{"id":"https://openalex.org/W2139698489","doi":"https://doi.org/10.1109/te.2003.818274","title":"Electromagnetic Scattering From Thin Strips\u2014Part I: Analytical Solutions for Wide and Narrow Strips","display_name":"Electromagnetic Scattering From Thin Strips\u2014Part I: Analytical Solutions for Wide and Narrow Strips","publication_year":2004,"publication_date":"2004-02-01","ids":{"openalex":"https://openalex.org/W2139698489","doi":"https://doi.org/10.1109/te.2003.818274","mag":"2139698489"},"language":"en","primary_location":{"id":"doi:10.1109/te.2003.818274","doi":"https://doi.org/10.1109/te.2003.818274","is_oa":false,"landing_page_url":"https://doi.org/10.1109/te.2003.818274","pdf_url":null,"source":{"id":"https://openalex.org/S207741693","display_name":"IEEE Transactions on Education","issn_l":"0018-9359","issn":["0018-9359","1557-9638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","erih-plus","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310322189","host_organization_name":"IEEE Education Society","host_organization_lineage":["https://openalex.org/P4310322189","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Education Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Education","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091623946","display_name":"K. Barkeshli","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"K. Barkeshli","raw_affiliation_strings":["Electrical Engineering Department, Sharif University of Technology, Tehran, Iran","Electr. Eng. Dept., Sharif Univ. of Technol., Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Electr. Eng. Dept., Sharif Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037180603","display_name":"John L. Volakis","orcid":"https://orcid.org/0000-0002-0115-2079","observed_orcids":["https://orcid.org/0000-0002-0115-2079"]},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.L. Volakis","raw_affiliation_strings":["Radiation Laboratory, EECS Department, University of Michigan, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Radiation Laboratory, EECS Department, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.6122,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.67538743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"47","issue":"1","first_page":"100","last_page":"106"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-scattering","display_name":"electromagnetic scattering","score":0.9980000257492065},{"id":"https://openalex.org/keywords/narrow-strips","display_name":"narrow strips","score":0.9990000128746033},{"id":"https://openalex.org/keywords/integral-equations","display_name":"integral equations","score":0.7120000123977661},{"id":"https://openalex.org/keywords/physical-optics","display_name":"physical optics","score":0.6520000100135803},{"id":"https://openalex.org/keywords/quasi-static-approximation","display_name":"quasi-static approximation","score":0.9990000128746033},{"id":"https://openalex.org/keywords/current-density","display_name":"current density","score":0.8489999771118164},{"id":"https://openalex.org/keywords/echo-width","display_name":"echo width","score":0.8790000081062317},{"id":"https://openalex.org/keywords/analytical-solution","display_name":"analytical solution","score":0.8309999704360962}],"concepts":[{"id":"https://openalex.org/C200925200","wikidata":"https://www.wikidata.org/wiki/Q7624170","display_name":"STRIPS","level":2,"score":0.973886251449585},{"id":"https://openalex.org/C27016315","wikidata":"https://www.wikidata.org/wiki/Q580101","display_name":"Integral equation","level":2,"score":0.7355309128761292},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.656002402305603},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6477446556091309},{"id":"https://openalex.org/C4708273","wikidata":"https://www.wikidata.org/wiki/Q900222","display_name":"Quasistatic process","level":2,"score":0.6002174019813538},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4564824104309082},{"id":"https://openalex.org/C207740977","wikidata":"https://www.wikidata.org/wiki/Q234072","display_name":"Current density","level":2,"score":0.4279562532901764},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4179947078227997},{"id":"https://openalex.org/C154236941","wikidata":"https://www.wikidata.org/wiki/Q942347","display_name":"Physical optics","level":2,"score":0.41416698694229126},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.38831716775894165},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26982980966567993},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2615699768066406},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21640488505363464},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16265219449996948},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07946446537971497},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07276999950408936}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/te.2003.818274","doi":"https://doi.org/10.1109/te.2003.818274","is_oa":false,"landing_page_url":"https://doi.org/10.1109/te.2003.818274","pdf_url":null,"source":{"id":"https://openalex.org/S207741693","display_name":"IEEE Transactions on Education","issn_l":"0018-9359","issn":["0018-9359","1557-9638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","erih-plus","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310322189","host_organization_name":"IEEE Education Society","host_organization_lineage":["https://openalex.org/P4310322189","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Education Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Education","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1515302430","https://openalex.org/W1560633135","https://openalex.org/W2017072817","https://openalex.org/W2043059725","https://openalex.org/W2046972138","https://openalex.org/W2078622074","https://openalex.org/W2083592915","https://openalex.org/W2097793144","https://openalex.org/W2105794619","https://openalex.org/W2139533414","https://openalex.org/W2151980064","https://openalex.org/W2170566856","https://openalex.org/W2486170143","https://openalex.org/W2986057930","https://openalex.org/W3016843226"],"related_works":["https://openalex.org/W2109504100","https://openalex.org/W2094780019","https://openalex.org/W2035010196","https://openalex.org/W2063730381","https://openalex.org/W2085847425","https://openalex.org/W2087336448","https://openalex.org/W4300919522","https://openalex.org/W4283261978","https://openalex.org/W2051452324","https://openalex.org/W3046695674"],"abstract_inverted_index":{"Electromagnetic":[0],"scattering":[1],"from":[2],"thin":[3],"resistive":[4],"strips":[5,24],"is":[6],"formulated":[7],"using":[8],"an":[9],"integral":[10,38],"equation":[11],"approach.":[12],"Analytical":[13],"expressions":[14,49],"for":[15,50],"the":[16,29,36,51,55],"electric":[17],"current":[18],"density":[19],"over":[20],"wide":[21],"and":[22,32],"narrow":[23],"are":[25,43],"derived":[26],"based":[27],"on":[28],"physical":[30],"optics":[31],"quasistatic":[33],"approximation":[34],"of":[35,54],"pertinent":[37],"equations,":[39],"respectively.":[40],"The":[41],"solutions":[42],"used":[44],"to":[45],"find":[46],"closed":[47],"form":[48],"echo":[52],"width":[53],"strip.":[56]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}