{"id":"https://openalex.org/W2139176774","doi":"https://doi.org/10.1109/ical.2008.4636548","title":"Design of online surface inspection system of hot rolled strips","display_name":"Design of online surface inspection system of hot rolled strips","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2139176774","doi":"https://doi.org/10.1109/ical.2008.4636548","mag":"2139176774"},"language":"en","primary_location":{"id":"doi:10.1109/ical.2008.4636548","doi":"https://doi.org/10.1109/ical.2008.4636548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ical.2008.4636548","pdf_url":null,"source":{"id":"https://openalex.org/S7407088917","display_name":"IEEE International Conference on Automation and Logistics (ICAL)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Automation and Logistics","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W2139176774"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102346650","display_name":"Guifang Wu","orcid":"https://orcid.org/0009-0002-2169-6054","observed_orcids":["https://orcid.org/0009-0002-2169-6054","https://orcid.org/0000-0002-7709-125X"]},"institutions":[{"id":"https://openalex.org/I167383011","display_name":"Henan University of Science and Technology","ror":"https://ror.org/05d80kz58","country_code":"CN","type":"education","lineage":["https://openalex.org/I167383011"]},{"id":"https://openalex.org/I80611190","display_name":"Jeonbuk National University","ror":"https://ror.org/05q92br09","country_code":"KR","type":"education","lineage":["https://openalex.org/I80611190"]}],"countries":["CN","KR"],"is_corresponding":false,"raw_author_name":"Guifang Wu","raw_affiliation_strings":["Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea","Electronic Information Engineering College, Henan University of Science and Technology, Luoyang, Henan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea","institution_ids":["https://openalex.org/I80611190"]},{"raw_affiliation_string":"Electronic Information Engineering College, Henan University of Science and Technology, Luoyang, Henan, China","institution_ids":["https://openalex.org/I167383011"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088433265","display_name":"Hoon-Sung Kwak","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I80611190","display_name":"Jeonbuk National University","ror":"https://ror.org/05q92br09","country_code":"KR","type":"education","lineage":["https://openalex.org/I80611190"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoonsung Kwak","raw_affiliation_strings":["Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea","institution_ids":["https://openalex.org/I80611190"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101593920","display_name":"Se\u2010Young Jang","orcid":"https://orcid.org/0000-0002-1060-0267","observed_orcids":["https://orcid.org/0000-0002-1060-0267"]},"institutions":[{"id":"https://openalex.org/I80611190","display_name":"Jeonbuk National University","ror":"https://ror.org/05q92br09","country_code":"KR","type":"education","lineage":["https://openalex.org/I80611190"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seyoung Jang","raw_affiliation_strings":["Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Engineering College, Chonbuk National University of Korea, Jeonju, South Korea","institution_ids":["https://openalex.org/I80611190"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101940716","display_name":"Ke Xu","orcid":"https://orcid.org/0000-0003-1809-7413","observed_orcids":["https://orcid.org/0000-0003-1809-7413"]},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Xu","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113837999","display_name":"Jinwu Xu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinwu Xu","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China","institution_ids":["https://openalex.org/I92403157"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9533,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.79138203,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"2291","last_page":"2295"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hot-rolled-strip","display_name":"hot-rolled strip","score":0.8989999890327454},{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"surface defect detection","score":0.949999988079071},{"id":"https://openalex.org/keywords/parallel-image-processing","display_name":"parallel image processing","score":0.722000002861023},{"id":"https://openalex.org/keywords/real-time-image-processing","display_name":"real-time image processing","score":0.8669999837875366},{"id":"https://openalex.org/keywords/defect-classification","display_name":"defect classification","score":0.9509999752044678}],"concepts":[{"id":"https://openalex.org/C200925200","wikidata":"https://www.wikidata.org/wiki/Q7624170","display_name":"STRIPS","level":2,"score":0.9669520258903503},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5932081937789917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5798476934432983},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5683063268661499},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5337197780609131},{"id":"https://openalex.org/C2993092055","wikidata":"https://www.wikidata.org/wiki/Q452648","display_name":"Hot rolled","level":2,"score":0.5212484002113342},{"id":"https://openalex.org/C2780242121","wikidata":"https://www.wikidata.org/wiki/Q7624097","display_name":"Strip steel","level":2,"score":0.43531960248947144},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4251525402069092},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35981810092926025},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2769436836242676},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10211601853370667},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07326143980026245},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.06560438871383667},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06438624858856201},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ical.2008.4636548","doi":"https://doi.org/10.1109/ical.2008.4636548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ical.2008.4636548","pdf_url":null,"source":{"id":"https://openalex.org/S7407088917","display_name":"IEEE International Conference on Automation and Logistics (ICAL)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Automation and Logistics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.428600013256073,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1574496672","https://openalex.org/W2019895220","https://openalex.org/W2083099870","https://openalex.org/W2092226967","https://openalex.org/W2111007172","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2184443530","https://openalex.org/W2357859017","https://openalex.org/W2363680596","https://openalex.org/W2066048737","https://openalex.org/W1013841827","https://openalex.org/W2351620955","https://openalex.org/W2383384369","https://openalex.org/W55030103","https://openalex.org/W2574859884","https://openalex.org/W1972657816"],"abstract_inverted_index":{"An":[0],"online":[1],"surface":[2,19,47,81],"inspection":[3],"system":[4,12,58,98],"of":[5,45,82,96,111],"hot":[6,22,112],"rolled":[7,23,113],"strips":[8,24,114],"is":[9,13,61,122],"introduced.":[10],"This":[11],"designed":[14],"to":[15,42,74,91,99,124],"detect":[16,108],"such":[17],"main":[18,76,109],"defects":[20,87,110],"on":[21,79],"as":[25],"scar,":[26],"scratches,":[27],"pits,":[28],"cracks,":[29],"cross":[30],"hatchings,":[31],"and":[32,49,68,120],"so":[33],"on.":[34],"Multiple":[35],"CCD":[36],"area":[37],"scan":[38],"cameras":[39],"are":[40,53],"adopted":[41],"capture":[43],"images":[44,52],"strip":[46],"simultaneously,":[48],"all":[50],"the":[51,80,86,97],"processed":[54],"by":[55,63],"parallel":[56,69],"computation":[57,70],"real-time,":[59],"which":[60],"supported":[62],"fast":[64],"image":[65],"process":[66],"techniques":[67],"techniques,":[71],"in":[72],"order":[73],"snap":[75],"defect":[77],"regions":[78],"strips.":[83],"At":[84],"last,":[85],"will":[88],"be":[89,125],"classified":[90],"several":[92],"types.":[93],"The":[94],"application":[95],"a":[100],"practical":[101],"production":[102],"line":[103],"shows":[104],"that":[105],"it":[106,121],"can":[107],"more":[115],"effectively":[116],"than":[117],"traditional":[118],"method,":[119],"easily":[123],"maintained.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2016-06-24T00:00:00"}