{"id":"https://openalex.org/W2129149240","doi":"https://doi.org/10.1364/oic.2004.thd10","title":"Rugate filter made with composite thin film by ion beam sputtering","display_name":"Rugate filter made with composite thin film by ion beam sputtering","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W2129149240","doi":"https://doi.org/10.1364/oic.2004.thd10","mag":"2129149240"},"language":"en","primary_location":{"id":"doi:10.1364/oic.2004.thd10","doi":"https://doi.org/10.1364/oic.2004.thd10","is_oa":false,"landing_page_url":"https://doi.org/10.1364/oic.2004.thd10","pdf_url":null,"source":{"id":"https://openalex.org/S4363604758","display_name":"Optical Interference Coatings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optical Interference Coatings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009922242","display_name":"Cheng\u2010Chung Lee","orcid":"https://orcid.org/0000-0002-8259-4388","observed_orcids":["https://orcid.org/0000-0002-8259-4388"]},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Chung Lee","raw_affiliation_strings":["Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068385330","display_name":"Chien-Jen Tang","orcid":"https://orcid.org/0000-0002-4448-6546","observed_orcids":["https://orcid.org/0000-0002-4448-6546"]},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Jen Tang","raw_affiliation_strings":["Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081131923","display_name":"Jin\u2013Cherng Hsu","orcid":"https://orcid.org/0000-0002-4494-7947","observed_orcids":["https://orcid.org/0000-0002-4494-7947"]},"institutions":[{"id":"https://openalex.org/I114150738","display_name":"Fu Jen Catholic University","ror":"https://ror.org/04je98850","country_code":"TW","type":"education","lineage":["https://openalex.org/I114150738"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jin-Cherng Hsu","raw_affiliation_strings":["Department of Physics, Fu-Jen Catholic University, Taipei, Taiwan (242)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Fu-Jen Catholic University, Taipei, Taiwan (242)","institution_ids":["https://openalex.org/I114150738"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010354749","display_name":"Jean-Yee Wu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jean-Yee Wu","raw_affiliation_strings":["Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thin Film Technology Center, National Central University, Chung-Li, Taiwan (320)","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.8758,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.88888889,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"ThD10","last_page":"ThD10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rugate-filters","display_name":"rugate filters","score":0.9079999923706055},{"id":"https://openalex.org/keywords/composite-thin-films","display_name":"composite thin films","score":0.8119999766349792},{"id":"https://openalex.org/keywords/refractive-index-modulation","display_name":"refractive index modulation","score":0.6570000052452087},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.8510000109672546}],"concepts":[{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.8297046422958374},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8004847764968872},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6492303013801575},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.5651747584342957},{"id":"https://openalex.org/C50774322","wikidata":"https://www.wikidata.org/wiki/Q644248","display_name":"Ion beam","level":3,"score":0.5583218336105347},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.5286746025085449},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5274372696876526},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5095844268798828},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.49079522490501404},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.46669772267341614},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4500848650932312},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.44252097606658936},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.4366598129272461},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43384093046188354},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4114701747894287},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14647790789604187},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.081877201795578},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.07794257998466492},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06618040800094604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.046476155519485474},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1364/oic.2004.thd10","doi":"https://doi.org/10.1364/oic.2004.thd10","is_oa":false,"landing_page_url":"https://doi.org/10.1364/oic.2004.thd10","pdf_url":null,"source":{"id":"https://openalex.org/S4363604758","display_name":"Optical Interference Coatings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optical Interference Coatings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2151315377","https://openalex.org/W2035075368","https://openalex.org/W2117236867","https://openalex.org/W1516775983","https://openalex.org/W2089307451","https://openalex.org/W2049100396","https://openalex.org/W4321517140","https://openalex.org/W2385815134","https://openalex.org/W2315635225","https://openalex.org/W622755984"],"abstract_inverted_index":{"Composite":[0],"film":[1],"of":[2],"Ta":[3],"-Si":[4],"oxide":[5],"with":[6],"refractive":[7],"indices":[8],"varied":[9],"from":[10],"1.48":[11],"to":[12],"2.15":[13],"has":[14],"been":[15],"realized":[16],"by":[17],"using":[18],"RF":[19],"ion":[20],"beam":[21],"sputtering.":[22],"Film":[23],"surface":[24],"roughness":[25],"was":[26,34],"less":[27],"than":[28],"0.3nm":[29],"and":[30],"a":[31],"rugate":[32],"filter":[33],"fabricated":[35]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}