{"id":"https://openalex.org/W2125350867","doi":"https://doi.org/10.1109/imtc.2001.928792","title":"Approaches to evaluate the virtual instrumentation measurement uncertainties","display_name":"Approaches to evaluate the virtual instrumentation measurement uncertainties","publication_year":2002,"publication_date":"2002-11-13","ids":{"openalex":"https://openalex.org/W2125350867","doi":"https://doi.org/10.1109/imtc.2001.928792","mag":"2125350867"},"language":"en","primary_location":{"id":"doi:10.1109/imtc.2001.928792","doi":"https://doi.org/10.1109/imtc.2001.928792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imtc.2001.928792","pdf_url":null,"source":{"id":"https://openalex.org/S4210173101","display_name":"Conference proceedings - IEEE Instrumentation/Measurement Technology Conference","issn_l":"1091-5281","issn":["1091-5281"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023526899","display_name":"Salvatore Nuccio","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Nuccio","raw_affiliation_strings":["Dipartimento di Ingegneria Elettrica, Universit\u00e0 degli Studi di Palermo, Palermo, Italy","Dipartimento di Ingegneria Elettrica, Palermo Univ., Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Elettrica, Universit\u00e0 degli Studi di Palermo, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]},{"raw_affiliation_string":"Dipartimento di Ingegneria Elettrica, Palermo Univ., Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017502753","display_name":"Ciro Spataro","orcid":"https://orcid.org/0000-0002-6976-1786","observed_orcids":["https://orcid.org/0000-0002-6976-1786"]},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Spataro","raw_affiliation_strings":["Dipartimento di Ingegneria Elettrica, Universit\u00e0 degli Studi di Palermo, Palermo, Italy","[Dipartimento di Ingegneria Elettrica, Universit\u00e1 degli Studi di Palermo, Palermo, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Elettrica, Universit\u00e0 degli Studi di Palermo, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]},{"raw_affiliation_string":"[Dipartimento di Ingegneria Elettrica, Universit\u00e1 degli Studi di Palermo, Palermo, Italy]","institution_ids":["https://openalex.org/I900890020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I900890020"],"apc_list":null,"apc_paid":null,"fwci":2.5054,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.86466165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"1","issue":null,"first_page":"84","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9726999998092651,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9726999998092651,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.013100000098347664,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.008200000040233135,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/virtual-instrumentation","display_name":"virtual instrument","score":0.9340000152587891},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.9599999785423279},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"uncertainty analysis","score":0.8040000200271606},{"id":"https://openalex.org/keywords/sources-of-uncertainty","display_name":"uncertainty sources","score":0.6520000100135803},{"id":"https://openalex.org/keywords/analog-to-digital-conversion","display_name":"analog-to-digital conversion","score":0.7850000262260437},{"id":"https://openalex.org/keywords/error-propagation","display_name":"error propagation","score":0.8479999899864197},{"id":"https://openalex.org/keywords/guide-to-the-expression-of-uncertainty-in-measurement","display_name":"Guide to the Expression of Uncertainty in Measurement","score":0.9340000152587891},{"id":"https://openalex.org/keywords/metrological-characterization","display_name":"metrological characterization","score":0.8029999732971191}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.8521747589111328},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7676993608474731},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.7157952785491943},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.6511417031288147},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5852941870689392},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.531380832195282},{"id":"https://openalex.org/C2994224358","wikidata":"https://www.wikidata.org/wiki/Q13649246","display_name":"Standard uncertainty","level":3,"score":0.524699330329895},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.4667268991470337},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.4532155394554138},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4243074059486389},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28298115730285645},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.23567017912864685},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17696434259414673},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10361379384994507},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imtc.2001.928792","doi":"https://doi.org/10.1109/imtc.2001.928792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imtc.2001.928792","pdf_url":null,"source":{"id":"https://openalex.org/S4210173101","display_name":"Conference proceedings - IEEE Instrumentation/Measurement Technology Conference","issn_l":"1091-5281","issn":["1091-5281"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1809039703","https://openalex.org/W2041567145","https://openalex.org/W2123598838","https://openalex.org/W2123736966","https://openalex.org/W2134179788","https://openalex.org/W2135581323","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2041567145","https://openalex.org/W2135039424","https://openalex.org/W2051003869","https://openalex.org/W1809039703","https://openalex.org/W2988117322","https://openalex.org/W2135317950","https://openalex.org/W16673412","https://openalex.org/W2379324001","https://openalex.org/W2354972160","https://openalex.org/W1998175898"],"abstract_inverted_index":{"The":[0,100],"paper":[1],"deals":[2],"with":[3,111,119],"the":[4,15,17,20,24,27,38,41,50,54,63,68,71,80,85,92,106,112,120],"metrological":[5],"characterization":[6],"of":[7,14,23,40,53,67,73,84,105,125],"virtual":[8,25],"instruments.":[9],"After":[10],"a":[11,46],"brief":[12],"description":[13],"features,":[16],"constitution":[18],"and":[19,57,118],"working":[21],"principle":[22],"instruments,":[26],"various":[28],"uncertainty":[29,39,74,83,94],"sources":[30],"are":[31,44,109],"analyzed.":[32],"Then":[33],"two":[34],"methods":[35],"to":[36,70],"evaluate":[37],"measurement":[42,86],"results":[43,101],"presented:":[45],"numerical":[47,116],"method":[48,61],"simulating":[49],"physical":[51],"process":[52],"A/D":[55],"conversion,":[56],"an":[58],"approximated":[59],"theoretical":[60,107],"applying":[62],"\"uncertainty":[64],"propagation":[65],"law\"":[66],"\"guide":[69],"expression":[72],"in":[75],"measurement\".":[76],"With":[77],"both":[78],"methods,":[79],"combined":[81],"standard":[82,93],"result":[87],"is":[88],"obtained":[89,102,114,122],"starting":[90],"from":[91,115],"generated":[95],"by":[96,103,123],"each":[97],"single":[98],"source.":[99],"means":[104,124],"analysis":[108],"compared":[110],"ones":[113,121],"simulation":[117],"experimental":[126],"tests.":[127]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}