{"id":"https://openalex.org/W2133138397","doi":"https://doi.org/10.1016/j.matchemphys.2009.01.026","title":"Synthesis and growth of nearly perfect single crystal of l-histidine bromide (LHB) and its structural, optical and electrical characterizations","display_name":"Synthesis and growth of nearly perfect single crystal of l-histidine bromide (LHB) and its structural, optical and electrical characterizations","publication_year":2009,"publication_date":"2009-02-27","ids":{"openalex":"https://openalex.org/W2133138397","doi":"https://doi.org/10.1016/j.matchemphys.2009.01.026","mag":"2133138397"},"language":"en","primary_location":{"id":"doi:10.1016/j.matchemphys.2009.01.026","doi":"https://doi.org/10.1016/j.matchemphys.2009.01.026","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matchemphys.2009.01.026","pdf_url":null,"source":{"id":"https://openalex.org/S5707928","display_name":"Materials Chemistry and Physics","issn_l":"0254-0584","issn":["0254-0584","1879-3312"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Chemistry and Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069232559","display_name":"Narayanasamy Vijayan","orcid":"https://orcid.org/0000-0002-8242-0097","observed_orcids":["https://orcid.org/0000-0002-8242-0097"]},"institutions":[{"id":"https://openalex.org/I63634437","display_name":"Universidad Aut\u00f3noma de Madrid","ror":"https://ror.org/01cby8j38","country_code":"ES","type":"education","lineage":["https://openalex.org/I63634437"]},{"id":"https://openalex.org/I88910343","display_name":"CSIR National Physical Laboratory of India","ror":"https://ror.org/0307k1x46","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702","https://openalex.org/I88910343"]}],"countries":["ES","IN"],"is_corresponding":true,"raw_author_name":"N. Vijayan","raw_affiliation_strings":["Dpto. F\u00edsica de Materiales, Facultad de Ciencias, Univ. Aut\u00f3noma de Madrid, 28049, Spain","Materials Characterization Division, National Physical Laboratory, Dr. KS Krishnan Road, New Delhi 110012, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dpto. F\u00edsica de Materiales, Facultad de Ciencias, Univ. Aut\u00f3noma de Madrid, 28049, Spain","institution_ids":["https://openalex.org/I63634437"]},{"raw_affiliation_string":"Materials Characterization Division, National Physical Laboratory, Dr. KS Krishnan Road, New Delhi 110012, India","institution_ids":["https://openalex.org/I88910343"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057593167","display_name":"Godavarthi Bhagavannarayana","orcid":"https://orcid.org/0000-0003-3638-5945","observed_orcids":["https://orcid.org/0000-0003-3638-5945"]},"institutions":[{"id":"https://openalex.org/I88910343","display_name":"CSIR National Physical Laboratory of India","ror":"https://ror.org/0307k1x46","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702","https://openalex.org/I88910343"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"G. Bhagavannarayana","raw_affiliation_strings":["Materials Characterization Division, National Physical Laboratory, Dr. KS Krishnan Road, New Delhi 110012, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Characterization Division, National Physical Laboratory, Dr. KS Krishnan Road, New Delhi 110012, India","institution_ids":["https://openalex.org/I88910343"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103032378","display_name":"K. Nagarajan","orcid":"https://orcid.org/0000-0001-8551-661X","observed_orcids":["https://orcid.org/0000-0001-8551-661X"]},"institutions":[{"id":"https://openalex.org/I4405260672","display_name":"PSG College of Arts & Science","ror":"https://ror.org/043tv4788","country_code":"IN","type":"education","lineage":["https://openalex.org/I4405260672"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K. Nagarajan","raw_affiliation_strings":["Dept. of Physics, PSG College of Arts and Science, Coimbatore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Physics, PSG College of Arts and Science, Coimbatore, India","institution_ids":["https://openalex.org/I4405260672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084541394","display_name":"V. Upadhyaya","orcid":"https://orcid.org/0000-0001-6653-4337","observed_orcids":["https://orcid.org/0000-0001-6653-4337"]},"institutions":[{"id":"https://openalex.org/I164861460","display_name":"Manipal Academy of Higher Education","ror":"https://ror.org/02xzytt36","country_code":"IN","type":"education","lineage":["https://openalex.org/I164861460"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V. Upadhyaya","raw_affiliation_strings":["Dept. of Physics, Manipal Institute of Technology, Manipal, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Physics, Manipal Institute of Technology, Manipal, India","institution_ids":["https://openalex.org/I164861460"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069232559"],"corresponding_institution_ids":["https://openalex.org/I63634437","https://openalex.org/I88910343"],"apc_list":{"value":3230,"currency":"USD","value_usd":3230},"apc_paid":null,"fwci":0.8097,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.67664351,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"115","issue":"2-3","first_page":"656","last_page":"659"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11025","display_name":"Nonlinear Optical