{"id":"https://openalex.org/W2115334376","doi":"https://doi.org/10.1016/j.tsf.2010.01.026","title":"High mobility top-gated poly(3-hexylthiophene) field-effect transistors with high work-function Pt electrodes","display_name":"High mobility top-gated poly(3-hexylthiophene) field-effect transistors with high work-function Pt electrodes","publication_year":2010,"publication_date":"2010-01-30","ids":{"openalex":"https://openalex.org/W2115334376","doi":"https://doi.org/10.1016/j.tsf.2010.01.026","mag":"2115334376"},"language":"en","primary_location":{"id":"doi:10.1016/j.tsf.2010.01.026","doi":"https://doi.org/10.1016/j.tsf.2010.01.026","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2010.01.026","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038974884","display_name":"Kang\u2010Jun Baeg","orcid":"https://orcid.org/0000-0001-7821-2458","observed_orcids":["https://orcid.org/0000-0001-7821-2458"]},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]},{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kang-Jun Baeg","raw_affiliation_strings":["Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","institution_ids":["https://openalex.org/I142401562"]},{"raw_affiliation_string":"Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071725303","display_name":"Dongyoon Khim","orcid":"https://orcid.org/0009-0003-1125-628X","observed_orcids":["https://orcid.org/0009-0003-1125-628X"]},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongyoon Khim","raw_affiliation_strings":["Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032149212","display_name":"Dong\u2010Yu Kim","orcid":"https://orcid.org/0000-0003-2874-0329","observed_orcids":["https://orcid.org/0000-0003-2874-0329"]},"institutions":[{"id":"https://openalex.org/I39534123","display_name":"Gwangju Institute of Science and Technology","ror":"https://ror.org/024kbgz78","country_code":"KR","type":"education","lineage":["https://openalex.org/I39534123"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Yu Kim","raw_affiliation_strings":["Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heeger Center for Advanced Materials, Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 261 Cheomdan-gwagiro (Oryong-dong), Buk-gu, Gwangju 500-712, Republic of Korea","institution_ids":["https://openalex.org/I39534123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108497765","display_name":"Jae Bon Koo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae Bon Koo","raw_affiliation_strings":["Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041059809","display_name":"In\u2010Kyu You","orcid":"https://orcid.org/0000-0001-8510-3540","observed_orcids":["https://orcid.org/0000-0001-8510-3540"]},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In-Kyu You","raw_affiliation_strings":["Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062173603","display_name":"Won San Choi","orcid":"https://orcid.org/0000-0003-4546-0732","observed_orcids":["https://orcid.org/0000-0003-4546-0732"]},"institutions":[{"id":"https://openalex.org/I4210139925","display_name":"Korea Basic Science Institute","ror":"https://ror.org/0417sdw47","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210139925","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Won San Choi","raw_affiliation_strings":["Korea Basic Science Institute (KBSI), 664-14 Dukjin dong 1-ga, Dukjin-gu, Jeonju, 561-756, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Basic Science Institute (KBSI), 664-14 Dukjin dong 1-ga, Dukjin-gu, Jeonju, 561-756, Republic of Korea","institution_ids":["https://openalex.org/I4210139925"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003984428","display_name":"Yong\u2010Young Noh","orcid":"https://orcid.org/0000-0001-7222-2401","observed_orcids":["https://orcid.org/0000-0001-7222-2401"]},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]},{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yong-Young Noh","raw_affiliation_strings":["Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","Department of Chemical Engineering, Hanbat National University, 16-1 Dukmyung-dong, Yuseong-gu, Daejeon, 305-719, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Convergence Components & Materials Laboratory, Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Republic of Korea","institution_ids":["https://openalex.org/I142401562"]},{"raw_affiliation_string":"Department of Chemical Engineering, Hanbat National University, 16-1 Dukmyung-dong, Yuseong-gu, Daejeon, 305-719, Republic of Korea","institution_ids":["https://openalex.org/I145808223"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5003984428"],"corresponding_institution_ids":["https://openalex.org/I142401562","https://openalex.org/I145808223"],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":4.7909,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.94937283,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"518","issue":"14","first_page":"4024","last_page":"4029"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10660","display_name":"Conducting