{"id":"https://openalex.org/W2139662913","doi":"https://doi.org/10.1142/s0218625x00000282","title":"NEAR EDGE X-RAY ABSORPTION AND X-RAY PHOTOELECTRON DIFFRACTION STUDIES OF THE STRUCTURAL ENVIRONMENT OF Ge \u2013 Si SYSTEMS","display_name":"NEAR EDGE X-RAY ABSORPTION AND X-RAY PHOTOELECTRON DIFFRACTION STUDIES OF THE STRUCTURAL ENVIRONMENT OF Ge \u2013 Si SYSTEMS","publication_year":2000,"publication_date":"2000-06-01","ids":{"openalex":"https://openalex.org/W2139662913","doi":"https://doi.org/10.1142/s0218625x00000282","mag":"2139662913"},"language":"en","primary_location":{"id":"doi:10.1142/s0218625x00000282","doi":"https://doi.org/10.1142/s0218625x00000282","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218625x00000282","pdf_url":null,"source":{"id":"https://openalex.org/S132380971","display_name":"Surface Review and Letters","issn_l":"0218-625X","issn":["0218-625X","1793-6667"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Review and Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070400548","display_name":"P. Castrucci","orcid":"https://orcid.org/0000-0001-8986-7185","observed_orcids":["https://orcid.org/0000-0001-8986-7185"]},"institutions":[{"id":"https://openalex.org/I112859197","display_name":"Universit\u00e0 di Camerino","ror":"https://ror.org/0005w8d69","country_code":"IT","type":"education","lineage":["https://openalex.org/I112859197"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. CASTRUCCI","raw_affiliation_strings":["Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy","institution_ids":["https://openalex.org/I112859197"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080231341","display_name":"R. Gunnella","orcid":"https://orcid.org/0000-0003-4739-6375","observed_orcids":["https://orcid.org/0000-0003-4739-6375"]},"institutions":[{"id":"https://openalex.org/I112859197","display_name":"Universit\u00e0 di Camerino","ror":"https://ror.org/0005w8d69","country_code":"IT","type":"education","lineage":["https://openalex.org/I112859197"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. GUNNELLA","raw_affiliation_strings":["Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy","institution_ids":["https://openalex.org/I112859197"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033378174","display_name":"Nicola Pinto","orcid":"https://orcid.org/0000-0001-7974-4421","observed_orcids":["https://orcid.org/0000-0001-7974-4421"]},"institutions":[{"id":"https://openalex.org/I112859197","display_name":"Universit\u00e0 di Camerino","ror":"https://ror.org/0005w8d69","country_code":"IT","type":"education","lineage":["https://openalex.org/I112859197"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"N. PINTO","raw_affiliation_strings":["Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy","institution_ids":["https://openalex.org/I112859197"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083704825","display_name":"R. Bernardini","orcid":"https://orcid.org/0000-0001-6998-8991","observed_orcids":["https://orcid.org/0000-0001-6998-8991"]},"institutions":[{"id":"https://openalex.org/I112859197","display_name":"Universit\u00e0 di Camerino","ror":"https://ror.org/0005w8d69","country_code":"IT","type":"education","lineage":["https://openalex.org/I112859197"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. BERNARDINI","raw_affiliation_strings":["Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy","institution_ids":["https://openalex.org/I112859197"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035231956","display_name":"Maurizio De Crescenzi","orcid":"https://orcid.org/0000-0002-2935-8714","observed_orcids":["https://orcid.org/0000-0002-2935-8714"]},"institutions":[{"id":"https://openalex.org/I112859197","display_name":"Universit\u00e0 di Camerino","ror":"https://ror.org/0005w8d69","country_code":"IT","type":"education","lineage":["https://openalex.org/I112859197"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. DE CRESCENZI","raw_affiliation_strings":["Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sezione INFM, Dipartimento di Matematica  e Fisica, Universit\u00e0 di Camerino, 62032 Via Madonna delle Carceri,  Camerino, Italy","institution_ids":["https://openalex.org/I112859197"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065167504","display_name":"M. Sacchi","orcid":"https://orcid.org/0000-0002-3205-0796","observed_orcids":["https://orcid.org/0000-0002-3205-0796"]},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404","https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. SACCHI","raw_affiliation_strings":["LURE, Laboratoire pour l'Utilisation du Rayonnement Electromagnetique, BP34, Centre Universitaire Paris-Sud, 91898 Orsay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LURE, Laboratoire pour l'Utilisation du Rayonnement Electromagnetique, BP34, Centre Universitaire Paris-Sud, 91898 