{"id":"https://openalex.org/W2143322685","doi":"https://doi.org/10.1109/rams.1993.296850","title":"Database design for failure modes and effects analysis","display_name":"Database design for failure modes and effects analysis","publication_year":2002,"publication_date":"2002-12-30","ids":{"openalex":"https://openalex.org/W2143322685","doi":"https://doi.org/10.1109/rams.1993.296850","mag":"2143322685"},"language":"en","primary_location":{"id":"doi:10.1109/rams.1993.296850","doi":"https://doi.org/10.1109/rams.1993.296850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rams.1993.296850","pdf_url":null,"source":{"id":"https://openalex.org/S4210171523","display_name":"Annual Reliability and Maintainability Symposium (RAMS)","issn_l":"0149-144X","issn":["0149-144X","2577-0993"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual Reliability and Maintainability Symposium 1993 Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087412036","display_name":"Pankaj Kukkal","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Kukkal","raw_affiliation_strings":["University of South Carolina, Columbia, USA","Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]},{"raw_affiliation_string":"Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014438602","display_name":"John B. Bowles","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.B. Bowles","raw_affiliation_strings":["University of South Carolina, Columbia, USA","Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]},{"raw_affiliation_string":"Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114185264","display_name":"R.D. Bonnell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.D. Bonnell","raw_affiliation_strings":["University of South Carolina, Columbia, USA","Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]},{"raw_affiliation_string":"Dept.of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I155781252"],"apc_list":null,"apc_paid":null,"fwci":1.6981,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.85854093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"231","last_page":"239"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.8984000086784363,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.8984000086784363,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.02419999986886978,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13681","display_name":"Engineering and Information Technology","score":0.01080000028014183,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"failure mode and effects analysis","score":0.9950000047683716},{"id":"https://openalex.org/keywords/database-design","display_name":"database design","score":0.9580000042915344},{"id":"https://openalex.org/keywords/entity-relationship-model","display_name":"entity-relationship model","score":0.9900000095367432},{"id":"https://openalex.org/keywords/relational-model","display_name":"relational model","score":0.9800000190734863}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7196197509765625},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.6878474950790405},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.5970165133476257},{"id":"https://openalex.org/C5655090","wikidata":"https://www.wikidata.org/wiki/Q192588","display_name":"Relational database","level":2,"score":0.5893796682357788},{"id":"https://openalex.org/C148840519","wikidata":"https://www.wikidata.org/wiki/Q1049878","display_name":"Database design","level":2,"score":0.5308500528335571},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5050469040870667},{"id":"https://openalex.org/C24394798","wikidata":"https://www.wikidata.org/wiki/Q192588","display_name":"Relational database management system","level":3,"score":0.46263188123703003},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4610201120376587},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4233195185661316},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.38771456480026245},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.23764488101005554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16893193125724792},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/rams.1993.296850","doi":"https://doi.org/10.1109/rams.1993.296850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rams.1993.296850","pdf_url":null,"source":{"id":"https://openalex.org/S4210171523","display_name":"Annual Reliability and Maintainability Symposium (RAMS)","issn_l":"0149-144X","issn":["0149-144X","2577-0993"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual Reliability and Maintainability Symposium 1993 Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W47852404","https://openalex.org/W1899100926","https://openalex.org/W2751199251","https://openalex.org/W2753439427"],"related_works":["https://openalex.org/W1538529862","https://openalex.org/W2039396022","https://openalex.org/W1994562871","https://openalex.org/W1928849380","https://openalex.org/W2891601046","https://openalex.org/W2352767048","https://openalex.org/W2265104319","https://openalex.org/W2108484690","https://openalex.org/W336031813","https://openalex.org/W1661689275"],"abstract_inverted_index":{"A":[0,49],"design":[1],"for":[2,6,68,81,99,105,114],"a":[3,31,59,65,84,97,106,112],"database":[4,60,91,113],"system":[5,92],"storing":[7],"failure":[8],"modes":[9],"and":[10,28,124,129],"effects":[11],"analysis":[12,102],"data":[13,36],"has":[14],"been":[15],"developed":[16],"using":[17,41,57],"the":[18,24,53,70,101,119,122],"E-R":[19],"(entity-relationship)":[20],"model":[21,37],"to":[22,30],"describe":[23],"entity":[25],"sets,":[26],"relationships,":[27],"attributes":[29],"FMEA":[32,71,79,108,115],"database.":[33],"The":[34,90],"relational":[35],"can":[38,93],"be":[39],"implemented":[40],"any":[42],"commercially":[43],"available":[44],"DBMS":[45],"(database":[46],"management":[47],"system).":[48],"detailed":[50],"discussion":[51],"of":[52,56,121],"many":[54],"advantages":[55],"such":[58],"shows":[61],"that":[62],"it":[63,126],"is":[64,87],"sound":[66],"basis":[67],"automating":[69],"process.":[72],"Its":[73],"usefulness":[74],"in":[75,83],"developing":[76,100],"an":[77],"automated":[78],"tool":[80],"use":[82],"multiuser":[85],"environment":[86],"also":[88,94,117],"discussed.":[89],"serve":[95],"as":[96],"foundation":[98],"component":[103],"needed":[104],"true":[107],"expert":[109],"system.":[110],"Using":[111],"will":[116],"improve":[118],"quality":[120],"analysis,":[123],"make":[125],"more":[127],"meaningful":[128],"visible.>":[130]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}