{"id":"https://openalex.org/W2139648716","doi":"https://doi.org/10.1109/ceidp.2007.4451557","title":"Modern technologies in optical partial discharge detection","display_name":"Modern technologies in optical partial discharge detection","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2139648716","doi":"https://doi.org/10.1109/ceidp.2007.4451557","mag":"2139648716"},"language":"en","primary_location":{"id":"doi:10.1109/ceidp.2007.4451557","doi":"https://doi.org/10.1109/ceidp.2007.4451557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.2007.4451557","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"R. Schwarz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"R. Schwarz","raw_affiliation_strings":["Institute of High Voltage Engineering and System Management, Graz University of Technology, Graz, Austria","Graz University of Technology, Graz#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of High Voltage Engineering and System Management, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]},{"raw_affiliation_string":"Graz University of Technology, Graz#TAB#","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109578995","display_name":"M. Muhr","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Muhr","raw_affiliation_strings":["Institute of High Voltage Engineering and System Management, Graz University of Technology, Graz, Austria","Graz University of Technology, Graz#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of High Voltage Engineering and System Management, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]},{"raw_affiliation_string":"Graz University of Technology, Graz#TAB#","institution_ids":["https://openalex.org/I4092182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4092182"],"apc_list":null,"apc_paid":null,"fwci":0.5021,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.61932469,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"163","last_page":"166"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Atmospheric-Pressure Plasma Applications","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"partial discharge","score":0.9200000166893005},{"id":"https://openalex.org/keywords/high-voltage-insulation","display_name":"high-voltage insulation","score":0.796999990940094},{"id":"https://openalex.org/keywords/insulation-monitoring","display_name":"insulation condition monitoring","score":0.7590000033378601},{"id":"https://openalex.org/keywords/optical-sensors","display_name":"optical sensors","score":0.5379999876022339},{"id":"https://openalex.org/keywords/power-equipment-reliability","display_name":"power equipment reliability","score":0.48500001430511475}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.9389885663986206},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7416625022888184},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46701934933662415},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.4596019387245178},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45263516902923584},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4368974566459656},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.4173426926136017},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41176629066467285},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.391996294260025},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3779533803462982},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3275641202926636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2729305028915405},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14102059602737427},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ceidp.2007.4451557","doi":"https://doi.org/10.1109/ceidp.2007.4451557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.2007.4451557","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1856761631","https://openalex.org/W1923699985","https://openalex.org/W2099297255","https://openalex.org/W2947074163"],"related_works":["https://openalex.org/W1531054930","https://openalex.org/W1586698678","https://openalex.org/W2385095266","https://openalex.org/W2099220489","https://openalex.org/W1493314643","https://openalex.org/W1856761631","https://openalex.org/W2123015713","https://openalex.org/W2587507842","https://openalex.org/W7095858480","https://openalex.org/W2463048800"],"abstract_inverted_index":{"The":[0],"knowledge":[1],"of":[2,5,8,18,24,28,59,78,90,137],"the":[3,16,22,25,33,44,88,102,109,120,138],"condition":[4,27],"electrical":[6],"equipment":[7,32],"power":[9,31],"systems":[10],"is":[11,37,48],"a":[12,152],"fundamental":[13,135],"part":[14],"for":[15,53,87,101],"reliability":[17],"energy":[19],"systems.":[20,69,93],"For":[21],"evaluation":[23],"insulation":[26,147],"high":[29],"voltage":[30],"partial":[34,45,104],"discharge":[35,46,105,121,139],"detection":[36,129],"one":[38],"standard":[39],"instrument.":[40],"As":[41],"diagnostic":[42,92],"tool":[43],"measurement":[47],"used":[49],"in":[50,145],"many":[51],"applications,":[52],"testing":[54],"and":[55,62,81,116,127,141],"comparing":[56],"different":[57,122,146],"types":[58],"insulating":[60],"materials":[61],"also":[63],"to":[64],"check":[65],"complete":[66],"devices":[67],"or":[68],"Improvements,":[70],"new":[71],"developments":[72],"as":[73,75],"well":[74],"lower":[76],"costs":[77],"sensors,":[79],"processing":[80],"analysing":[82],"units":[83],"are":[84,131],"some":[85,134],"reasons":[86],"increasing":[89],"PD":[91],"This":[94],"paper":[95],"presents":[96],"an":[97],"overview":[98],"about":[99],"technologies":[100],"optical":[103,154],"detection.":[106],"Based":[107],"on":[108],"emitted":[110],"light":[111],"produced":[112],"by":[113],"ionization,":[114],"excitation":[115],"recombination":[117],"processes":[118],"during":[119],"parameters":[123],"must":[124],"be":[125],"considered":[126],"diverse":[128],"techniques":[130],"discussed.":[132],"Additional":[133],"investigations":[136],"properties":[140],"their":[142],"temporal":[143],"behaviour":[144],"mediums":[148],"were":[149],"examined":[150],"with":[151],"developed":[153],"PD-detection":[155],"system.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}