_name":"IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing","issn_l":"1057-7130","issn":["1057-7130","1558-125X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/ffc5664b-67eb-42ce-b33f-4a83c8694393","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046257628","display_name":"S.A.S. Somayajula","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.A.S. Somayajula","raw_affiliation_strings":["Crystal Semiconductor Corporation, Austin, TX, USA","Electrical Engineering Department, Texas A and M University, College Station, TX, USA","Dept. of Electr Eng., Texas A&M Univ., College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Crystal Semiconductor Corporation, Austin, TX, USA","institution_ids":[]},{"raw_affiliation_string":"Electrical Engineering Department, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Electr Eng., Texas A&M Univ., College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019857998","display_name":"E. S\u00e1nchez\u2010Sinencio","orcid":"https://orcid.org/0000-0003-2116-1842","observed_orcids":["https://orcid.org/0000-0003-2116-1842"]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Sanchez-Sinencio","raw_affiliation_strings":["Electrical Engineering Department, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050945839","display_name":"Jos\u00e9 Pineda de Gyvez","orcid":"https://orcid.org/0000-0002-0723-7065","observed_orcids":["https://orcid.org/0000-0002-0723-7065"]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Pineda de Gyvez","raw_affiliation_strings":["Electrical Engineering Department, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":3.4827,"has_fulltext":true,"cited_by_count":57,"citation_normalized_percentile":{"value":0.93613636,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"43","issue":"10","first_page":"703","last_page":"712"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analog-fault-diagnosis","display_name":"analog fault diagnosis","score":0.9789999723434448},{"id":"https://openalex.org/keywords/cmos-operational-transconductance-amplifier","display_name":"CMOS operational transconductance amplifier","score":0.8510000109672546},{"id":"https://openalex.org/keywords/industrial-defect-detection","display_name":"industrial defect detection","score":0.722000002861023}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6189032196998596},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5983321070671082},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.594083309173584},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5681182146072388},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.553275465965271},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.48381131887435913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48188310861587524},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4660882353782654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46390244364738464},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43162912130355835},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.42304760217666626},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36718589067459106},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33905696868896484},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08960488438606262},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.1109/82.539002","doi":"https://doi.org/10.1109/82.539002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/82.539002","pdf_url":null,"source":{"id":"https://openalex.org/S81140365","display_name":"IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing","issn_l":"1057-7130","issn":["1057-7130","1558-125X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing","raw_type":"journal-article"},{"id":"pmh:oai:pure.tue.nl:openaire/ffc5664b-67eb-42ce-b33f-4a83c8694393","doi":null,"is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/ffc5664b-67eb-42ce-b33f-4a83c8694393","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Somayajula, S A S, Sanchez-Sinencio, E & Pineda de Gyvez, J 1996, 'Analog fault diagnosis based on ramping power supply current signature clusters', IEEE Transactions on Circuits and Systems. II, Analog and Digital Signal Processing, vol. 43, no. 10, pp. 703-712. https://doi.org/10.1109/82.539002","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:709453","doi":null,"is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=709453","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:1057-7130","raw_type":"Article / Letter to the editor"},{"id":"pmh:oai:library.tue.nl:709453","doi":null,"is_oa":false,"landing_page_url":"http://repository.tue.nl/709453","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:1057-7130","raw_type":"Article / Letter to the editor"},{"id":"pmh:tue:oai:library.tue.nl:709453","doi":null,"is_oa":false,"landing_page_url":"http://repository.tue.nl/709453","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems. II, Analog and Digital Signal Processing, 43(10), 703","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:tue:oai:pure.tue.nl:publications/ffc5664b-67eb-42ce-b33f-4a83c8694393","doi":null,"is_oa":true,"landing_page_url":"https://research.tue.nl/nl/publications/ffc5664b-67eb-42ce-b33f-4a83c8694393","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems. II, Analog and Digital Signal Processing, 43(10), 703 - 712. Institute of Electrical and Electronics Engineers","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/ffc5664b-67eb-42ce-b33f-4a83c8694393","doi":null,"is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/ffc5664b-67eb-42ce-b33f-4a83c8694393","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Somayajula, S A S, Sanchez-Sinencio, E & Pineda de Gyvez, J 1996, 'Analog fault diagnosis based on ramping power supply current signature clusters', IEEE Transactions on Circuits and Systems. II, Analog and Digital Signal Processing, vol. 43, no. 10, pp. 703-712. https://doi.org/10.1109/82.539002","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W183044348","https://openalex.org/W386933059","https://openalex.org/W1511344426","https://openalex.org/W1532286644","https://openalex.org/W1532554972","https://openalex.org/W1632381123","https://openalex.org/W1651707596","https://openalex.org/W1986388776","https://openalex.org/W2079826846","https://openalex.org/W2088576840","https://openalex.org/W2095319495","https://openalex.org/W2096462688","https://openalex.org/W2096569924","https://openalex.org/W2098112833","https://openalex.org/W2099169558","https://openalex.org/W2106201402","https://openalex.org/W2115729533","https://openalex.org/W2134332340","https://openalex.org/W2142925338","https://openalex.org/W2144818422","https://openalex.org/W2146509701","https://openalex.org/W2150256779","https://openalex.org/W2156314197","https://openalex.org/W2162458545","https://openalex.org/W2164017138","https://openalex.org/W2164507253","https://openalex.org/W2171294065","https://openalex.org/W2464905271","https://openalex.org/W3036512766"],"related_works":["https://openalex.org/W2168128720","https://openalex.org/W2901803933","https://openalex.org/W2153610276","https://openalex.org/W2102105878","https://openalex.org/W2389882490","https://openalex.org/W2144061903","https://openalex.org/W2003654230","https://openalex.org/W4407566431","https://openalex.org/W2171234987","https://openalex.org/W4385612465"],"abstract_inverted_index":{"Measurement":[0],"of":[1,16,24,53,60,103,114,160],"power":[2,61,78],"supply":[3,62,79,112],"currents":[4,75],"was":[5,30,37],"found":[6],"to":[7,19,39,97,142],"be":[8],"very":[9],"useful":[10],"for":[11,33,50,87],"testing":[12],"CMOS":[13,168],"IC's":[14],"because":[15],"its":[17],"potential":[18,141],"detect":[20,143],"a":[21,47,107,132,167],"large":[22],"class":[23],"manufacturing":[25],"defects.":[26],"However,":[27],"this":[28,43],"technique":[29,138,163],"used":[31],"mainly":[32],"fault":[34,51,68],"detection":[35],"and":[36,144,147,157],"confined":[38],"digital":[40],"circuits.":[41,154],"In":[42,64],"paper,":[44],"we":[45],"present":[46],"suited":[48],"methodology":[49],"diagnosis":[52],"analog":[54],"circuits":[55],"based":[56],"on":[57],"the":[58,65,74,77,90,93,111,115,140,161],"observation":[59],"currents.":[63],"proposed":[66,162],"technique,":[67],"signature":[69],"dictionaries":[70],"are":[71,95,125,164],"generated":[72],"from":[73],"in":[76,85,92,99],"bus.":[80],"To":[81],"obtain":[82],"signatures":[83,124],"rich":[84],"information":[86],"efficient":[88],"diagnosis,":[89],"transistors":[91],"circuit":[94],"forced":[96],"operate":[98],"all":[100],"possible":[101],"regions":[102],"operation":[104],"by":[105],"using":[106,131,166],"ramp":[108],"signal":[109,119],"at":[110],"instead":[113],"conventional":[116],"constant":[117],"DC":[118],"or":[120],"ground":[121],"voltage.":[122],"The":[123,155],"then":[126],"clustered":[127],"into":[128],"different":[129],"groups":[130],"Kohonen":[133],"neural":[134],"network":[135],"classifier.":[136],"This":[137],"has":[139],"diagnose":[145],"single":[146],"multiple":[148],"shorts":[149],"as":[150,152],"well":[151],"open":[153],"theoretical":[156],"experimental":[158],"results":[159],"verified":[165],"Operational":[169],"Transconductance":[170],"Amplifier":[171],"(OTA)":[172],"circuit.":[173]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}