{"id":"https://openalex.org/W2122007142","doi":"https://doi.org/10.3762/bjnano.3.58","title":"Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism","display_name":"Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism","publication_year":2012,"publication_date":"2012-07-12","ids":{"openalex":"https://openalex.org/W2122007142","doi":"https://doi.org/10.3762/bjnano.3.58","mag":"2122007142","pmid":"https://pubmed.ncbi.nlm.nih.gov/23019545","pmcid":"https://www.ncbi.nlm.nih.gov/pmc/articles/3458595"},"language":"en","primary_location":{"id":"doi:10.3762/bjnano.3.58","doi":"https://doi.org/10.3762/bjnano.3.58","is_oa":true,"landing_page_url":"https://doi.org/10.3762/bjnano.3.58","pdf_url":"https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-3-58.pdf","source":{"id":"https://openalex.org/S2504426957","display_name":"Beilstein Journal of Nanotechnology","issn_l":"2190-4286","issn":["2190-4286"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","ddh","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320289","host_organization_name":"Beilstein Institute for the Advancement of Chemical Sciences","host_organization_lineage":["https://openalex.org/P4310320289"],"host_organization_lineage_names":["Beilstein Institute for the Advancement of Chemical Sciences"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Beilstein Journal of Nanotechnology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-3-58.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016012996","display_name":"Gregor Hlawacek","orcid":"https://orcid.org/0000-0001-7192-716X","observed_orcids":["https://orcid.org/0000-0001-7192-716X"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Gregor Hlawacek","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, PO Box 217, 7500AE Enschede, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, PO Box 217, 7500AE Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061380692","display_name":"Vasilisa Veligura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Vasilisa Veligura","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","Physics of Interfaces and Nanomaterials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003565497","display_name":"Stefan Lorbek","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I182712176","display_name":"Montanuniversit\u00e4t Leoben","ror":"https://ror.org/02fhfw393","country_code":"AT","type":"education","lineage":["https://openalex.org/I182712176"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Stefan Lorbek","raw_affiliation_strings":["Institute for Physics, Montanuniversitaet Leoben, Franz Josef Stra\u00dfe 18, 8700 Leoben, Austria and"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Physics, Montanuniversitaet Leoben, Franz Josef Stra\u00dfe 18, 8700 Leoben, Austria and","institution_ids":["https://openalex.org/I182712176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080091957","display_name":"Tijs F. Mocking","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Tijs F Mocking","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","Physics of Interfaces and Nanomaterials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034874793","display_name":"Antony George","orcid":"https://orcid.org/0000-0002-9317-5920","observed_orcids":["https://orcid.org/0000-0002-9317-5920"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Antony George","raw_affiliation_strings":["Inorganic Material Science , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands","Inorganic Materials Science"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inorganic Material Science , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Inorganic Materials Science","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031979730","display_name":"Raoul van Gastel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Raoul van Gastel","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","Physics of Interfaces and Nanomaterials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071871756","display_name":"Harold J. W. Zandvliet","orcid":"https://orcid.org/0000-0001-6809-139X","observed_orcids":["https://orcid.org/0000-0001-6809-139X"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Harold J W Zandvliet","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","Physics of Interfaces and Nanomaterials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034918357","display_name":"Bene Poelsema","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Bene Poelsema","raw_affiliation_strings":["Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","Physics of Interfaces and Nanomaterials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials , MESA+ Institute for Nanotechnology , University of Twente , PO Box 217 , 7500AE Enschede , The Netherlands,","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Physics of Interfaces and