{"id":"https://openalex.org/W2116309486","doi":"https://doi.org/10.1109/maes.2005.1453810","title":"Integrating VISA, IVI and ATEasy to migrate legacy test systems","display_name":"Integrating VISA, IVI and ATEasy to migrate legacy test systems","publication_year":2005,"publication_date":"2005-06-01","ids":{"openalex":"https://openalex.org/W2116309486","doi":"https://doi.org/10.1109/maes.2005.1453810","mag":"2116309486"},"language":"en","primary_location":{"id":"doi:10.1109/maes.2005.1453810","doi":"https://doi.org/10.1109/maes.2005.1453810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/maes.2005.1453810","pdf_url":null,"source":{"id":"https://openalex.org/S161080992","display_name":"IEEE Aerospace and Electronic Systems Magazine","issn_l":"0885-8985","issn":["0885-8985","1557-959X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Aerospace and Electronic Systems Magazine","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022077187","display_name":"Loofie Gutterman","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"L. Gutterman","raw_affiliation_strings":["Geotest-Marvin Test Systems, Inc., USA","Geotest-Marvin Test Syst., Inc., Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Geotest-Marvin Test Systems, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Geotest-Marvin Test Syst., Inc., Irvine, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5022077187"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7958,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.87751683,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"20","issue":"6","first_page":"36","last_page":"38"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.06289999932050705,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.01600000075995922,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visa","display_name":"Visa","score":0.8519999980926514},{"id":"https://openalex.org/keywords/pxi","display_name":"PXI","score":0.7519999742507935},{"id":"https://openalex.org/keywords/vxi","display_name":"VXI","score":0.8799999952316284},{"id":"https://openalex.org/keywords/gpib","display_name":"GPIB","score":0.9929999709129333},{"id":"https://openalex.org/keywords/instrument-drivers","display_name":"instrument drivers","score":0.972000002861023}],"concepts":[{"id":"https://openalex.org/C156431368","wikidata":"https://www.wikidata.org/wiki/Q6041813","display_name":"Instrument Driver","level":4,"score":0.6679980158805847},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.6359864473342896},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.6250700950622559},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.6157175898551941},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6095897555351257},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.49773886799812317},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.49002134799957275},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.47965767979621887},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46622776985168457},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42848819494247437},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.426258385181427},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4035411477088928},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3668820858001709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2797745168209076},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2751304805278778},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1931222677230835},{"id":"https://openalex.org/C2989149083","wikidata":"https://www.wikidata.org/wiki/Q7935121","display_name":"Virtual instrument","level":3,"score":0.12245044112205505},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/maes.2005.1453810","doi":"https://doi.org/10.1109/maes.2005.1453810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/maes.2005.1453810","pdf_url":null,"source":{"id":"https://openalex.org/S161080992","display_name":"IEEE Aerospace and Electronic Systems Magazine","issn_l":"0885-8985","issn":["0885-8985","1557-959X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Aerospace and Electronic Systems Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8970999717712402,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2544318720","https://openalex.org/W2163173326","https://openalex.org/W1536523355","https://openalex.org/W1923180216","https://openalex.org/W1835873996","https://openalex.org/W1927764883","https://openalex.org/W2070452665","https://openalex.org/W2099202136","https://openalex.org/W1986510409","https://openalex.org/W2158330271"],"abstract_inverted_index":{"New":[0],"software":[1,65,81],"technologies,":[2,66],"such":[3,89],"as":[4,90],"VISA":[5,119,141],"and":[6,30,44,63,75,94,97,114,120,133,165,170],"IVI,":[7],"continue":[8],"to":[9,18,34,49,150],"bring":[10],"the":[11,19,27,35,47,50,59,103,117,128,134,140,147,155,161,167,179],"industry":[12],"toward":[13],"greater":[14],"standardization.":[15],"The":[16,32],"benefit":[17,33],"integrator":[20],"is":[21,38,136],"reduced":[22],"costs":[23,40],"through":[24,46],"reuse":[25],"of":[26,86,105,116,130,163],"same":[28],"hardware":[29],"software.":[31],"customer":[36],"end-user":[37],"lower":[39],"by":[41],"reducing":[42],"modification":[43],"support":[45,71,115],"life-cycle":[48],"test":[51,176],"station.":[52],"However,":[53],"while":[54,109],"we":[55,67,100],"position":[56],"ourselves":[57],"for":[58,72,111,143,173,178],"future":[60],"with":[61,154],"PXI":[62],"these":[64,106,152],"must":[68],"still":[69,137],"provide":[70],"VXI,":[73],"GPIB,":[74],"instrument":[76,171],"drivers":[77,132,172],"that":[78],"use":[79,151],"current":[80,156],"technologies.":[82,122],"Using":[83],"a":[84,174],"number":[85],"additional":[87],"tools":[88,107],"National":[91],"Instrument's":[92],"Measurement":[93],"Automation":[95],"Explorer":[96],"Geotest's":[98],"ATEasy,":[99],"can":[101],"have":[102],"power":[104],"today":[108],"waiting":[110],"wider":[112],"acceptance":[113],"newer":[118],"IVI":[121,131],"We":[123],"are":[124],"just":[125],"now":[126],"seeing":[127],"development":[129],"ink":[135],"wet":[138],"on":[139],"specification":[142],"PXI.":[144],"ATEasy":[145],"provided":[146],"structure":[148],"necessary":[149],"technologies":[153],"technology.":[157],"This":[158],"paper":[159],"explores":[160],"process":[162],"implementing":[164],"integrating":[166],"system":[168],"driver":[169],"PXI-based":[175],"station":[177],"TOW2":[180],"optical":[181],"sight":[182],"sensor.":[183]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-15T10:00:46.086208","created_date":"2016-06-24T00:00:00"}