{"id":"https://openalex.org/W2123909166","doi":"https://doi.org/10.1109/icsm.2015.7332495","title":"An empirical evaluation of the effectiveness of inspection scenarios developed from a defect repository","display_name":"An empirical evaluation of the effectiveness of inspection scenarios developed from a defect repository","publication_year":2015,"publication_date":"2015-09-01","ids":{"openalex":"https://openalex.org/W2123909166","doi":"https://doi.org/10.1109/icsm.2015.7332495","mag":"2123909166"},"language":"en","primary_location":{"id":"doi:10.1109/icsm.2015.7332495","doi":"https://doi.org/10.1109/icsm.2015.7332495","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsm.2015.7332495","pdf_url":null,"source":{"id":"https://openalex.org/S4210174939","display_name":"IEEE International Conference on Software Maintenance (ICSM)","issn_l":"1063-6773","issn":["1063-6773","2576-3148"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Software Maintenance and Evolution (ICSME)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025010830","display_name":"Kiyotaka Kasubuchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210095113","display_name":"SCREEN (Japan)","ror":"https://ror.org/00p4am161","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210095113"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiyotaka Kasubuchi","raw_affiliation_strings":["Research and Development Center, SCREEN Holdings Co, LTD, Fushimi, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research and Development Center, SCREEN Holdings Co, LTD, Fushimi, Kyoto, Japan","institution_ids":["https://openalex.org/I4210095113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021446360","display_name":"Shuji Morisaki","orcid":"https://orcid.org/0000-0002-8290-0584","observed_orcids":["https://orcid.org/0000-0002-8290-0584"]},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuji Morisaki","raw_affiliation_strings":["Graduate School of Information Science, Nagoya University, Nagoya, Aichi, Japan","Graduate School of Information Science, Nagoya University, Aichi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science, Nagoya University, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I60134161"]},{"raw_affiliation_string":"Graduate School of Information Science, Nagoya University, Aichi, Japan","institution_ids":["https://openalex.org/I60134161"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102285795","display_name":"Akiko Yoshida","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210095113","display_name":"SCREEN (Japan)","ror":"https://ror.org/00p4am161","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210095113"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akiko Yoshida","raw_affiliation_strings":["Research and Development Center, SCREEN Holdings Co, LTD, Fushimi, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research and Development Center, SCREEN Holdings Co, LTD, Fushimi, Kyoto, Japan","institution_ids":["https://openalex.org/I4210095113"]}]},{"author_position":"last","author":{"id":null,"display_name":"Chikako Ogawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Chikako Ogawa","raw_affiliation_strings":["Faculty of Informatics, Shizuoka University Johoku, Hamamatsu, Shizuoka, Japan","Faculty of Informatics, Shizuoka University, Johoku, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Informatics, Shizuoka University Johoku, Hamamatsu, Shizuoka, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"Faculty of Informatics, Shizuoka University, Johoku, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4941,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.59178055,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"49","issue":null,"first_page":"439","last_page":"448"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10430","display_name":"Software Engineering Techniques and Practices","score":0.7958999872207642,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10430","display_name":"Software Engineering Techniques and Practices","score":0.7958999872207642,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.19750000536441803,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-maintenance","display_name":"software maintenance","score":0.531000018119812},{"id":"https://openalex.org/keywords/software-evolution","display_name":"software evolution","score":0.7350000143051147},{"id":"https://openalex.org/keywords/defect-clusters","display_name":"defect clusters","score":0.5189999938011169},{"id":"https://openalex.org/keywords/industrial-software","display_name":"industrial