{"id":"https://openalex.org/W2139297980","doi":"https://doi.org/10.1007/s11664-008-0448-x","title":"Light-Induced Tellurium Enrichment on CdZnTe Crystal Surfaces Detected by Raman Spectroscopy","display_name":"Light-Induced Tellurium Enrichment on CdZnTe Crystal Surfaces Detected by Raman Spectroscopy","publication_year":2008,"publication_date":"2008-04-08","ids":{"openalex":"https://openalex.org/W2139297980","doi":"https://doi.org/10.1007/s11664-008-0448-x","mag":"2139297980"},"language":"en","primary_location":{"id":"doi:10.1007/s11664-008-0448-x","doi":"https://doi.org/10.1007/s11664-008-0448-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11664-008-0448-x","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/920377","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037375592","display_name":"Samantha A. Hawkins","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799909505","display_name":"Savannah River National Laboratory","ror":"https://ror.org/05vc7qy59","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2799909505","https://openalex.org/I4210093701"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Samantha A. Hawkins","raw_affiliation_strings":["Savannah River National Laboratory, Aiken, SC, 29808, USA","Savannah River National Laboratory;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Savannah River National Laboratory, Aiken, SC, 29808, USA","institution_ids":["https://openalex.org/I2799909505"]},{"raw_affiliation_string":"Savannah River National Laboratory;","institution_ids":["https://openalex.org/I2799909505"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081613468","display_name":"Eliel Villa\u2010Aleman","orcid":"https://orcid.org/0000-0002-2891-0861","observed_orcids":["https://orcid.org/0000-0002-2891-0861"]},"institutions":[{"id":"https://openalex.org/I2799909505","display_name":"Savannah River National Laboratory","ror":"https://ror.org/05vc7qy59","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2799909505","https://openalex.org/I4210093701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eliel Villa-Aleman","raw_affiliation_strings":["Savannah River National Laboratory, Aiken, SC, 29808, USA","Savannah River National Laboratory;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Savannah River National Laboratory, Aiken, SC, 29808, USA","institution_ids":["https://openalex.org/I2799909505"]},{"raw_affiliation_string":"Savannah River National Laboratory;","institution_ids":["https://openalex.org/I2799909505"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071116129","display_name":"Martine C. Duff","orcid":"https://orcid.org/0000-0001-9029-808X","observed_orcids":["https://orcid.org/0000-0001-9029-808X"]},"institutions":[{"id":"https://openalex.org/I2799909505","display_name":"Savannah River National Laboratory","ror":"https://ror.org/05vc7qy59","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2799909505","https://openalex.org/I4210093701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martine C. Duff","raw_affiliation_strings":["Savannah River National Laboratory, Aiken, SC, 29808, USA","Savannah River National Laboratory;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Savannah River National Laboratory, Aiken, SC, 29808, USA","institution_ids":["https://openalex.org/I2799909505"]},{"raw_affiliation_string":"Savannah River National Laboratory;","institution_ids":["https://openalex.org/I2799909505"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091049854","display_name":"Doug B. Hunter","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799909505","display_name":"Savannah River National Laboratory","ror":"https://ror.org/05vc7qy59","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2799909505","https://openalex.org/I4210093701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Doug B. Hunter","raw_affiliation_strings":["Savannah River National Laboratory, Aiken, SC, 29808, USA","Savannah River National Laboratory;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Savannah River National Laboratory, Aiken, SC, 29808, USA","institution_ids":["https://openalex.org/I2799909505"]},{"raw_affiliation_string":"Savannah River National Laboratory;","institution_ids":["https://openalex.org/I2799909505"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055970423","display_name":"Arnold Burger","orcid":"https://orcid.org/0000-0002-3140-5698","observed_orcids":["https://orcid.org/0000-0002-3140-5698"]},"institutions":[{"id":"https://openalex.org/I9254433","display_name":"Fisk University","ror":"https://ror.org/01bbs6821","country_code":"US","type":"education","lineage":["https://openalex.org/I9254433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arnold Burger","raw_affiliation_strings":["Fisk University, Nashville, TN, 37208-3051, USA","Fisk University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fisk University, Nashville, TN, 37208-3051, USA","institution_ids":["https://openalex.org/I9254433"]},{"raw_affiliation_string":"Fisk University","institution_ids":["https://openalex.org/I9254433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082551041","display_name":"Michael Groza","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I9254433","display_name":"Fisk University","ror":"https://ror.org/01bbs6821","country_code":"US","type":"education","lineage":["https://openalex.org/I9254433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Groza","raw_affiliation_strings":["Fisk University, Nashville, TN, 37208-3051, USA","Fisk University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fisk University, Nashville, TN, 37208-3051, USA","institution_ids":["https://openalex.org/I9254433"]},{"raw_affiliation_string":"Fisk University","institution_ids":["https://openalex.org/I9254433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113530953","display_name":"Vladimir Buliga","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I9254433","display_name":"Fisk University","ror":"https://ror.org/01bbs6821","country_code":"US","type":"education","lineage":["https://openalex.org/I9254433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vladimir Buliga","raw_affiliation_strings":["Fisk University, Nashville, TN, 37208-3051, USA","Fisk University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fisk University, Nashville, TN, 37208-3051, USA","institution_ids":["https://openalex.org/I9254433"]},{"raw_affiliation_string":"Fisk University","institution_ids":["https://openalex.org/I9254433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008506079","display_name":"David R. Black","orcid":"https://orcid.org/0000-0003-3509-1275","observed_orcids":["https://orcid.org/0000-0003-3509-1275"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David