{"id":"https://openalex.org/W2118686136","doi":"https://doi.org/10.1002/qre.1281","title":"Reliability\u2010Based Design Optimization Considering Probabilistic Degradation Behavior","display_name":"Reliability\u2010Based Design Optimization Considering Probabilistic Degradation Behavior","publication_year":2012,"publication_date":"2012-01-10","ids":{"openalex":"https://openalex.org/W2118686136","doi":"https://doi.org/10.1002/qre.1281","mag":"2118686136"},"language":"en","primary_location":{"id":"doi:10.1002/qre.1281","doi":"https://doi.org/10.1002/qre.1281","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.1281","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113109565","display_name":"Vijay Rathod","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I83205935","display_name":"Malaviya National Institute of Technology Jaipur","ror":"https://ror.org/0077k1j32","country_code":"IN","type":"education","lineage":["https://openalex.org/I83205935"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vijay Rathod","raw_affiliation_strings":["Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India","institution_ids":["https://openalex.org/I83205935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100746946","display_name":"Om Prakash Yadav","orcid":"https://orcid.org/0000-0002-7330-4887","observed_orcids":["https://orcid.org/0000-0002-7330-4887"]},"institutions":[{"id":"https://openalex.org/I57328836","display_name":"North Dakota State University","ror":"https://ror.org/05h1bnb22","country_code":"US","type":"education","lineage":["https://openalex.org/I57328836"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Om Prakash Yadav","raw_affiliation_strings":["Department of Industrial and Manufacturing Engineering, North Dakota State University, Fargo, ND-58105 USA","Om Prakash Yadav, Department of Industrial and Manufacturing Engineering, North Dakota State University, Fargo, ND-58105, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Manufacturing Engineering, North Dakota State University, Fargo, ND-58105 USA","institution_ids":["https://openalex.org/I57328836"]},{"raw_affiliation_string":"Om Prakash Yadav, Department of Industrial and Manufacturing Engineering, North Dakota State University, Fargo, ND-58105, USA","institution_ids":["https://openalex.org/I57328836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067981803","display_name":"Ajay Pal Singh Rathore","orcid":"https://orcid.org/0000-0002-0530-1086","observed_orcids":["https://orcid.org/0000-0002-0530-1086"]},"institutions":[{"id":"https://openalex.org/I83205935","display_name":"Malaviya National Institute of Technology Jaipur","ror":"https://ror.org/0077k1j32","country_code":"IN","type":"education","lineage":["https://openalex.org/I83205935"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ajay Rathore","raw_affiliation_strings":["Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India","institution_ids":["https://openalex.org/I83205935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022950177","display_name":"Rakesh Jain","orcid":"https://orcid.org/0000-0001-6961-5757","observed_orcids":["https://orcid.org/0000-0001-6961-5757"]},"institutions":[{"id":"https://openalex.org/I83205935","display_name":"Malaviya National Institute of Technology Jaipur","ror":"https://ror.org/0077k1j32","country_code":"IN","type":"education","lineage":["https://openalex.org/I83205935"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rakesh Jain","raw_affiliation_strings":["Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Malaviya National Institute of Technology, Jaipur, 302017 India","institution_ids":["https://openalex.org/I83205935"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100746946"],"corresponding_institution_ids":["https://openalex.org/I57328836"],"apc_list":{"value":4550,"currency":"USD","value_usd":4550},"apc_paid":null,"fwci":2.1888,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.88931354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"28","issue":"8","first_page":"911","last_page":"923"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.7226999998092651,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.7226999998092651,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.2506999969482422,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.011099999770522118,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-based-design-optimization","display_name":"reliability-based design optimization","score":0.9990000128746033},{"id":"https://openalex.org/keywords/fatigue-resistance","display_name":"fatigue resistance","score":0.9419999718666077},{"id":"https://openalex.org/keywords/damage-accumulation","display_name":"damage