software","score":0.47200000286102295}],"concepts":[{"id":"https://openalex.org/C2779356329","wikidata":"https://www.wikidata.org/wiki/Q922625","display_name":"Checklist","level":2,"score":0.6883628368377686},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6683308482170105},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5796416401863098},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.5594996809959412},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5456779599189758},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.5440608263015747},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5245756506919861},{"id":"https://openalex.org/C10272871","wikidata":"https://www.wikidata.org/wiki/Q929972","display_name":"Software inspection","level":5,"score":0.4971766769886017},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3959646224975586},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23185956478118896},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.22847843170166016},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.22185951471328735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1609649658203125},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.06742727756500244},{"id":"https://openalex.org/C180747234","wikidata":"https://www.wikidata.org/wiki/Q23373","display_name":"Cognitive psychology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsm.2015.7332495","doi":"https://doi.org/10.1109/icsm.2015.7332495","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsm.2015.7332495","pdf_url":null,"source":{"id":"https://openalex.org/S4210174939","display_name":"IEEE International Conference on Software Maintenance (ICSM)","issn_l":"1063-6773","issn":["1063-6773","2576-3148"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Software Maintenance and Evolution (ICSME)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1596531629","https://openalex.org/W1938735317","https://openalex.org/W1994747250","https://openalex.org/W1996333597","https://openalex.org/W2016381774","https://openalex.org/W2019692058","https://openalex.org/W2027818939","https://openalex.org/W2098673848","https://openalex.org/W2101623483","https://openalex.org/W2103508990","https://openalex.org/W2123402141","https://openalex.org/W2127323731","https://openalex.org/W2154436398","https://openalex.org/W2157657084","https://openalex.org/W2161407365","https://openalex.org/W2755369767","https://openalex.org/W4233777510"],"related_works":["https://openalex.org/W1563960834","https://openalex.org/W2084076735","https://openalex.org/W2763259005","https://openalex.org/W2035730637","https://openalex.org/W3083152372","https://openalex.org/W2103720965","https://openalex.org/W4243528123","https://openalex.org/W1559031950","https://openalex.org/W150845528","https://openalex.org/W2010136639"],"abstract_inverted_index":{"Abstracting":[0],"and":[1,25,61,81,90,201,208],"summarizing":[2,91,209],"high-severity":[3,59,69,109,171],"defects":[4,34,49,93,110,172,200],"detected":[5,35,118],"during":[6,42],"inspections":[7,40],"of":[8,32,45,73,100,107,149,162,206],"previous":[9],"software":[10,23],"versions":[11],"could":[12,115],"lead":[13],"to":[14,146,158],"effective":[15],"inspection":[16,84,122,129,151,166],"scenarios":[17,85,130,152],"in":[18,22,94,111,138,173,203],"a":[19,63,184,195],"subsequent":[20],"version":[21,114,176],"maintenance":[24],"evolution.":[26],"We":[27],"conducted":[28,41],"an":[29,53],"empirical":[30],"evaluation":[31,75,102],"456":[33],"from":[36,52,62],"the":[37,43,74,95,101,108,112,120,135,139,150,154,160,169,174,204],"requirement":[38],"specification":[39],"development":[44],"industrial":[46],"software.":[47],"The":[48,71,98,124,187],"were":[50,86,177],"collected":[51],"earlier":[54,96,175],"version,":[55,65],"which":[56,66,128],"included":[57,67],"59":[58,170],"defects,":[60],"later":[64,113],"48":[68],"defects.":[70,210],"results":[72,99,188],"showed":[76,104],"that":[77,105,190],"nine":[78],"defect":[79,181],"types":[80],"their":[82],"corresponding":[83],"obtained":[87,121,133],"by":[88,134,183],"abstracting":[89,207],"45":[92],"version.":[97],"also":[103,126],"46":[106],"be":[116,132,194],"potentially":[117],"using":[119,153],"scenarios.":[123],"study":[125],"investigated":[127],"can":[131,193],"checklist":[136],"proposed":[137],"value-based":[140],"review":[141],"(VBR).":[142],"It":[143],"was":[144],"difficult":[145],"obtain":[147],"five":[148],"VBR":[155],"checklist.":[156],"Furthermore,":[157],"investigate":[159],"effectiveness":[161],"cluster":[163,191],"analysis":[164,192],"for":[165,197],"scenario":[167],"development,":[168],"clustered":[178],"into":[179],"similar":[180,199],"groups":[182],"clustering":[185],"algorithm.":[186],"indicated":[189],"guide":[196],"selecting":[198],"help":[202],"tasks":[205]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}