{"id":"https://openalex.org/W2128673532","doi":"https://doi.org/10.1109/ciccas.1991.184443","title":"Automatic generation of functional test pattern for the SCHOLAR system","display_name":"Automatic generation of functional test pattern for the SCHOLAR system","publication_year":2002,"publication_date":"2002-12-09","ids":{"openalex":"https://openalex.org/W2128673532","doi":"https://doi.org/10.1109/ciccas.1991.184443","mag":"2128673532"},"language":"en","primary_location":{"id":"doi:10.1109/ciccas.1991.184443","doi":"https://doi.org/10.1109/ciccas.1991.184443","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ciccas.1991.184443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1991 International Conference on Circuits and Systems","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103546306","display_name":"M.W.T. Wong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Mike Wai-Tak Wong","raw_affiliation_strings":["Department of Electronic Engineering, Hong Kong Polytechnic Institute, Kowloon, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Hong Kong Polytechnic Institute, Kowloon, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015103291","display_name":"K.G. Nichols","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"K.G. Nichols","raw_affiliation_strings":["Department of Electronics and Computer Science, University of Southampton, Southampton, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Science, University of Southampton, Southampton, UK","institution_ids":["https://openalex.org/I43439940"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2007,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42860678,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"659","last_page":"662"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.005400000140070915,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"automatic test pattern generation","score":0.9399999976158142},{"id":"https://openalex.org/keywords/functional-testing","display_name":"functional testing","score":0.6029999852180481},{"id":"https://openalex.org/keywords/stuck-at-faults","display_name":"stuck-at faults","score":0.9459999799728394},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.6520000100135803},{"id":"https://openalex.org/keywords/hardware-overhead-reduction","display_name":"hardware overhead reduction","score":0.9210000038146973}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7688471078872681},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6997362971305847},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.6864149570465088},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6863478422164917},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6144540905952454},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5823019742965698},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.46739205718040466},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4604324698448181},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4545896649360657},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43506523966789246},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.4220591187477112},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.41592320799827576},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3983776569366455},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35733097791671753},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34176892042160034},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33809101581573486},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2116183340549469},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.19963690638542175},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1967657506465912},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1474076807498932},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13251149654388428},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.11873078346252441},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.11569344997406006},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11203634738922119},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ciccas.1991.184443","doi":"https://doi.org/10.1109/ciccas.1991.184443","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ciccas.1991.184443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1991 International Conference on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W52459088","https://openalex.org/W81000816","https://openalex.org/W179555369","https://openalex.org/W1980752348","https://openalex.org/W2034476614","https://openalex.org/W2043949919","https://openalex.org/W2063353399","https://openalex.org/W2066974842","https://openalex.org/W2075398866","https://openalex.org/W2118562464","https://openalex.org/W2313662940","https://openalex.org/W2331993796","https://openalex.org/W2737326966"],"related_works":["https://openalex.org/W2299048939","https://openalex.org/W2103273021","https://openalex.org/W1991077971","https://openalex.org/W2147893937","https://openalex.org/W2123774679","https://openalex.org/W2106412869","https://openalex.org/W2099876519","https://openalex.org/W1847652714","https://openalex.org/W1536392513","https://openalex.org/W1596088482"],"abstract_inverted_index":{"An":[0],"automatic":[1,74],"functional":[2],"test":[3,68],"pattern":[4,69],"generation":[5,70],"method":[6,22,41],"for":[7],"the":[8,13,26,32,49,67,76],"control":[9],"path":[10,28],"generated":[11],"by":[12],"SCHOLAR":[14],"system":[15],"is":[16,23,65,72],"presented":[17],"in":[18,60],"this":[19,40],"paper.":[20],"The":[21,36],"based":[24],"on":[25],"scan":[27],"design":[29],"incorporated":[30],"with":[31],"input":[33,51],"partitioning":[34],"technique.":[35],"main":[37],"features":[38],"of":[39,48,78],"are:":[42],"(i)":[43],"a":[44,57,79],"guaranteed":[45],"100%":[46],"coverage":[47],"single":[50],"and":[52,55],"output":[53],"stuck-at-faults;":[54],"(ii)":[56],"substantial":[58],"reduction":[59],"hardware":[61],"overhead.":[62],"Another":[63],"novelty":[64],"that":[66],"step":[71],"completely":[73],"without":[75],"use":[77],"fault":[80],"simulator":[81],"or":[82],"any":[83],"commercial":[84],"ATPG":[85],"tools.>":[86]},"counts_by_year":[],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}