{"id":"https://openalex.org/W2124550002","doi":"https://doi.org/10.1016/0022-0248(78)90478-5","title":"The effect of electron irradiation on electrophysical properties of CdS, CdSe and ZnTe thin films","display_name":"The effect of electron irradiation on electrophysical properties of CdS, CdSe and ZnTe thin films","publication_year":1978,"publication_date":"1978-12-01","ids":{"openalex":"https://openalex.org/W2124550002","doi":"https://doi.org/10.1016/0022-0248(78)90478-5","mag":"2124550002"},"language":"en","primary_location":{"id":"doi:10.1016/0022-0248(78)90478-5","doi":"https://doi.org/10.1016/0022-0248(78)90478-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-0248(78)90478-5","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039749081","display_name":"Ioan Spanulescu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I141595442","display_name":"University of Bucharest","ror":"https://ror.org/02x2v6p15","country_code":"RO","type":"education","lineage":["https://openalex.org/I141595442"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"I. Sp\u00e2nulescu","raw_affiliation_strings":["Faculty of Physics, University of Bucharest, Bucharest, Romania"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Physics, University of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I141595442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042417679","display_name":"N. B\u01cel\u0163\u01ce\u0163eanu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. B\u01celt\u01ceteanu","raw_affiliation_strings":["Central Institute of Physics, IFTAR, Bucharest, Romania"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Institute of Physics, IFTAR, Bucharest, Romania","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032405526","display_name":"V. Ruxandra","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I141595442","display_name":"University of Bucharest","ror":"https://ror.org/02x2v6p15","country_code":"RO","type":"education","lineage":["https://openalex.org/I141595442"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"V. Ruxandra","raw_affiliation_strings":["Faculty of Physics, University of Bucharest, Bucharest, Romania"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Physics, University of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I141595442"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3110,"currency":"USD","value_usd":3110},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.32525154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"45","issue":null,"first_page":"471","last_page":"475"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.8320000171661377,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.8320000171661377,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.07249999791383743,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.07029999792575836,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-irradiation","display_name":"electron irradiation","score":0.9980000257492065},{"id":"https://openalex.org/keywords/cds-thin-films","display_name":"CdS thin films","score":0.9259999990463257},{"id":"https://openalex.org/keywords/cdse-thin-films","display_name":"CdSe thin films","score":1.0},{"id":"https://openalex.org/keywords/znte-thin-films","display_name":"ZnTe thin films","score":1.0},{"id":"https://openalex.org/keywords/electrophysical-properties","display_name":"electrophysical properties","score":0.9739999771118164},{"id":"https://openalex.org/keywords/radiation-dose","display_name":"radiation dose","score":0.7820000052452087}],"concepts":[{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.834417462348938},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7108134031295776},{"id":"https://openalex.org/C105163801","wikidata":"https://www.wikidata.org/wiki/Q12103748","display_name":"Electron beam processing","level":3,"score":0.6833340525627136},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.627620279788971},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.5728242993354797},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5537015795707703},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.448182612657547},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.23248842358589172},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06777021288871765},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0022-0248(78)90478-5","doi":"https://doi.org/10.1016/0022-0248(78)90478-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-0248(78)90478-5","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2011790938","https://openalex.org/W2042272440","https://openalex.org/W2045960804","https://openalex.org/W2098138191","https://openalex.org/W2150156930","https://openalex.org/W2321164358"],"related_works":["https://openalex.org/W2321164358","https://openalex.org/W2153617785","https://openalex.org/W2045960804","https://openalex.org/W3202127245","https://openalex.org/W2127378969","https://openalex.org/W7096726508","https://openalex.org/W1993412324","https://openalex.org/W7097090767","https://openalex.org/W1992572745","https://openalex.org/W2086122929"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}