{"id":"https://openalex.org/W2139238085","doi":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","title":"Al/C/B Co-Implanted High-Voltage 4H-SiC PiN Junction Rectifiers","display_name":"Al/C/B Co-Implanted High-Voltage 4H-SiC PiN Junction Rectifiers","publication_year":2000,"publication_date":"2000-05-10","ids":{"openalex":"https://openalex.org/W2139238085","doi":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","mag":"2139238085"},"language":"en","primary_location":{"id":"doi:10.4028/www.scientific.net/msf.338-342.1367","doi":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","pdf_url":null,"source":{"id":"https://openalex.org/S87940674","display_name":"Materials science forum","issn_l":"0255-5476","issn":["0255-5476","1662-9752","1662-9760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science Forum","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111688601","display_name":"Jeffery B. Fedison","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1332737386","display_name":"General Electric (United States)","ror":"https://ror.org/013msgt25","country_code":"US","type":"company","lineage":["https://openalex.org/I1332737386"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeffery B. Fedison","raw_affiliation_strings":["General Electric Global Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Electric Global Research Center","institution_ids":["https://openalex.org/I1332737386"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014733294","display_name":"Zhongda Li","orcid":"https://orcid.org/0000-0002-8572-8353","observed_orcids":["https://orcid.org/0000-0002-8572-8353"]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Z. Li","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110704960","display_name":"Vishnu Khemka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Khemka","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021664729","display_name":"Nudjarin Ramungul","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nudjarin Ramungul","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059828920","display_name":"T. Paul Chow","orcid":"https://orcid.org/0000-0002-1078-1707","observed_orcids":["https://orcid.org/0000-0002-1078-1707"]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Paul Chow","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113651702","display_name":"Mario Ghezzo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1332737386","display_name":"General Electric (United States)","ror":"https://ror.org/013msgt25","country_code":"US","type":"company","lineage":["https://openalex.org/I1332737386"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mario Ghezzo","raw_affiliation_strings":["General Electric Global Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Electric Global Research Center","institution_ids":["https://openalex.org/I1332737386"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113556895","display_name":"James W. Kretchmer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1332737386","display_name":"General Electric (United States)","ror":"https://ror.org/013msgt25","country_code":"US","type":"company","lineage":["https://openalex.org/I1332737386"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James W. Kretchmer","raw_affiliation_strings":["General Electric Global Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Electric Global Research Center","institution_ids":["https://openalex.org/I1332737386"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003356644","display_name":"Ahmed Elasser","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1332737386","display_name":"General Electric (United States)","ror":"https://ror.org/013msgt25","country_code":"US","type":"company","lineage":["https://openalex.org/I1332737386"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Elasser","raw_affiliation_strings":["General Electric Global Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Electric Global Research Center","institution_ids":["https://openalex.org/I1332737386"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.297,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82186723,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"338-342","issue":null,"first_page":"1367","last_page":"1370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/4h-sic","display_name":"4H-SiC","score":0.9739999771118164},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"silicon carbide","score":0.6840000152587891},{"id":"https://openalex.org/keywords/co-implantation","display_name":"co-implantation","score":0.8240000009536743},{"id":"https://openalex.org/keywords/aluminum","display_name":"aluminum","score":0.49300000071525574},{"id":"https://openalex.org/keywords/boron","display_name":"boron","score":0.9789999723434448},{"id":"https://openalex.org/keywords/carbon","display_name":"carbon","score":0.7590000033378601},{"id":"https://openalex.org/keywords/high-voltage-rectifiers","display_name":"high-voltage rectifiers","score":0.7559999823570251},{"id":"https://openalex.org/keywords/p-i-n-junction","display_name":"p-i-n junction","score":0.6869999766349792},{"id":"https://openalex.org/keywords/power-semiconductor-devices","display_name":"power semiconductor devices","score":0.5239999890327454}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8976187705993652},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4501703083515167},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41533416509628296},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.39261379837989807},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.327924907207489},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06566551327705383}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.4028/www.scientific.net/msf.338-342.1367","doi":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/msf.338-342.1367","pdf_url":null,"source":{"id":"https://openalex.org/S87940674","display_name":"Materials science forum","issn_l":"0255-5476","issn":["0255-5476","1662-9752","1662-9760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science Forum","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2014859638","https://openalex.org/W2020314509","https://openalex.org/W4251306238","https://openalex.org/W1968254116","https://openalex.org/W2109784444","https://openalex.org/W1754625258","https://openalex.org/W4233317174","https://openalex.org/W2905347611","https://openalex.org/W2588579683","https://openalex.org/W2069724176"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}