{"id":"https://openalex.org/W2137280943","doi":"https://doi.org/10.1109/dt.2013.6566309","title":"Security assessment and green issues of FPGA-based information & control systems","display_name":"Security assessment and green issues of FPGA-based information & control systems","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2137280943","doi":"https://doi.org/10.1109/dt.2013.6566309","mag":"2137280943"},"language":"en","primary_location":{"id":"doi:10.1109/dt.2013.6566309","doi":"https://doi.org/10.1109/dt.2013.6566309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dt.2013.6566309","pdf_url":null,"source":{"id":"https://openalex.org/S4306498196","display_name":"International Conference on Information and Digital Technologies (IDT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Conference on Digital Technologies 2013","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W2137280943"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028247762","display_name":"Oleg A. Illiashenko","orcid":"https://orcid.org/0000-0002-4672-6400","observed_orcids":["https://orcid.org/0000-0002-4672-6400"]},"institutions":[{"id":"https://openalex.org/I23686167","display_name":"National Aerospace University \u2013 Kharkiv Aviation Institute","ror":"https://ror.org/048j5n646","country_code":"UA","type":"education","lineage":["https://openalex.org/I23686167"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Oleg Illiashenko","raw_affiliation_strings":["Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]},{"raw_affiliation_string":"Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066848534","display_name":"Vyacheslav Serhiiovych Kharchenko","orcid":"https://orcid.org/0000-0001-5352-077X","observed_orcids":["https://orcid.org/0000-0001-5352-077X"]},"institutions":[{"id":"https://openalex.org/I23686167","display_name":"National Aerospace University \u2013 Kharkiv Aviation Institute","ror":"https://ror.org/048j5n646","country_code":"UA","type":"education","lineage":["https://openalex.org/I23686167"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Vyacheslav Kharchenko","raw_affiliation_strings":["Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]},{"raw_affiliation_string":"Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002229946","display_name":"Myhailo Ahtyamov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I23686167","display_name":"National Aerospace University \u2013 Kharkiv Aviation Institute","ror":"https://ror.org/048j5n646","country_code":"UA","type":"education","lineage":["https://openalex.org/I23686167"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Myhailo Ahtyamov","raw_affiliation_strings":["Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Systems and Networks, National Aerospace University, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]},{"raw_affiliation_string":"Dept. of Comput. Syst. & Networks, Nat. Aerosp. Univ. \u201cKhAI\u201d, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I23686167"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I23686167"],"apc_list":null,"apc_paid":null,"fwci":0.9173,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.63236089,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"185","last_page":"190"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9243000149726868,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9243000149726868,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.03269999846816063,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.008500000461935997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/security-assessment","display_name":"security analysis","score":0.9380000233650208},{"id":"https://openalex.org/keywords/safety-assessment","display_name":"safety assessment","score":0.6370000243186951},{"id":"https://openalex.org/keywords/gap-analysis","display_name":"gap analysis","score":0.7149999737739563},{"id":"https://openalex.org/keywords/fmeca","display_name":"FMECA","score":0.968999981880188},{"id":"https://openalex.org/keywords/intrusion-analysis","display_name":"intrusion analysis","score":0.5789999961853027},{"id":"https://openalex.org/keywords/reliability-analysis","display_name":"reliability analysis","score":0.5619999766349792},{"id":"https://openalex.org/keywords/safety-critical-systems","display_name":"safety-critical systems","score":0.6159999966621399},{"id":"https://openalex.org/keywords/green-computing","display_name":"green computing","score":0.7720000147819519},{"id":"https://openalex.org/keywords/system-life-cycle","display_name":"system life cycle","score":0.546999990940094},{"id":"https://openalex.org/keywords/automated-assessment-tools","display_name":"automated assessment systems","score":0.6840000152587891}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6365821361541748},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.6173136830329895},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6136350035667419},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.524550199508667},{"id":"https://openalex.org/C35280785","wikidata":"https://www.wikidata.org/wiki/Q559486","display_name":"System lifecycle","level":4,"score":0.504456639289856},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4785507321357727},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4782882332801819},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.460428923368454},{"id":"https://openalex.org/C527648132","wikidata":"https://www.wikidata.org/wiki/Q189900","display_name":"Information security","level":2,"score":0.4235348701477051},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3770174980163574},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3616551160812378},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30352330207824707},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24159839749336243},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.2342311143875122},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.1297554075717926},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11433053016662598},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C30452754","wikidata":"https://www.wikidata.org/wiki/Q621590","display_name":"Application lifecycle management","level":3,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dt.2013.6566309","doi":"https://doi.org/10.1109/dt.2013.6566309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dt.2013.6566309","pdf_url":null,"source":{"id":"https://openalex.org/S4306498196","display_name":"International Conference on Information and Digital Technologies (IDT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Conference on Digital Technologies 2013","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7207000255584717,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W101143931","https://openalex.org/W164289057","https://openalex.org/W1514204340","https://openalex.org/W2013326953","https://openalex.org/W2063460813","https://openalex.org/W2120262026","https://openalex.org/W2507916045","https://openalex.org/W6884929113"],"related_works":["https://openalex.org/W2433749641","https://openalex.org/W2063460813","https://openalex.org/W2296138883","https://openalex.org/W1542403854","https://openalex.org/W2536395151","https://openalex.org/W2734184498","https://openalex.org/W270922321","https://openalex.org/W2485381367","https://openalex.org/W2094101095","https://openalex.org/W2150850081"],"abstract_inverted_index":{"Main":[0],"elements":[1],"of":[2,20,32,44,60,62,71,75,89,97,102],"critical":[3,63],"FPGA-based":[4,64],"information":[5],"and":[6,25,29,46,49,77,82,99],"control":[7],"systems":[8,104],"(I&Cs)":[9],"security":[10,50,78,100],"assessment":[11],"are":[12,105],"described.":[13],"It":[14],"is":[15],"proposed":[16],"to":[17,39,94],"use":[18],"combination":[19],"traditional":[21],"techniques":[22],"for":[23,42],"reliability":[24],"safety":[26,48,76,98],"analysis:":[27],"GAP-analysis":[28],"IMECA-analysis":[30],"(modification":[31],"FMECA":[33],"which":[34,52,85],"takes":[35],"into":[36],"account":[37],"intrusion":[38],"the":[40,87],"system)":[41],"analysis":[43],"requirements":[45],"possible":[47],"deficits":[51],"could":[53],"take":[54],"place":[55],"during":[56],"transition":[57],"between":[58],"stages":[59],"lifecycle":[61],"I&Cs.":[65],"The":[66],"article":[67],"depicts":[68],"main":[69],"steps":[70],"assessment,":[72],"life":[73],"cycle":[74],"FPGA":[79],"project":[80],"development":[81],"software":[83],"tool,":[84],"automates":[86],"process":[88],"assessment.":[90],"Some":[91],"challenges":[92],"regarding":[93],"green":[95],"aspect":[96],"ensuring":[101],"energy-critical":[103],"discussed.":[106]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2016-06-24T00:00:00"}