Orsay, France","institution_ids":["https://openalex.org/I102197404"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6518,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.62221879,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"07","issue":"03","first_page":"307","last_page":"331"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.3515999913215637,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.3515999913215637,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.2847000062465668,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.27639999985694885,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/si-ge-heterostructures","display_name":"Ge/Si heterostructures","score":0.8370000123977661},{"id":"https://openalex.org/keywords/ercc2","display_name":"XPD","score":0.7919999957084656},{"id":"https://openalex.org/keywords/auger-electron-diffraction","display_name":"Auger electron diffraction","score":0.9259999990463257},{"id":"https://openalex.org/keywords/multiple-scattering-simulation","display_name":"multiple scattering simulation","score":0.6600000262260437},{"id":"https://openalex.org/keywords/si-100-surface","display_name":"Si(100) surface","score":0.8519999980926514},{"id":"https://openalex.org/keywords/si-111-surface","display_name":"Si(111) surface","score":0.9990000128746033},{"id":"https://openalex.org/keywords/surface-reconstruction","display_name":"surface reconstruction","score":0.8500000238418579},{"id":"https://openalex.org/keywords/intermixing","display_name":"intermixing","score":0.8299999833106995},{"id":"https://openalex.org/keywords/tetragonal-distortion","display_name":"tetragonal distortion","score":0.878000020980835},{"id":"https://openalex.org/keywords/antimony-surfactant","display_name":"antimony surfactant","score":0.9380000233650208},{"id":"https://openalex.org/keywords/frank-van-der-merwe-growth","display_name":"layer-by-layer growth","score":0.7979999780654907}],"concepts":[{"id":"https://openalex.org/C2775913835","wikidata":"https://www.wikidata.org/wiki/Q7113777","display_name":"Overlayer","level":2,"score":0.9031961560249329},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5725262761116028},{"id":"https://openalex.org/C25442681","wikidata":"https://www.wikidata.org/wiki/Q28087","display_name":"Auger electron spectroscopy","level":2,"score":0.540571928024292},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.5073532462120056},{"id":"https://openalex.org/C100083437","wikidata":"https://www.wikidata.org/wiki/Q905977","display_name":"Low-energy electron diffraction","level":4,"score":0.5060192942619324},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47260621190071106},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.4721039831638336},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.46270751953125},{"id":"https://openalex.org/C2779320509","wikidata":"https://www.wikidata.org/wiki/Q7662223","display_name":"Synchrotron Radiation Source","level":3,"score":0.4549905061721802},{"id":"https://openalex.org/C16332341","wikidata":"https://www.wikidata.org/wiki/Q212871","display_name":"Synchrotron radiation","level":2,"score":0.44081997871398926},{"id":"https://openalex.org/C62284982","wikidata":"https://www.wikidata.org/wiki/Q903103","display_name":"X-ray absorption spectroscopy","level":3,"score":0.43789204955101013},{"id":"https://openalex.org/C170751736","wikidata":"https://www.wikidata.org/wiki/Q503601","display_name":"Tetragonal crystal system","level":3,"score":0.4315554201602936},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.42924362421035767},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.388673335313797},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.38496726751327515},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.35541146993637085},{"id":"https://openalex.org/C119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","level":2,"score":0.33139777183532715},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2565215826034546},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11124706268310547},{"id":"https://openalex.org/C115624301","wikidata":"https://www.wikidata.org/wiki/Q895901","display_name":"Crystal structure","level":2,"score":0.06423559784889221},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.06388211250305176},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1142/s0218625x00000282","doi":"https://doi.org/10.1142/s0218625x00000282","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218625x00000282","pdf_url":null,"source":{"id":"https://openalex.org/S132380971","display_name":"Surface Review and Letters","issn_l":"0218-625X","issn":["0218-625X","1793-6667"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Review and Letters","raw_type":"journal-article"},{"id":"doi:10.1016/s0218-625x(00)00028-2","doi":"https://doi.org/10.1016/s0218-625x(00)00028-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0218-625x(00)00028-2","pdf_url":null,"source":{"id":"https://openalex.org/S132380971","display_name":"Surface Review and Letters","issn_l":"0218-625X","issn":["0218-625X","1793-6667"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Review and