{"id":"https://openalex.org/W2129734500","doi":"https://doi.org/10.1109/tr.1968.5217517","title":"System Reliability Allocation and a Computational Algorithm","display_name":"System Reliability Allocation and a Computational Algorithm","publication_year":1968,"publication_date":"1968-06-01","ids":{"openalex":"https://openalex.org/W2129734500","doi":"https://doi.org/10.1109/tr.1968.5217517","mag":"2129734500"},"language":"en","primary_location":{"id":"doi:10.1109/tr.1968.5217517","doi":"https://doi.org/10.1109/tr.1968.5217517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.1968.5217517","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000958779","display_name":"David Eugene Fyffe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David E. Fyffe","raw_affiliation_strings":["School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002583634","display_name":"William W. Hines","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William W. Hines","raw_affiliation_strings":["School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069392021","display_name":"Nam Kee Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nam Kee Lee","raw_affiliation_strings":["School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Industrial Engineering, Georgia Institute of Technology, Atlanta. Ga. 30332]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":3.2909,"has_fulltext":false,"cited_by_count":346,"citation_normalized_percentile":{"value":0.86705202,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"R-17","issue":"2","first_page":"64","last_page":"69"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-allocation","display_name":"reliability allocation","score":0.5849999785423279},{"id":"https://openalex.org/keywords/trade-off-analysis","display_name":"trade-off analysis","score":0.9089999794960022},{"id":"https://openalex.org/keywords/sequential-decision-problems","display_name":"sequential decision problems","score":0.8339999914169312},{"id":"https://openalex.org/keywords/dynamic-programming","display_name":"dynamic programming","score":0.7870000004768372},{"id":"https://openalex.org/keywords/computer-algorithms","display_name":"computational algorithms","score":0.7170000076293945},{"id":"https://openalex.org/keywords/optimal-solution-selection","display_name":"optimal solution selection","score":0.5009999871253967}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7325792908668518},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6605381369590759},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6026940941810608},{"id":"https://openalex.org/C37404715","wikidata":"https://www.wikidata.org/wiki/Q380679","display_name":"Dynamic programming","level":2,"score":0.5791847109794617},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5370100736618042},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5108234882354736},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.5073727965354919},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4781399965286255},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3531199097633362},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16400927305221558},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1499275267124176},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.1464410424232483},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.1968.5217517","doi":"https://doi.org/10.1109/tr.1968.5217517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.1968.5217517","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2095095223","https://openalex.org/W2497399944"],"related_works":["https://openalex.org/W2032526597","https://openalex.org/W2189051297","https://openalex.org/W2366870431","https://openalex.org/W2296631311","https://openalex.org/W1969156428","https://openalex.org/W3116869145","https://openalex.org/W3217421788","https://openalex.org/W2159715575","https://openalex.org/W2166897329","https://openalex.org/W257160466"],"abstract_inverted_index":{"The":[0],"detailed":[1],"allocation":[2],"method":[3],"of":[4,21],"system":[5],"reliability":[6],"discussed":[7],"in":[8,18],"this":[9],"paper":[10],"is":[11,26,43],"designed":[12],"to":[13],"select":[14],"the":[15,19,22,29],"optimal":[16],"solution":[17],"context":[20],"trade-off":[23],"analysis.":[24],"It":[25],"noted":[27],"that":[28],"problem":[30],"may":[31],"be":[32],"structured":[33],"as":[34],"an":[35],"n-stage":[36],"sequential":[37],"decision":[38],"problem.":[39],"A":[40],"computational":[41],"algorithm":[42],"developed":[44],"using":[45],"dynamic":[46],"programming.":[47]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":21},{"year":2020,"cited_by_count":15},{"year":2019,"cited_by_count":16},{"year":2018,"cited_by_count":12},{"year":2017,"cited_by_count":18},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":21},{"year":2014,"cited_by_count":32},{"year":2013,"cited_by_count":14},{"year":2012,"cited_by_count":17}],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2016-06-24T00:00:00"}