{"id":"https://openalex.org/W2136102804","doi":"https://doi.org/10.1109/omems.2000.879637","title":"Tunable VCSEL with integrated heater and planar waveguide wavelength monitor","display_name":"Tunable VCSEL with integrated heater and planar waveguide wavelength monitor","publication_year":2002,"publication_date":"2002-11-07","ids":{"openalex":"https://openalex.org/W2136102804","doi":"https://doi.org/10.1109/omems.2000.879637","mag":"2136102804"},"language":"en","primary_location":{"id":"doi:10.1109/omems.2000.879637","doi":"https://doi.org/10.1109/omems.2000.879637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/omems.2000.879637","pdf_url":null,"source":{"id":"https://openalex.org/S4306418786","display_name":"IEEE/LEOS International Conference on Optical MEMS","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2000 IEEE/LEOS International Conference on Optical MEMS (Cat. No.00EX399)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041522957","display_name":"Gerd Blau","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"G. Blau","raw_affiliation_strings":["Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113448129","display_name":"M. T. Gale","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"M.T. Gale","raw_affiliation_strings":["Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065303373","display_name":"J. S\u00f6chtig","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"J. Sochtig","raw_affiliation_strings":["Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","Centre Suisse d'Electronique et de Microtechnique SA, Neuchatel, Neuch\u00e2tel, CH"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","institution_ids":["https://openalex.org/I135218257"]},{"raw_affiliation_string":"Centre Suisse d'Electronique et de Microtechnique SA, Neuchatel, Neuch\u00e2tel, CH","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009503759","display_name":"Ch. Zscholle","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ch. Zscholle","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084559968","display_name":"R. H\u00f6vel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"R. Hovel","raw_affiliation_strings":["Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113696768","display_name":"K. Gulden","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"K. Gulden","raw_affiliation_strings":["Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Suisse d''Electronique et de Microtechnique, Zurich, Switzerland","institution_ids":["https://openalex.org/I135218257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1268,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72668686,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"84"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tunable-vcsel","display_name":"tunable VCSEL","score":0.9070000052452087},{"id":"https://openalex.org/keywords/vertical-cavity-surface-emitting-lasers","display_name":"vertical-cavity surface-emitting lasers","score":0.9350000023841858},{"id":"https://openalex.org/keywords/integrated-heater","display_name":"integrated heater","score":0.7419999837875366},{"id":"https://openalex.org/keywords/planar-waveguides","display_name":"planar waveguides","score":0.7979999780654907},{"id":"https://openalex.org/keywords/wavelength-monitoring","display_name":"wavelength monitoring","score":0.9330000281333923},{"id":"https://openalex.org/keywords/single-mode-laser","display_name":"single-mode laser","score":0.6650000214576721},{"id":"https://openalex.org/keywords/constant-power-output","display_name":"constant power output","score":0.718999981880188}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7336865067481995},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.6678512096405029},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6044657230377197},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6042422652244568},{"id":"https://openalex.org/C106246969","wikidata":"https://www.wikidata.org/wiki/Q2009618","display_name":"Vertical-cavity surface-emitting laser","level":3,"score":0.5881969928741455},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.573261559009552},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5440823435783386},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5314390063285828},{"id":"https://openalex.org/C34445779","wikidata":"https://www.wikidata.org/wiki/Q1571347","display_name":"Collimated light","level":3,"score":0.5292921662330627},{"id":"https://openalex.org/C126753812","wikidata":"https://www.wikidata.org/wiki/Q653294","display_name":"Diffraction grating","level":3,"score":0.4840542674064636},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.45700395107269287},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4399165213108063},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.4194626212120056},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.3691360652446747},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23732107877731323},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08146616816520691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.07567587494850159},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/omems.2000.879637","doi":"https://doi.org/10.1109/omems.2000.879637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/omems.2000.879637","pdf_url":null,"source":{"id":"https://openalex.org/S4306418786","display_name":"IEEE/LEOS International Conference on Optical MEMS","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2000 IEEE/LEOS International Conference on Optical MEMS (Cat. No.00EX399)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2082350994","https://openalex.org/W2105825283","https://openalex.org/W2318575404"],"related_works":["https://openalex.org/W3146006805","https://openalex.org/W4390482435","https://openalex.org/W2077005258","https://openalex.org/W2482937678","https://openalex.org/W2155982075","https://openalex.org/W2248081276","https://openalex.org/W2011713708","https://openalex.org/W2294242331","https://openalex.org/W2006174097","https://openalex.org/W1607267449"],"abstract_inverted_index":{"A":[0],"compact":[1],"solution":[2],"for":[3],"tuning":[4],"and":[5,43],"monitoring":[6],"the":[7,28,53,57],"emission":[8],"waveguide":[9,35],"of":[10,52,59],"a":[11,32,39,44],"single":[12],"mode":[13],"VCSEL":[14],"(/spl":[15],"lambda/=760":[16],"nm)":[17],"at":[18],"constant":[19],"output":[20],"power":[21],"is":[22,31,55],"presented.":[23],"The":[24,47],"key":[25],"element":[26],"within":[27],"micro":[29],"system":[30],"chirped":[33],"grating":[34],"coupler":[36],"combined":[37],"with":[38],"diffractive":[40],"collimating":[41],"lens":[42],"two-segment":[45],"detector.":[46],"resulting":[48],"wavelength":[49],"measurement":[50],"resolution":[51],"chip":[54],"in":[56],"range":[58],"0.06":[60],"nm.":[61]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}