Nanomaterials","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5016012996"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":3.0965,"has_fulltext":true,"cited_by_count":40,"citation_normalized_percentile":{"value":0.92094197,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"3","issue":null,"first_page":"507","last_page":"512"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.0026000000070780516,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/helium-ion-microscopy","display_name":"helium ion microscopy","score":0.9990000128746033},{"id":"https://openalex.org/keywords/dechanneling","display_name":"dechanneling","score":0.8529999852180481},{"id":"https://openalex.org/keywords/ultrathin-layers","display_name":"ultrathin layers","score":0.7020000219345093},{"id":"https://openalex.org/keywords/self-assembled-monolayers","display_name":"self-assembled monolayers","score":0.8989999890327454},{"id":"https://openalex.org/keywords/secondary-electron-imaging","display_name":"secondary electron imaging","score":0.6100000143051147},{"id":"https://openalex.org/keywords/vacuum-conditions","display_name":"vacuum environment","score":0.6679999828338623}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.729609489440918},{"id":"https://openalex.org/C34667332","wikidata":"https://www.wikidata.org/wiki/Q2582911","display_name":"Secondary electrons","level":3,"score":0.6834291815757751},{"id":"https://openalex.org/C197977467","wikidata":"https://www.wikidata.org/wiki/Q550608","display_name":"Field ion microscope","level":3,"score":0.5993090271949768},{"id":"https://openalex.org/C546029482","wikidata":"https://www.wikidata.org/wiki/Q560","display_name":"Helium","level":2,"score":0.5736734867095947},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5708785653114319},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5347007513046265},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5191880464553833},{"id":"https://openalex.org/C60056205","wikidata":"https://www.wikidata.org/wiki/Q691914","display_name":"Opacity","level":2,"score":0.4920641779899597},{"id":"https://openalex.org/C7070889","wikidata":"https://www.wikidata.org/wiki/Q902488","display_name":"Monolayer","level":2,"score":0.47478100657463074},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.45750877261161804},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.422049343585968},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4191424250602722},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4174646735191345},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3802846372127533},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.37525051832199097},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.32151639461517334},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.2969703674316406},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.2587861716747284},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.18252325057983398},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09797117114067078},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.3762/bjnano.3.58","doi":"https://doi.org/10.3762/bjnano.3.58","is_oa":true,"landing_page_url":"https://doi.org/10.3762/bjnano.3.58","pdf_url":"https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-3-58.pdf","source":{"id":"https://openalex.org/S2504426957","display_name":"Beilstein Journal of Nanotechnology","issn_l":"2190-4286","issn":["2190-4286"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","ddh","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320289","host_organization_name":"Beilstein Institute for the Advancement of Chemical Sciences","host_organization_lineage":["https://openalex.org/P4310320289"],"host_organization_lineage_names":["Beilstein Institute for the Advancement of Chemical Sciences"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Beilstein Journal of Nanotechnology","raw_type":"journal-article"},{"id":"pmh:oai:europepmc.org:2451246","doi":null,"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/3458595","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":null,"raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:3458595","doi":null,"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/3458595","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Beilstein J Nanotechnol","raw_type":"Text"},{"id":"pmid:23019545","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23019545","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Beilstein journal of nanotechnology","raw_type":"Journal Article"},{"id":"pmh:oai:ris.utwente.nl:openaire/6be85918-19de-4613-bf18-5941b6e12c6d","doi":null,"is_oa":true,"landing_page_url":"https://research.utwente.nl/files/6808248/Hlawacek2012.pdf","pdf_url":"https://ris.utwente.nl/ws/files/6808248/Hlawacek2012.