{"id":"https://openalex.org/W2137941389","doi":"https://doi.org/10.1109/icdl.1990.202929","title":"Possible models for the earliest prebreakdown events in DC stressed hexane","display_name":"Possible models for the earliest prebreakdown events in DC stressed hexane","publication_year":2002,"publication_date":"2002-12-04","ids":{"openalex":"https://openalex.org/W2137941389","doi":"https://doi.org/10.1109/icdl.1990.202929","mag":"2137941389"},"language":"en","primary_location":{"id":"doi:10.1109/icdl.1990.202929","doi":"https://doi.org/10.1109/icdl.1990.202929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdl.1990.202929","pdf_url":null,"source":{"id":"https://openalex.org/S7407086574","display_name":"IEEE International Conference on Dielectric Liquids (ICDL)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th International Conference on Conduction and Breakdown in Dielectric Liquids","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113695787","display_name":"I. Alexeff","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I. Alexeff","raw_affiliation_strings":["Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113672501","display_name":"M.O. Pace","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.O. Pace","raw_affiliation_strings":["Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103363178","display_name":"T.V. Blalock","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.V. Blalock","raw_affiliation_strings":["Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029186934","display_name":"Alan L. Wintenberg","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.L. Wintenberg","raw_affiliation_strings":["Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering Department, University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., TEnnessee Univ., Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I75027704"],"apc_list":null,"apc_paid":null,"fwci":5.4484,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.95806703,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10642","display_name":"Atmospheric-Pressure Plasma Applications","score":0.44119998812675476,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10642","display_name":"Atmospheric-Pressure Plasma Applications","score":0.44119998812675476,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.21089999377727509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.14880000054836273,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dc-breakdown","display_name":"DC breakdown","score":0.628000020980835},{"id":"https://openalex.org/keywords/low-density-regions","display_name":"low-density areas","score":0.8889999985694885},{"id":"https://openalex.org/keywords/electrical-pulses","display_name":"electric pulses","score":0.8289999961853027},{"id":"https://openalex.org/keywords/light-emission","display_name":"light emission","score":0.8650000095367432},{"id":"https://openalex.org/keywords/fluid-dynamics","display_name":"fluid dynamics","score":0.531000018119812}],"concepts":[{"id":"https://openalex.org/C2777077568","wikidata":"https://www.wikidata.org/wiki/Q150440","display_name":"Hexane","level":2,"score":0.7258942127227783},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4360942840576172},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3375847637653351},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.26545053720474243},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.12201723456382751}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icdl.1990.202929","doi":"https://doi.org/10.1109/icdl.1990.202929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdl.1990.202929","pdf_url":null,"source":{"id":"https://openalex.org/S7407086574","display_name":"IEEE International Conference on Dielectric Liquids (ICDL)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th International Conference on Conduction and Breakdown in Dielectric Liquids","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1840594952","https://openalex.org/W2064670385","https://openalex.org/W2088579854","https://openalex.org/W2122860915","https://openalex.org/W2894136457","https://openalex.org/W4251305190"],"related_works":["https://openalex.org/W1678435625","https://openalex.org/W2088579854","https://openalex.org/W2023140315","https://openalex.org/W1955049913","https://openalex.org/W1840594952","https://openalex.org/W2072813948","https://openalex.org/W2555479896","https://openalex.org/W4251305190","https://openalex.org/W1831322159","https://openalex.org/W2031880718"],"abstract_inverted_index":{"Observed":[0],"phenomena":[1],"in":[2,92],"liquid":[3],"hexane":[4],"at":[5],"a":[6,13,17,23,29],"point":[7],"cathode":[8],"include":[9],"the":[10,35,43,46,48,51,61,64,76,89],"formation":[11],"of":[12,19,25,34,45,50,63,84,88,94],"low-density":[14,52,65,90],"region":[15,91],"(LDR),":[16],"chain":[18],"growing":[20],"electrical":[21,55,95],"pulses,":[22],"succession":[24],"light":[26,58,81],"flashes,":[27],"and":[28,32,57,60,80,86,96],"final":[30],"disruption":[31],"termination":[33,83],"process.":[36],"The":[37],"authors":[38],"address":[39],"three":[40],"separate":[41],"effects:":[42],"inception":[44],"process;":[47],"growth":[49],"region,":[53],"with":[54],"pulses":[56],"emission;":[59],"break-up":[62,87],"region.":[66],"It":[67],"is":[68,72],"shown":[69],"that":[70],"it":[71],"possible":[73],"to":[74],"predict":[75],"onset,":[77],"growth,":[78,85],"pulse":[79],"phenomena,":[82],"terms":[93],"fluid":[97],"dynamical":[98],"processes.>":[99]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}