{"id":"https://openalex.org/W2137674396","doi":"https://doi.org/10.1117/12.456082","title":"Fiber optic interferometry for industrial process monitoring and control applications","display_name":"Fiber optic interferometry for industrial process monitoring and control applications","publication_year":2002,"publication_date":"2002-02-18","ids":{"openalex":"https://openalex.org/W2137674396","doi":"https://doi.org/10.1117/12.456082","mag":"2137674396"},"language":"en","primary_location":{"id":"doi:10.1117/12.456082","doi":"https://doi.org/10.1117/12.456082","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.456082","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110076961","display_name":"Michael A. Marcus","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I175669267","display_name":"Carestream (United States)","ror":"https://ror.org/048m16q57","country_code":"US","type":"company","lineage":["https://openalex.org/I175669267"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Michael A. Marcus","raw_affiliation_strings":["Eastman Kodak Co. (United States)","Eastman Kodak Co. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eastman Kodak Co. (United States)","institution_ids":["https://openalex.org/I175669267","https://openalex.org/I4210159451"]},{"raw_affiliation_string":"Eastman Kodak Co. (USA)","institution_ids":["https://openalex.org/I175669267","https://openalex.org/I4210159451"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5110076961"],"corresponding_institution_ids":["https://openalex.org/I175669267","https://openalex.org/I4210159451"],"apc_list":null,"apc_paid":null,"fwci":0.2054,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.35932989,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"4578","issue":null,"first_page":"136","last_page":"144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8945000171661377,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8945000171661377,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.08250000327825546,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.003000000026077032,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optical-fiber-interferometry","display_name":"fiber optic interferometry","score":0.9829999804496765},{"id":"https://openalex.org/keywords/coating-thickness-measurement","display_name":"coating thickness measurement","score":0.5659999847412109},{"id":"https://openalex.org/keywords/film-thickness-uniformity","display_name":"film thickness uniformity","score":0.8130000233650208},{"id":"https://openalex.org/keywords/optical-path-length-measurement","display_name":"optical path length measurement","score":0.7570000290870667},{"id":"https://openalex.org/keywords/surface-profilometry","display_name":"surface profilometry","score":0.8019999861717224},{"id":"https://openalex.org/keywords/industrial-process-monitoring","display_name":"industrial process monitoring","score":0.7860000133514404}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7008258104324341},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6884978413581848},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6535295248031616},{"id":"https://openalex.org/C9809166","wikidata":"https://www.wikidata.org/wiki/Q733088","display_name":"Michelson interferometer","level":3,"score":0.6079973578453064},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.502422571182251},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.47994402050971985},{"id":"https://openalex.org/C2781331281","wikidata":"https://www.wikidata.org/wiki/Q2392056","display_name":"Virtual instrumentation","level":3,"score":0.41249987483024597},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.40768271684646606},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.326638400554657},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17170462012290955},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16307926177978516},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.456082","doi":"https://doi.org/10.1117/12.456082","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.456082","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1540851137","https://openalex.org/W1889939800","https://openalex.org/W1995193711","https://openalex.org/W1996569184","https://openalex.org/W2046462187","https://openalex.org/W2092764057","https://openalex.org/W2105672294","https://openalex.org/W2210138713","https://openalex.org/W2222221435","https://openalex.org/W2256093139","https://openalex.org/W2265999770","https://openalex.org/W3149448910"],"related_works":["https://openalex.org/W7097675958","https://openalex.org/W2027421492","https://openalex.org/W2041013893","https://openalex.org/W2094730700","https://openalex.org/W2094364921","https://openalex.org/W7004974779","https://openalex.org/W2018456906","https://openalex.org/W2073521491","https://openalex.org/W2011870288","https://openalex.org/W181626520"],"abstract_inverted_index":{"Over":[0],"the":[1,102],"past":[2],"few":[3],"years":[4],"we":[5],"have":[6],"been":[7],"developing":[8],"applications":[9,30,110],"for":[10,137],"a":[11,27,78,83,125,128],"high-resolution":[12],"(sub-micron":[13],"accuracy)":[14],"fiber":[15],"optic":[16],"coupled":[17],"dual":[18],"Michelson":[19,79],"interferometer-based":[20],"instrument.":[21],"It":[22],"is":[23],"being":[24],"utilized":[25,136],"in":[26],"variety":[28],"of":[29,105,127],"including":[31],"monitoring":[32],"liquid":[33],"layer":[34],"thickness":[35,42,147],"uniformity":[36,43],"on":[37],"coating":[38],"hoppers,":[39],"film":[40],"base":[41],"measurement,":[44],"digital":[45],"camera":[46],"focus":[47],"assessment,":[48],"optical":[49,73],"cell":[50],"path":[51],"length":[52],"assessment":[53],"and":[54,56,66,75,90,109,117,142],"imager":[55],"wafer":[57],"surface":[58,140],"profile":[59],"mapping.":[60],"The":[61,121],"instrument":[62,107,113,131],"includes":[63],"both":[64],"coherent":[65],"non-coherent":[67],"light":[68],"sources,":[69],"custom":[70,81],"application":[71,96],"dependent":[72],"probes":[74],"sample":[76],"interfaces,":[77],"interferometer,":[80],"electronics,":[82],"Pentium-based":[84],"PC":[85],"with":[86,124],"data":[87],"acquisition":[88],"cards":[89],"LabWindows":[91],"CVI":[92],"or":[93],"LabView":[94],"based":[95],"specific":[97],"software.":[98],"This":[99],"paper":[100],"describes":[101],"development":[103],"evolution":[104],"this":[106],"platform":[108],"highlighting":[111],"robust":[112],"design,":[114],"hardware,":[115],"software,":[116],"user":[118],"interfaces":[119],"development.":[120],"talk":[122],"concludes":[123],"discussion":[126],"new":[129],"high-speed":[130],"configuration,":[132],"which":[133],"can":[134],"be":[135],"high":[138],"speed":[139],"profiling":[141],"as":[143],"an":[144],"on-line":[145],"web":[146],"gauge.":[148]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}