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Hlawacek, G, Veligura, V, Lorbek, S, Mocking, T F, George, A, van Gastel, R, Zandvliet, H J W & Poelsema, B 2012, 'Imaging ultra thin layers with helium ion microscopy : Utilizing the channeling contrast mechanism', Beilstein journal of nanotechnology, vol. 3, pp. 507-512. https://doi.org/10.3762/bjnano.3.58","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:a3b31e7e10f94cecb5449810ff28f00a","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/a3b31e7e10f94cecb5449810ff28f00a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 507-512 (2012)","raw_type":"article"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/6be85918-19de-4613-bf18-5941b6e12c6d","doi":null,"is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/6be85918-19de-4613-bf18-5941b6e12c6d","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Beilstein journal of nanotechnology, 3, 507 - 512. Beilstein-Institut Zur Forderung der Chemischen Wissenschaften","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.3762/bjnano.3.58","doi":"https://doi.org/10.3762/bjnano.3.58","is_oa":true,"landing_page_url":"https://doi.org/10.3762/bjnano.3.58","pdf_url":"https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-3-58.pdf","source":{"id":"https://openalex.org/S2504426957","display_name":"Beilstein Journal of Nanotechnology","issn_l":"2190-4286","issn":["2190-4286"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","ddh","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320289","host_organization_name":"Beilstein Institute for the Advancement of Chemical Sciences","host_organization_lineage":["https://openalex.org/P4310320289"],"host_organization_lineage_names":["Beilstein Institute for the Advancement of Chemical Sciences"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Beilstein Journal of Nanotechnology","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321800","display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek","ror":"https://ror.org/04jsz6e67"},{"id":"https://openalex.org/F4320334893","display_name":"Stichting voor de Technische Wetenschappen","ror":"https://ror.org/057tq3593"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2122007142.pdf","grobid_xml":"https://content.openalex.org/works/W2122007142.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W112633697","https://openalex.org/W1975277375","https://openalex.org/W1978361229","https://openalex.org/W1984226418","https://openalex.org/W2037605760","https://openalex.org/W2038517613","https://openalex.org/W2050400552","https://openalex.org/W2053362173","https://openalex.org/W2055806502","https://openalex.org/W2061267700","https://openalex.org/W2077725761","https://openalex.org/W2085285825","https://openalex.org/W2091763976","https://openalex.org/W2102194605","https://openalex.org/W2113461137","https://openalex.org/W2149906092"],"related_works":["https://openalex.org/W3200325904","https://openalex.org/W2037880782","https://openalex.org/W2113461137","https://openalex.org/W2048126776","https://openalex.org/W57181613","https://openalex.org/W2527956483","https://openalex.org/W2943428115","https://openalex.org/W2038517613","https://openalex.org/W2670530532","https://openalex.org/W2073903362"],"abstract_inverted_index":{"BACKGROUND:":[0],"Helium":[1],"ion":[2,128],"microscopy":[3],"is":[4,41,108,147],"a":[5,30,88,138],"new":[6,31,139],"high-performance":[7],"alternative":[8],"to":[9,48],"classical":[10],"scanning":[11],"electron":[12,46],"microscopy.":[13],"It":[14],"provides":[15,137],"superior":[16],"resolution":[17],"and":[18,57],"high":[19,37],"surface":[20,38],"sensitivity":[21,39],"by":[22,72,133],"using":[23,96],"secondary":[24,45],"electrons.":[25],"RESULTS:":[26],"We":[27,52],"report":[28],"on":[29,68,83,92,160],"contrast":[32,106,140,146],"mechanism":[33,141],"that":[34,40,107],"extends":[35],"the":[36,75,101,105,111,121,152,167],"usually":[42],"achieved":[43],"in":[44,74,110,116,120],"images,":[47],"backscattered":[49],"helium":[50],"images.":[51],"demonstrate":[53],"how":[54],"thin":[55,135],"organic":[56],"inorganic":[58],"layers":[59,79,156],"as":[60,62],"well":[61,149],"self-assembled":[63],"monolayers":[64],"can":[65,113],"be":[66,114],"visualized":[67],"heavier":[69,161],"element":[70],"substrates":[71,85],"changes":[73,119],"backscatter":[76,93],"yield.":[77],"Thin":[78],"of":[80,100,118,127,154,157,169],"light":[81,158],"elements":[82,159],"heavy":[84],"should":[86],"have":[87],"negligible":[89],"direct":[90],"influence":[91],"yields.":[94],"However,":[95],"simple":[97],"geometric":[98],"calculations":[99],"opaque":[102],"crystal":[103],"fraction,":[104],"observed":[109],"images":[112],"interpreted":[115],"terms":[117],"channeling":[122,129],"probability.":[123],"CONCLUSION:":[124],"The":[125],"suppression":[126],"into":[130],"crystalline":[131],"matter":[132],"adsorbed":[134],"films":[136],"for":[142,151,173],"HIM.":[143],"This":[144],"dechanneling":[145],"particularly":[148],"suited":[150],"visualization":[153],"ultrathin":[155],"substrates.":[162],"Our":[163],"results":[164],"also":[165],"highlight":[166],"importance":[168],"proper":[170],"vacuum":[171],"conditions":[172],"channeling-based":[174],"experimental":[175],"methods.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}