{"id":"https://openalex.org/W2124407221","doi":"https://doi.org/10.1109/test.2000.894202","title":"The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core","display_name":"The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core","publication_year":2002,"publication_date":"2002-11-08","ids":{"openalex":"https://openalex.org/W2124407221","doi":"https://doi.org/10.1109/test.2000.894202","mag":"2124407221"},"language":"en","primary_location":{"id":"doi:10.1109/test.2000.894202","doi":"https://doi.org/10.1109/test.2000.894202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2000.894202","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017501220","display_name":"Teresa McLaurin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.L. McLaurin","raw_affiliation_strings":["Motorola, Austin, TX, USA","Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]},{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004297758","display_name":"Frank Frederick","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Frederick","raw_affiliation_strings":["Motorola, Austin, TX, USA","Motorola"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]},{"raw_affiliation_string":"Motorola","institution_ids":["https://openalex.org/I1333370159"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1333370159"],"apc_list":null,"apc_paid":null,"fwci":1.8059,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.85207869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"151","last_page":"159"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-testability","display_name":"design for testability","score":0.9399999976158142}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8270958662033081},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.7437262535095215},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.5888930559158325},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5750464797019958},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3613724708557129},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.21096846461296082},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19303235411643982},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14641231298446655}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2000.894202","doi":"https://doi.org/10.1109/test.2000.894202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2000.894202","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1797310821","https://openalex.org/W2101763384"],"related_works":["https://openalex.org/W7096115459","https://openalex.org/W1797310821","https://openalex.org/W2143003208","https://openalex.org/W2063551961","https://openalex.org/W1915537987","https://openalex.org/W2122241287","https://openalex.org/W2105809177","https://openalex.org/W4231794298","https://openalex.org/W2043631376","https://openalex.org/W1759203973"],"abstract_inverted_index":{"The":[0,26,65,79],"DFT":[1,80],"and":[2,6,63,82,94,106],"Test":[3],"challenges":[4,81,90,97],"faced,":[5],"the":[7,11,15,19,29,33,70,89,96,99,102],"solutions":[8,83],"applied,":[9],"to":[10,35,40,58],"newest":[12],"member":[13,31],"of":[14,32,69,98],"ColdFire(R)":[16],"microprocessor":[17,67],"family,":[18],"MCF5407,":[20],"are":[21,92],"described":[22,84],"in":[23,52,85],"this":[24,86],"paper.":[25],"MCF5407":[27,71],"is":[28],"first":[30],"family":[34],"utilize":[36],"a":[37,75],"PLL-sourced":[38,46],"clock":[39,48,104],"do":[41],"at-speed":[42],"launch-to-capture":[43],"cycles.":[44],"This":[45],"test":[47],"can":[49],"be":[50],"\"chopped\"":[51],"any":[53],"manner":[54],"needed":[55],"for":[56],"core":[57,68],"asic":[59],"ratios":[60],"between":[61],"4:1":[62],"1:1.":[64],"internal":[66],"was":[72],"designed":[73],"as":[74],"separate":[76],"stand-alone":[77],"core.":[78],"paper":[87],"involve":[88],"that":[91],"above":[93],"beyond":[95],"MCF5307;":[100],"including":[101],"PLL":[103,108],"chop":[105],"enhanced":[107],"scan":[109],"testing.":[110]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}