Materials Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11025","display_name":"Nonlinear Optical Materials Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10939","display_name":"Crystal Structures and Properties","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11050","display_name":"Photorefractive and Nonlinear Optics","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nonlinear-optical-crystals","display_name":"nonlinear optical crystals","score":0.7360000014305115},{"id":"https://openalex.org/keywords/semi-organic-nonlinear-optical-materials","display_name":"semi-organic nonlinear optical materials","score":0.8159999847412109},{"id":"https://openalex.org/keywords/single-crystal-growth","display_name":"single crystal growth","score":0.8880000114440918},{"id":"https://openalex.org/keywords/slow-evaporation-solution-growth","display_name":"slow evaporation crystal growth","score":0.9419999718666077},{"id":"https://openalex.org/keywords/second-harmonic-generation","display_name":"second harmonic generation","score":0.7680000066757202},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":0.9399999976158142},{"id":"https://openalex.org/keywords/birefringence","display_name":"birefringence","score":0.9919999837875366},{"id":"https://openalex.org/keywords/photoluminescence","display_name":"photoluminescence","score":0.9739999771118164},{"id":"https://openalex.org/keywords/dielectric-properties","display_name":"dielectric properties","score":0.9710000157356262},{"id":"https://openalex.org/keywords/laser-induced-damage-threshold","display_name":"laser-induced damage threshold","score":0.9150000214576721},{"id":"https://openalex.org/keywords/nd-yag-laser","display_name":"Nd:YAG laser","score":0.9309999942779541}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7562059164047241},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.6277022957801819},{"id":"https://openalex.org/C125743686","wikidata":"https://www.wikidata.org/wiki/Q108779","display_name":"Birefringence","level":2,"score":0.6116495132446289},{"id":"https://openalex.org/C73922627","wikidata":"https://www.wikidata.org/wiki/Q754943","display_name":"Single crystal","level":2,"score":0.5833969116210938},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5269689559936523},{"id":"https://openalex.org/C30713254","wikidata":"https://www.wikidata.org/wiki/Q1455635","display_name":"Second-harmonic generation","level":3,"score":0.513580322265625},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5111775994300842},{"id":"https://openalex.org/C160892712","wikidata":"https://www.wikidata.org/wiki/Q901559","display_name":"Fourier transform infrared spectroscopy","level":2,"score":0.5046378374099731},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.49390560388565063},{"id":"https://openalex.org/C39546656","wikidata":"https://www.wikidata.org/wiki/Q904573","display_name":"Diffractometer","level":3,"score":0.48065292835235596},{"id":"https://openalex.org/C26456737","wikidata":"https://www.wikidata.org/wiki/Q185154","display_name":"Crystal growth","level":2,"score":0.4492805600166321},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.44874873757362366},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.43163660168647766},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.3056987524032593},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16020366549491882},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09079629182815552},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.07714089751243591},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.matchemphys.2009.01.026","doi":"https://doi.org/10.1016/j.matchemphys.2009.01.026","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matchemphys.2009.01.026","pdf_url":null,"source":{"id":"https://openalex.org/S5707928","display_name":"Materials Chemistry and Physics","issn_l":"0254-0584","issn":["0254-0584","1879-3312"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Chemistry and Physics","raw_type":"journal-article"},{"id":"pmh:oai:npl.csircentral.net:715","doi":null,"is_oa":false,"landing_page_url":"http://npl.csircentral.net/715/1/273.pdf","pdf_url":"http://npl.csircentral.net/715/1/273.pdf","source":{"id":"https://openalex.org/S4306401089","display_name":"IR@NPL (CSIR-The National Physical Laboratory(NPL))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66760702","host_organization_name":"Council of Scientific and Industrial Research","host_organization_lineage":["https://openalex.org/I66760702"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1972509394","https://openalex.org/W1998159800","https://openalex.org/W2002044331","https://openalex.org/W2044687564","https://openalex.org/W2081676482","https://openalex.org/W2083588888","https://openalex.org/W2086808349","https://openalex.org/W2090433632"],"related_works":["https://openalex.org/W2090433632","https://openalex.org/W1998159800","https://openalex.org/W2004549066","https://openalex.org/W2081676482","https://openalex.org/W2038448040","https://openalex.org/W4414249372","https://openalex.org/W7057216934","https://openalex.org/W2012325753","https://openalex.org/W3085580448","https://openalex.org/W2792564006"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":6}],"updated_date":"2026-09-22T17:25:34.749102","created_date":"2016-06-24T00:00:00"}