{"id":"https://openalex.org/W2115586571","doi":"https://doi.org/10.1109/intmag.2005.1464062","title":"High frequency magnetic field detection by UHF carrier type thin film sensor","display_name":"High frequency magnetic field detection by UHF carrier type thin film sensor","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2115586571","doi":"https://doi.org/10.1109/intmag.2005.1464062","mag":"2115586571"},"language":"en","primary_location":{"id":"doi:10.1109/intmag.2005.1464062","doi":"https://doi.org/10.1109/intmag.2005.1464062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/intmag.2005.1464062","pdf_url":null,"source":{"id":"https://openalex.org/S4363607802","display_name":"IEEE International Magnetics Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108534806","display_name":"Kenji Tan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Tan","raw_affiliation_strings":["Akita Research Institute of Advanced Technology, Araya, Akita, Japan","Akita Res. Inst. of Adv. Technol., Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Akita Research Institute of Advanced Technology, Araya, Akita, Japan","institution_ids":[]},{"raw_affiliation_string":"Akita Res. Inst. of Adv. Technol., Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077884354","display_name":"Masahiro Yamaguchi","orcid":"https://orcid.org/0000-0002-3601-7619","observed_orcids":["https://orcid.org/0000-0002-3601-7619"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Yamaguchi","raw_affiliation_strings":["Akita Research Institute of Advanced Technology, Araya, Akita, Japan","ENG - Electrical Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Akita Research Institute of Advanced Technology, Araya, Akita, Japan","institution_ids":[]},{"raw_affiliation_string":"ENG - Electrical Engineering","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109281245","display_name":"K. Yamakawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Yamakawa","raw_affiliation_strings":["Department of Electrical and Communication Engineering, Graduate School of Engineering, University of Tohoku, Sendai, Japan","Akita Prefectural R&D Center, Akita Research Institute of Advanced Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Communication Engineering, Graduate School of Engineering, University of Tohoku, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Akita Prefectural R&D Center, Akita Research Institute of Advanced Technology","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28121969,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":null,"first_page":"1265","last_page":"1266"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.002300000051036477,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/giant-magnetoimpedance","display_name":"giant magnetoimpedance","score":0.8029999732971191},{"id":"https://openalex.org/keywords/rf-sputtering","display_name":"RF sputtering","score":0.9290000200271606},{"id":"https://openalex.org/keywords/thin-film-sensors","display_name":"thin film sensors","score":0.6700000166893005}],"concepts":[{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.8466935157775879},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7117315530776978},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6499202251434326},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.5914204716682434},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.5774008631706238},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5691301822662354},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5473485589027405},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5021247863769531},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.4546729028224945},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.35776492953300476},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3109452724456787},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12138819694519043},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09750142693519592},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07962381839752197},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/intmag.2005.1464062","doi":"https://doi.org/10.1109/intmag.2005.1464062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/intmag.2005.1464062","pdf_url":null,"source":{"id":"https://openalex.org/S4363607802","display_name":"IEEE International Magnetics Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1965039482","https://openalex.org/W2107426257","https://openalex.org/W2144936541","https://openalex.org/W2161180725","https://openalex.org/W2168425587"],"related_works":["https://openalex.org/W2140497126","https://openalex.org/W2020918562","https://openalex.org/W1979404680","https://openalex.org/W2041008194","https://openalex.org/W2116265453","https://openalex.org/W2125945288","https://openalex.org/W2091556826","https://openalex.org/W2147010553","https://openalex.org/W2068880605","https://openalex.org/W2110255659"],"abstract_inverted_index":{"The":[0,43],"detection":[1],"of":[2,13,56,69,74],"high":[3,76],"frequency":[4,77],"field":[5,64,73],"up":[6],"to":[7,37],"1":[8],"GHz":[9],"by":[10,49],"the":[11,39,62,70],"use":[12],"a":[14,31,53,81],"new":[15],"sensor":[16],"element,":[17,28],"used":[18],"for":[19,87],"highly":[20],"sensitive":[21],"giant":[22],"magneto-impedance":[23],"sensors,":[24,80],"was":[25,47,65],"discussed.":[26],"This":[27],"prepared":[29],"in":[30],"magnetic":[32],"multilayer":[33,46],"like":[34],"structure":[35],"functions":[36],"decrease":[38],"optimum":[40],"bias":[41,63],"field.":[42],"Ta[/NiFe/Cu]/sub":[44],"66//NiFe/Ta":[45],"deposited":[48],"RF":[50],"sputtering":[51],"with":[52],"total":[54],"thickness":[55],"1010":[57],"nm.":[58],"Results":[59],"show":[60],"that":[61,83],"only":[66],"one":[67],"tenth":[68],"theoretical":[71],"resonance":[72],"conventional":[75],"carrier":[78],"type":[79],"value":[82],"is":[84],"sufficiently":[85],"low":[86],"practical":[88],"use.":[89]},"counts_by_year":[],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2016-06-24T00:00:00"}