accumulation","score":0.7730000019073486},{"id":"https://openalex.org/keywords/nonstationary-stochastic-processes","display_name":"nonstationary stochastic processes","score":0.9259999990463257},{"id":"https://openalex.org/keywords/dynamic-reliability-model","display_name":"dynamic reliability model","score":0.8289999961853027},{"id":"https://openalex.org/keywords/stress-strength-interference-model","display_name":"stress-strength interference","score":0.9079999923706055},{"id":"https://openalex.org/keywords/time-dependent-degradation","display_name":"time-dependent degradation","score":0.6549999713897705},{"id":"https://openalex.org/keywords/early-design-stage","display_name":"preliminary design","score":0.7929999828338623}],"concepts":[{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.8175003528594971},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7993115782737732},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7416480779647827},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6234066486358643},{"id":"https://openalex.org/C154205457","wikidata":"https://www.wikidata.org/wiki/Q2148377","display_name":"Probabilistic design","level":3,"score":0.6004743576049805},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4306023120880127},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35231083631515503},{"id":"https://openalex.org/C34972735","wikidata":"https://www.wikidata.org/wiki/Q2920267","display_name":"Engineering design process","level":2,"score":0.2622212767601013},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07733491063117981},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/qre.1281","doi":"https://doi.org/10.1002/qre.1281","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.1281","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W91475952","https://openalex.org/W157653971","https://openalex.org/W1492999711","https://openalex.org/W1495049647","https://openalex.org/W1551971776","https://openalex.org/W1571883544","https://openalex.org/W1601605178","https://openalex.org/W1977399204","https://openalex.org/W1985471046","https://openalex.org/W1990495754","https://openalex.org/W1992629208","https://openalex.org/W1998585863","https://openalex.org/W2002994185","https://openalex.org/W2044563857","https://openalex.org/W2058748861","https://openalex.org/W2071661322","https://openalex.org/W2076215557","https://openalex.org/W2083225036","https://openalex.org/W2090749763","https://openalex.org/W2099391752","https://openalex.org/W2116816365","https://openalex.org/W2118283640","https://openalex.org/W2128881158","https://openalex.org/W2137332838","https://openalex.org/W2147920417","https://openalex.org/W2153810086","https://openalex.org/W2178011284","https://openalex.org/W2513180394","https://openalex.org/W2789952880","https://openalex.org/W2790092024","https://openalex.org/W3134875744","https://openalex.org/W4230317210","https://openalex.org/W4250066673","https://openalex.org/W4251692722","https://openalex.org/W4254905555"],"related_works":["https://openalex.org/W2071661322","https://openalex.org/W1970986145","https://openalex.org/W4389575868","https://openalex.org/W4402138460","https://openalex.org/W7001982548","https://openalex.org/W2409498671","https://openalex.org/W2597877065","https://openalex.org/W2230591893","https://openalex.org/W7074179416","https://openalex.org/W2410449869"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"a":[3,25,66],"reliability\u2010based":[4,60],"design":[5,61,88,93],"optimization":[6,62],"methodology":[7],"by":[8,64],"incorporating":[9],"probabilistic":[10,19,39,52],"degradation":[11,28,84],"in":[12,29],"the":[13,30,43,72,82,97,105],"fatigue":[14,31],"resistance":[15,32],"of":[16,27,33,47,100,104],"material.":[17],"The":[18,50,76,102],"damage":[20,48,53],"accumulation":[21,54],"is":[22,56,108],"treated":[23],"as":[24,37],"measure":[26],"material":[34],"and":[35],"modeled":[36],"nonstationary":[38],"process":[40],"to":[41,80,95],"capture":[42,81],"time\u2010dependent":[44],"distribution":[45],"parameters":[46],"accumulation.":[49],"proposed":[51,77,106],"model":[55,63,69],"then":[57],"incorporated":[58],"into":[59],"building":[65],"dynamic":[67,83],"reliability":[68,99],"inferred":[70],"from":[71],"stress\u2013strength":[73],"interference":[74],"model.":[75],"approach":[78,107],"facilitates":[79],"behavior":[85],"while":[86],"optimizing":[87],"variables":[89],"at":[90],"an":[91],"early":[92],"stage":[94],"improve":[96],"overall":[98],"product.":[101],"applicability":[103],"demonstrated":[109],"using":[110],"suitable":[111],"examples.":[112],"Copyright":[113],"\u00a9":[114],"2012":[115],"John":[116],"Wiley":[117],"&":[118],"Sons,":[119],"Ltd.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}