{"id":"https://openalex.org/W2117986531","doi":"https://doi.org/10.1109/imtc.2011.5944092","title":"Optical fiber sensors for high temperature harsh environment sensing","display_name":"Optical fiber sensors for high temperature harsh environment sensing","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2117986531","doi":"https://doi.org/10.1109/imtc.2011.5944092","mag":"2117986531"},"language":"en","primary_location":{"id":"doi:10.1109/imtc.2011.5944092","doi":"https://doi.org/10.1109/imtc.2011.5944092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imtc.2011.5944092","pdf_url":null,"source":{"id":"https://openalex.org/S4393918986","display_name":"IEEE International Instrumentation and Measurement Technology Conference","issn_l":"2642-2069","issn":["2642-2069"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Instrumentation and Measurement Technology Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062578450","display_name":"Tao Wei","orcid":"https://orcid.org/0000-0002-4765-1826","observed_orcids":["https://orcid.org/0000-0002-4765-1826"]},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tao Wei","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017455115","display_name":"Xinwei Lan","orcid":"https://orcid.org/0000-0002-2903-6045","observed_orcids":["https://orcid.org/0000-0002-2903-6045"]},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinwei Lan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008110714","display_name":"Hai Xiao","orcid":"https://orcid.org/0000-0003-1460-6241","observed_orcids":["https://orcid.org/0000-0003-1460-6241","https://orcid.org/0000-0001-7010-4102","https://orcid.org/0000-0001-9399-1584"]},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hai Xiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049593528","display_name":"Yukun Han","orcid":"https://orcid.org/0000-0001-8614-2648","observed_orcids":["https://orcid.org/0000-0001-8614-2648"]},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yukun Han","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016267607","display_name":"Hai-Lung Tsai","orcid":"https://orcid.org/0000-0003-0177-633X","observed_orcids":["https://orcid.org/0000-0003-0177-633X"]},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hai-Lung Tsai","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":0.868,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.71010786,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10846","display_name":"Photonic Crystal and Fiber Optics","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fiber-optic-sensors","display_name":"fiber optic sensors","score":0.9980000257492065},{"id":"https://openalex.org/keywords/harsh-environment-sensing","display_name":"harsh environment sensing","score":0.984000027179718},{"id":"https://openalex.org/keywords/high-temperature-sensing","display_name":"high-temperature sensing","score":0.9580000042915344},{"id":"https://openalex.org/keywords/fiber-optic-fabry-perot-interferometer","display_name":"fiber Fabry-Perot interferometer","score":0.9210000038146973},{"id":"https://openalex.org/keywords/femtosecond-laser-micromachining","display_name":"femtosecond laser micromachining","score":0.953000009059906},{"id":"https://openalex.org/keywords/long-period-fiber-grating","display_name":"long-period fiber grating","score":0.9950000047683716},{"id":"https://openalex.org/keywords/co2-laser-fabrication","display_name":"CO2 laser fabrication","score":0.8169999718666077},{"id":"https://openalex.org/keywords/high-pressure-sensing","display_name":"high-pressure sensing","score":0.6740000247955322}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.67498779296875},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.611173689365387},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.5315439701080322},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5132133960723877},{"id":"https://openalex.org/C36456112","wikidata":"https://www.wikidata.org/wiki/Q288064","display_name":"Cladding (metalworking)","level":2,"score":0.5083281397819519},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.49172571301460266},{"id":"https://openalex.org/C167735695","wikidata":"https://www.wikidata.org/wiki/Q1777507","display_name":"Femtosecond","level":3,"score":0.47315940260887146},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4512825906276703},{"id":"https://openalex.org/C21651689","wikidata":"https://www.wikidata.org/wiki/Q1397427","display_name":"Fiber optic sensor","level":3,"score":0.4308586120605469},{"id":"https://openalex.org/C145667562","wikidata":"https://www.wikidata.org/wiki/Q7646003","display_name":"Surface micromachining","level":4,"score":0.4302446246147156},{"id":"https://openalex.org/C519885992","wikidata":"https://www.wikidata.org/wiki/Q161","display_name":"Fiber","level":2,"score":0.4086138904094696},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.40472546219825745},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32003074884414673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2528268098831177},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07571282982826233},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imtc.2011.5944092","doi":"https://doi.org/10.1109/imtc.2011.5944092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imtc.2011.5944092","pdf_url":null,"source":{"id":"https://openalex.org/S4393918986","display_name":"IEEE International Instrumentation and Measurement Technology Conference","issn_l":"2642-2069","issn":["2642-2069"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Instrumentation and Measurement Technology Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1981142597","https://openalex.org/W1985402846","https://openalex.org/W1991654666","https://openalex.org/W2093950400"],"related_works":["https://openalex.org/W2083932728","https://openalex.org/W2319365115","https://openalex.org/W1994502774","https://openalex.org/W2056208508","https://openalex.org/W2078004265","https://openalex.org/W2053550804","https://openalex.org/W7221034804","https://openalex.org/W4312852267","https://openalex.org/W2980723144","https://openalex.org/W2594059407"],"abstract_inverted_index":{"This":[0],"paper":[1,39],"summarizes":[2],"our":[3],"recent":[4],"research":[5],"progresses":[6],"in":[7,31,37,89],"developing":[8],"optical":[9],"fiber":[10,44,58,63],"harsh":[11,97],"environment":[12,98],"sensors":[13,35],"for":[14,81],"monitoring":[15],"the":[16],"operating":[17,75],"conditions":[18],"of":[19,27,83],"a":[20,41,55,62,90],"coal-fired":[21],"power":[22],"plant":[23],"and":[24,61,79,86,93],"in-situ":[25],"detection":[26],"key":[28],"gas":[29],"components":[30],"coal-derived":[32],"syngas.":[33],"The":[34],"described":[36],"this":[38],"include":[40],"miniaturized":[42],"inline":[43,64],"Fabry-Perot":[45],"interferometer":[46,67],"(FPI)":[47],"fabricated":[48,69],"by":[49,70],"one-step":[50],"femtosecond":[51],"(fs)":[52],"laser":[53],"micromachining,":[54],"long":[56],"period":[57],"grating":[59],"(LPFG)":[60],"core-cladding":[65],"mode":[66],"(CMMI)":[68],"controlled":[71],"CO2laser":[72],"irradiations.":[73],"Their":[74],"principles,":[76],"fabrication":[77],"methods,":[78],"applications":[80],"measurement":[82],"various":[84],"physical":[85],"chemical":[87],"parameters":[88],"high":[91,94],"temperature":[92],"pressure":[95],"coexisting":[96],"are":[99],"presented.":[100]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2016-06-24T00:00:00"}