{"id":"https://openalex.org/W2113707455","doi":null,"title":"Application of Goel-Okumoto Model in Software Reliability Measurement","display_name":"Application of Goel-Okumoto Model in Software Reliability Measurement","publication_year":2012,"publication_date":"2012-11-21","ids":{"openalex":"https://openalex.org/W2113707455","mag":"2113707455"},"language":"en","primary_location":{"id":"mag:2113707455","doi":null,"is_oa":false,"landing_page_url":"https://research.ijcaonline.org/ICNICT/number5/icnict1007.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109476357","display_name":"Pankaj Nagar","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pankaj Nagar","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5040632072","display_name":"Blessy Thankachan","orcid":"https://orcid.org/0000-0003-3752-2075","observed_orcids":["https://orcid.org/0000-0003-3752-2075"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Blessy Thankachan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8506,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.86081391,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":null,"issue":"5","first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/goel-okumoto-model","display_name":"Goel-Okumoto model","score":0.9850000143051147},{"id":"https://openalex.org/keywords/software-reliability-growth-models","display_name":"software reliability growth models","score":0.7739999890327454},{"id":"https://openalex.org/keywords/software-reliability-measurement","display_name":"software reliability measurement","score":0.7730000019073486},{"id":"https://openalex.org/keywords/software-testing","display_name":"software testing","score":0.8100000023841858}],"concepts":[{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6691972017288208},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6594798564910889},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5801137089729309},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5556709170341492},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.5523757934570312},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5077260732650757},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.4425247311592102},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.32226496934890747},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23916903138160706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16538050770759583},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13872799277305603},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1325261890888214},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.051481664180755615},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2113707455","doi":null,"is_oa":false,"landing_page_url":"https://research.ijcaonline.org/ICNICT/number5/icnict1007.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W166995912","https://openalex.org/W1520248099","https://openalex.org/W1965970907","https://openalex.org/W2095801530","https://openalex.org/W2168479209"],"related_works":["https://openalex.org/W4200512663","https://openalex.org/W2165874705","https://openalex.org/W1503163251","https://openalex.org/W2100650769","https://openalex.org/W7144894691","https://openalex.org/W2468303103","https://openalex.org/W2063902761","https://openalex.org/W259140706","https://openalex.org/W2290886954","https://openalex.org/W2025772701"],"abstract_inverted_index":{"estimation":[0,35,68],"of":[1,14,20,36,69,71],"remaining":[2,38],"errors":[3],"in":[4],"the":[5,8,12,15,18,33,37,43,67],"software":[6,16],"is":[7,24],"deciding":[9],"factor":[10],"for":[11,32,66],"release":[13],"or":[17],"amount":[19],"more":[21],"testing":[22],"which":[23],"required.":[25],"Software":[26],"growth":[27],"reliability":[28,70],"models":[29],"are":[30,54],"used":[31],"correct":[34],"errors.":[39],"In":[40],"this":[41],"paper":[42],"Goel-":[44],"Okumoto":[45],"Model":[46],"has":[47,62],"been":[48,64],"selected":[49],"and":[50],"its":[51],"various":[52],"parameters":[53],"discussed":[55],"with":[56],"a":[57],"case":[58],"study.":[59],"A":[60],"criterion":[61],"also":[63],"evaluated":[65],"any":[72],"software.":[73]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}