Letters","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:wsi:srlxxx:v:07:y:2000:i:03:n:s0218625x00000282","doi":null,"is_oa":false,"landing_page_url":"http://www.worldscientific.com/doi/abs/10.1142/S0218625X00000282","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":66,"referenced_works":["https://openalex.org/W119675955","https://openalex.org/W1537667194","https://openalex.org/W1603375399","https://openalex.org/W1965392566","https://openalex.org/W1967913151","https://openalex.org/W1969433956","https://openalex.org/W1972268617","https://openalex.org/W1984622522","https://openalex.org/W1984710405","https://openalex.org/W1984790603","https://openalex.org/W1985485654","https://openalex.org/W1985650938","https://openalex.org/W1993096747","https://openalex.org/W1993836540","https://openalex.org/W1994273028","https://openalex.org/W1994638996","https://openalex.org/W1995212405","https://openalex.org/W1997886532","https://openalex.org/W1998194647","https://openalex.org/W1999164336","https://openalex.org/W1999413435","https://openalex.org/W1999736213","https://openalex.org/W2000186078","https://openalex.org/W2004571334","https://openalex.org/W2005542538","https://openalex.org/W2008049396","https://openalex.org/W2011753258","https://openalex.org/W2013432717","https://openalex.org/W2016050070","https://openalex.org/W2016315981","https://openalex.org/W2016990852","https://openalex.org/W2018501497","https://openalex.org/W2024370188","https://openalex.org/W2027032057","https://openalex.org/W2031805852","https://openalex.org/W2032101443","https://openalex.org/W2033368417","https://openalex.org/W2034870284","https://openalex.org/W2038804379","https://openalex.org/W2040345382","https://openalex.org/W2045343268","https://openalex.org/W2047331728","https://openalex.org/W2049460791","https://openalex.org/W2051045101","https://openalex.org/W2057542062","https://openalex.org/W2057570764","https://openalex.org/W2059878052","https://openalex.org/W2059978376","https://openalex.org/W2060884656","https://openalex.org/W2064946440","https://openalex.org/W2065197094","https://openalex.org/W2067337546","https://openalex.org/W2074119956","https://openalex.org/W2076219320","https://openalex.org/W2076343339","https://openalex.org/W2077788097","https://openalex.org/W2078638787","https://openalex.org/W2080029371","https://openalex.org/W2080243686","https://openalex.org/W2087956491","https://openalex.org/W2113027680","https://openalex.org/W2141993354","https://openalex.org/W2154833562","https://openalex.org/W3022325119","https://openalex.org/W3023747339","https://openalex.org/W4243195633"],"related_works":["https://openalex.org/W2016990852","https://openalex.org/W2060884656","https://openalex.org/W2093827542","https://openalex.org/W2088647505","https://openalex.org/W2035288056","https://openalex.org/W2080029371","https://openalex.org/W2032101443","https://openalex.org/W2004571334","https://openalex.org/W2099698884","https://openalex.org/W2024370188"],"abstract_inverted_index":{"Near":[0],"edge":[1],"X-ray":[2,6,61,84],"absorption":[3,62],"spectroscopy":[4],"(XAS),":[5],"photoelectron":[7],"diffraction":[8,13,78],"(XPD)":[9],"and":[10,25,55,74,99,119,135],"Auger":[11],"electron":[12,77],"(AED)":[14],"are":[15],"powerful":[16],"techniques":[17,123],"for":[18,90,131],"the":[19,23,48,111,125,141,153,168,187],"qualitative":[20],"study":[21,49],"of":[22,28,34,50,53,114,127,140,147,164,167,182],"structural":[24,51],"electronic":[26],"properties":[27],"several":[29],"systems.":[30],"The":[31,145],"recent":[32,60],"development":[33],"a":[35,44,82,107,137,150,174],"multiple":[36],"scattering":[37],"approach":[38],"to":[39,47,105],"simulating":[40],"experimental":[41],"spectra":[42],"opened":[43],"friendly":[45],"way":[46],"environments":[52],"solids":[54],"surfaces.":[56,121],"This":[57],"article":[58],"reviews":[59],"experiments":[63],"using":[64,81],"synchrotron":[65],"radiation":[66],"which":[67],"were":[68],"performed":[69],"at":[70],"Ge":[71,87,92,115,171],"L":[72],"edges":[73],"core":[75,88],"level":[76],"measurements":[79],"obtained":[80,178],"traditional":[83],"source":[85],"from":[86],"levels":[89],"ultrathin":[91],"films":[93],"deposited":[94],"on":[95,117,152,186],"silicon":[96],"substrates.":[97],"Thermodynamics":[98],"surface":[100],"reconstruction":[101],"have":[102,156],"been":[103,158],"found":[104],"play":[106],"crucial":[108],"role":[109],"in":[110],"first":[112],"stages":[113],"growth":[116,166],"Si(001)":[118],"Si(111)":[120],"Both":[122],"show":[124],"occurrence":[126],"intermixing":[128,176],"processes":[129],"even":[130],"room-temperature-grown":[132],"Ge/Si(001)":[133,154],"samples":[134],"give":[136],"straightforward":[138],"measurement":[139],"overlayer":[142,172],"tetragonal":[143],"distortion.":[144],"effects":[146],"Sb":[148,183],"as":[149],"surfactant":[151],"interface":[155],"also":[157],"investigated.":[159],"In":[160],"this":[161],"case,":[162],"evidence":[163],"layer-by-layer":[165],"fully":[169],"strained":[170],"with":[173],"reduced":[175],"is":[177,184],"when":[179],"one":[180],"monolayer":[181],"predeposited":[185],"surface.":[188]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}