polymers and applications","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/organic-field-effect-transistors","display_name":"organic field-effect transistors","score":0.9480000138282776},{"id":"https://openalex.org/keywords/poly-3-hexylthiophene","display_name":"poly(3-hexylthiophene)","score":0.9589999914169312},{"id":"https://openalex.org/keywords/top-gated-devices","display_name":"top-gated devices","score":0.7450000047683716},{"id":"https://openalex.org/keywords/platinum-electrode","display_name":"platinum electrode","score":0.8920000195503235},{"id":"https://openalex.org/keywords/work-function","display_name":"work function","score":0.7870000004768372},{"id":"https://openalex.org/keywords/charge-carrier-mobility","display_name":"carrier mobility","score":0.9539999961853027},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"contact resistance","score":0.9950000047683716},{"id":"https://openalex.org/keywords/current-crowding","display_name":"current crowding","score":0.8849999904632568},{"id":"https://openalex.org/keywords/device-stability","display_name":"device stability","score":0.6179999709129333},{"id":"https://openalex.org/keywords/charge-injection","display_name":"charge injection","score":0.4699999988079071}],"concepts":[{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.7236261963844299},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6844934821128845},{"id":"https://openalex.org/C115235246","wikidata":"https://www.wikidata.org/wiki/Q783800","display_name":"Work function","level":3,"score":0.6827096939086914},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6722726821899414},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.6577005386352539},{"id":"https://openalex.org/C46275449","wikidata":"https://www.wikidata.org/wiki/Q2458815","display_name":"Crystallinity","level":2,"score":0.6081593632698059},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5744653940200806},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5736821293830872},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.5026648044586182},{"id":"https://openalex.org/C94003879","wikidata":"https://www.wikidata.org/wiki/Q1933714","display_name":"Organic semiconductor","level":2,"score":0.4982719421386719},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.47227415442466736},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.46409931778907776},{"id":"https://openalex.org/C106782819","wikidata":"https://www.wikidata.org/wiki/Q6501076","display_name":"Electron mobility","level":2,"score":0.43670767545700073},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.27018243074417114},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.24506404995918274},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17069962620735168},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09067609906196594},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08494561910629272},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.06858733296394348},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.tsf.2010.01.026","doi":"https://doi.org/10.1016/j.tsf.2010.01.026","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2010.01.026","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322947","display_name":"Sichuan University of Science and Engineering","ror":"https://ror.org/053fzma23"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W264642757","https://openalex.org/W1952729929","https://openalex.org/W1967710197","https://openalex.org/W1972285345","https://openalex.org/W1980244507","https://openalex.org/W1986267773","https://openalex.org/W1991085160","https://openalex.org/W1996045678","https://openalex.org/W1997491611","https://openalex.org/W2005063586","https://openalex.org/W2010639876","https://openalex.org/W2014422756","https://openalex.org/W2015053750","https://openalex.org/W2026328800","https://openalex.org/W2028699847","https://openalex.org/W2031194509","https://openalex.org/W2035640327","https://openalex.org/W2046349634","https://openalex.org/W2046809297","https://openalex.org/W2056285691","https://openalex.org/W2059360566","https://openalex.org/W2068206759","https://openalex.org/W2071518930","https://openalex.org/W2071759462","https://openalex.org/W2076907143","https://openalex.org/W2086060234","https://openalex.org/W2095661431","https://openalex.org/W2112362639","https://openalex.org/W2116552702","https://openalex.org/W2126463270","https://openalex.org/W2142910748","https://openalex.org/W3022448274","https://openalex.org/W3147289055"],"related_works":["https://openalex.org/W1987324267","https://openalex.org/W2009353979","https://openalex.org/W1967128986","https://openalex.org/W1980101674","https://openalex.org/W2061871233","https://openalex.org/W2002996807","https://openalex.org/W2018268212","https://openalex.org/W2346225028","https://openalex.org/W2061854408","https://openalex.org/W2080129402"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":3}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}
