{"id":"https://openalex.org/W2114773166","doi":"https://doi.org/10.1109/tvlsi.2013.2255628","title":"Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress","display_name":"Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress","publication_year":2013,"publication_date":"2013-05-07","ids":{"openalex":"https://openalex.org/W2114773166","doi":"https://doi.org/10.1109/tvlsi.2013.2255628","mag":"2114773166"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2013.2255628","doi":"https://doi.org/10.1109/tvlsi.2013.2255628","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2255628","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-b","cwts-core","dongbi-c","jufo-2","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078252690","display_name":"Hyo-Young Shin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyoyoung Shin","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100724134","display_name":"Young\u2010Kyu Park","orcid":"https://orcid.org/0000-0003-4831-217X","observed_orcids":["https://orcid.org/0000-0003-4831-217X"]},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngkyu Park","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064749295","display_name":"Gihwa Lee","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gihwa Lee","raw_affiliation_strings":["Manufacturing Division, Hynix Semiconductor, Inc., Ichon-si, Gyounggi-do, Korea","Manuf. Div., Hynix Semicond., Inc., Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing Division, Hynix Semiconductor, Inc., Ichon-si, Gyounggi-do, Korea","institution_ids":[]},{"raw_affiliation_string":"Manuf. Div., Hynix Semicond., Inc., Icheon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jungsik Park","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jungsik Park","raw_affiliation_strings":["Manufacturing Division, Hynix Semiconductor, Inc., Ichon-si, Gyounggi-do, Korea","Manuf. Div., Hynix Semicond., Inc., Icheon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing Division, Hynix Semiconductor, Inc., Ichon-si, Gyounggi-do, Korea","institution_ids":[]},{"raw_affiliation_string":"Manuf. Div., Hynix Semicond., Inc., Icheon, South Korea","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095","observed_orcids":["https://orcid.org/0000-0002-7093-2095"]},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":1.1151,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82803867,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"22","issue":"4","first_page":"803","last_page":"812"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.010099999606609344,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"DRAM","score":0.7170000076293945},{"id":"https://openalex.org/keywords/subthreshold-leakage","display_name":"subthreshold leakage","score":0.9819999933242798}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.808304488658905},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.7828809022903442},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.6333927512168884},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6209327578544617},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6058958172798157},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5204622745513916},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4609426259994507},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2898319959640503},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.24596798419952393},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22096911072731018},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2167879045009613},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21019813418388367},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2013.2255628","doi":"https://doi.org/10.1109/tvlsi.2013.2255628","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2255628","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-b","cwts-core","dongbi-c","jufo-2","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1570864324","https://openalex.org/W1965676608","https://openalex.org/W2023739542","https://openalex.org/W2066206155","https://openalex.org/W2071413176","https://openalex.org/W2078659455","https://openalex.org/W2096814918","https://openalex.org/W2106060433","https://openalex.org/W2127913861","https://openalex.org/W2128563080","https://openalex.org/W2131862714","https://openalex.org/W2134292769","https://openalex.org/W2142661102","https://openalex.org/W2143560497","https://openalex.org/W2156226964","https://openalex.org/W2163518473","https://openalex.org/W2169808132"],"related_works":["https://openalex.org/W2162043196","https://openalex.org/W2023739542","https://openalex.org/W2156213349","https://openalex.org/W2117620374","https://openalex.org/W2098745936","https://openalex.org/W2678315714","https://openalex.org/W7097091028","https://openalex.org/W7099667778","https://openalex.org/W2052390581","https://openalex.org/W3113982473"],"abstract_inverted_index":{"Since":[0],"the":[1,31,61,67,86,91,94,105,111,116,119,123,134],"minimum":[2],"feature":[3],"size":[4],"of":[5,33,66,76,118],"dynamic":[6],"RAM":[7],"has":[8],"been":[9,14],"down-scaled,":[10],"several":[11],"studies":[12],"have":[13],"carried":[15],"out":[16],"to":[17,20,41,85,110,139],"determine":[18],"ways":[19],"protect":[21],"cell":[22,68,82,112],"data":[23,83],"from":[24],"leakage":[25,88,100],"current":[26],"in":[27],"many":[28],"areas.":[29],"In":[30,48],"field":[32],"testing,":[34],"more":[35],"appropriate":[36],"test":[37,55,72],"algorithms":[38],"are":[39],"required":[40],"detect":[42,98],"weak":[43,77],"cells":[44,78],"with":[45],"leakage-current":[46],"sources.":[47],"this":[49,128],"paper,":[50],"we":[51],"propose":[52],"an":[53],"interleaving":[54],"algorithm":[56,73,95],"that":[57,79],"takes":[58],"into":[59],"account":[60],"equal":[62],"bit-line":[63],"stress":[64,92,107,125,142],"regardless":[65],"location.":[69],"The":[70],"proposed":[71],"allows":[74],"screening":[75],"cannot":[80],"hold":[81],"due":[84],"subthreshold":[87],"current.":[89],"During":[90],"period,":[93],"can":[96],"also":[97],"other":[99],"currents.":[101],"This":[102],"paper":[103,129],"presents":[104],"maximum":[106,124,141],"differences":[108],"according":[109],"location,":[113],"and":[114,136],"determines":[115],"influence":[117],"refresh":[120,135],"operation":[121],"on":[122],"time.":[126,143],"Therefore,":[127],"suggests":[130],"a":[131],"correlation":[132],"between":[133],"read":[137],"time":[138],"give":[140]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2016-06-24T00:00:00"}