R. Black","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, 20899-8520, USA","National Institute of Standards and Technology,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, 20899-8520, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology,","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037375592"],"corresponding_institution_ids":["https://openalex.org/I2799909505"],"apc_list":{"value":3390,"currency":"USD","value_usd":3390},"apc_paid":null,"fwci":2.9155,"has_fulltext":true,"cited_by_count":33,"citation_normalized_percentile":{"value":0.90539713,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"37","issue":"9","first_page":"1438","last_page":"1443"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cdznte","display_name":"CdZnTe","score":0.9330000281333923},{"id":"https://openalex.org/keywords/crystal-surface-defects","display_name":"crystal surface defects","score":0.7710000276565552},{"id":"https://openalex.org/keywords/laser-surface-modification","display_name":"laser surface modification","score":0.4950000047683716},{"id":"https://openalex.org/keywords/room-temperature-radiation-detectors","display_name":"room-temperature radiation detectors","score":0.8199999928474426},{"id":"https://openalex.org/keywords/micro-raman-spectroscopy","display_name":"micro-Raman spectroscopy","score":0.8510000109672546},{"id":"https://openalex.org/keywords/detector-response","display_name":"detector response","score":0.6539999842643738}],"concepts":[{"id":"https://openalex.org/C40003534","wikidata":"https://www.wikidata.org/wiki/Q862228","display_name":"Raman spectroscopy","level":2,"score":0.8296869993209839},{"id":"https://openalex.org/C538181303","wikidata":"https://www.wikidata.org/wiki/Q1100","display_name":"Tellurium","level":2,"score":0.8147058486938477},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.6666330695152283},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6469589471817017},{"id":"https://openalex.org/C169573571","wikidata":"https://www.wikidata.org/wiki/Q466824","display_name":"Raman scattering","level":3,"score":0.6027294993400574},{"id":"https://openalex.org/C26456737","wikidata":"https://www.wikidata.org/wiki/Q185154","display_name":"Crystal growth","level":2,"score":0.5853729248046875},{"id":"https://openalex.org/C43588577","wikidata":"https://www.wikidata.org/wiki/Q715396","display_name":"Solid-state physics","level":2,"score":0.5268698334693909},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.5223356485366821},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.43919575214385986},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.37706050276756287},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.34511950612068176},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2944437563419342},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.26561790704727173},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.08827245235443115},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0675072968006134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s11664-008-0448-x","doi":"https://doi.org/10.1007/s11664-008-0448-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11664-008-0448-x","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:920377","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/920377","pdf_url":"https://www.osti.gov/servlets/purl/920377","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:info:ark/67531/metadc900215","doi":null,"is_oa":false,"landing_page_url":"https://digital.library.unt.edu/ark:/67531/metadc900215/","pdf_url":null,"source":{"id":"https://openalex.org/S4306400792","display_name":"University of North Texas Digital Library (University of North Texas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I123534392","host_organization_name":"University of North Texas","host_organization_lineage":["https://openalex.org/I123534392"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Materials","raw_type":"Article"}],"best_oa_location":{"id":"pmh:oai:osti.gov:920377","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/920377","pdf_url":"https://www.osti.gov/servlets/purl/920377","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G4202873227","display_name":null,"funder_award_id":"DE-FG5205NA27035","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"},{"id":"https://openalex.org/G5609919871","display_name":null,"funder_award_id":"DE-AC09-96SR18500","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G5631048350","display_name":"Establishment of a Center of Excellence in Physics and Chemistry of Materials at Fisk University","funder_award_id":"0420516","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8247196943","display_name":"ESTABLISHMENT OF RADIATION DETECTION LAB AT FISK UNIVERSITY","funder_award_id":"FG52-05NA27035","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G829502903","display_name":null,"funder_award_id":"NA 22","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G975773439","display_name":null,"funder_award_id":"NA-22","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320332369","display_name":"National Nuclear Security Administration","ror":"https://ror.org/03sk1we31"},{"id":"https://openalex.org/F4320338075","display_name":"Core Research for Evolutional Science and Technology","ror":"https://ror.org/00097mb19"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2139297980.pdf","grobid_xml":"https://content.openalex.org/works/W2139297980.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1964244880","https://openalex.org/W1966774489","https://openalex.org/W1975666524","https://openalex.org/W1997938651","https://openalex.org/W2001135516","https://openalex.org/W2003346501","https://openalex.org/W2007863057","https://openalex.org/W2008356747","https://openalex.org/W2018680878","https://openalex.org/W2021921819","https://openalex.org/W2035155323","https://openalex.org/W2036882103","https://openalex.org/W2044978444","https://openalex.org/W2050213815","https://openalex.org/W2078198431","https://openalex.org/W2078316945","https://openalex.org/W2093528263","https://openalex.org/W2129852678","https://openalex.org/W2129998902","https://openalex.org/W2157073247","https://openalex.org/W2161783226","https://openalex.org/W2486647935","https://openalex.org/W2535417298","https://openalex.org/W6600585467","https://openalex.org/W6600617704"],"related_works":["https://openalex.org/W4403407486","https://openalex.org/W2166715882","https://openalex.org/W2133235516","https://openalex.org/W1973171077","https://openalex.org/W2059978852","https://openalex.org/W2900969395","https://openalex.org/W2003329004","https://openalex.org/W1996762829","https://openalex.org/W1970860149","https://openalex.org/W1507477949"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}