{"id":"https://openalex.org/W2113214701","doi":"https://doi.org/10.1016/j.microrel.2010.07.141","title":"Preliminary results of storage accelerated aging test on InP/InGaAs DHBT","display_name":"Preliminary results of storage accelerated aging test on InP/InGaAs DHBT","publication_year":2010,"publication_date":"2010-08-22","ids":{"openalex":"https://openalex.org/W2113214701","doi":"https://doi.org/10.1016/j.microrel.2010.07.141","mag":"2113214701"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2010.07.141","doi":"https://doi.org/10.1016/j.microrel.2010.07.141","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.141","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035176139","display_name":"G. A. Kon\u00e9","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"G.A. Kon\u00e9","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109307932","display_name":"B. Grandchamp","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Grandchamp","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011232193","display_name":"C. Hainaut","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Hainaut","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101165777","display_name":"Fran\u00e7ois Marc","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Marc","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088672720","display_name":"Cristell Maneux","orcid":"https://orcid.org/0000-0001-9125-5372","observed_orcids":["https://orcid.org/0000-0001-9125-5372"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Maneux","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112266615","display_name":"Nathalie Labat","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Labat","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008160362","display_name":"Thomas Zimmer","orcid":"https://orcid.org/0000-0002-4311-0969","observed_orcids":["https://orcid.org/0000-0002-4311-0969"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Zimmer","raw_affiliation_strings":["IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS, CNRS UMR 5818 \u2013 Universit\u00e9 Bordeaux I-351, Cours de la liberation, F-33405 Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012758951","display_name":"Virginie Nodjiadjim","orcid":"https://orcid.org/0000-0002-2092-6201","observed_orcids":["https://orcid.org/0000-0002-2092-6201"]},"institutions":[{"id":"https://openalex.org/I4210152719","display_name":"III V Lab","ror":"https://ror.org/0509ggw88","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210152719"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"V. Nodjiadjim","raw_affiliation_strings":["Alcatel-Thales III-V Lab, Route de Nozay, F-91461 Marcoussis Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alcatel-Thales III-V Lab, Route de Nozay, F-91461 Marcoussis Cedex, France","institution_ids":["https://openalex.org/I4210152719"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111711408","display_name":"J. Godin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210152719","display_name":"III V Lab","ror":"https://ror.org/0509ggw88","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210152719"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. Godin","raw_affiliation_strings":["Alcatel-Thales III-V Lab, Route de Nozay, F-91461 Marcoussis Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alcatel-Thales III-V Lab, Route de Nozay, F-91461 Marcoussis Cedex, France","institution_ids":["https://openalex.org/I4210152719"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5035176139"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210157089","https://openalex.org/I4396570533"],"apc_list":{"value":2280,"currency":"USD","value_usd":2280},"apc_paid":null,"fwci":2.4506,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.89017383,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"50","issue":"9-11","first_page":"1548","last_page":"1553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.39649999141693115,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.39649999141693115,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.37229999899864197,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.05849999934434891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inp-ingaas-heterojunction-bipolar-transistors","display_name":"InP/InGaAs heterojunction bipolar transistors","score":0.8730000257492065},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.777999997138977},{"id":"https://openalex.org/keywords/high-temperature-aging","display_name":"high-temperature aging","score":0.7670000195503235},{"id":"https://openalex.org/keywords/collector-doping","display_name":"collector doping","score":0.6570000052452087},{"id":"https://openalex.org/keywords/planarization","display_name":"planarization","score":0.7120000123977661},{"id":"https://openalex.org/keywords/gummel-plots","display_name":"Gummel plots","score":0.8659999966621399},{"id":"https://openalex.org/keywords/tcad-simulation","display_name":"TCAD simulation","score":0.7379999756813049},{"id":"https://openalex.org/keywords/failure-mechanisms","display_name":"failure mechanisms","score":0.5249999761581421}],"concepts":[{"id":"https://openalex.org/C173408217","wikidata":"https://www.wikidata.org/wiki/Q1428898","display_name":"Heterojunction bipolar transistor","level":5,"score":0.8884427547454834},{"id":"https://openalex.org/C180088628","wikidata":"https://www.wikidata.org/wiki/Q1069404","display_name":"Chemical-mechanical planarization","level":3,"score":0.7172881364822388},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.689706563949585},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.5875063538551331},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5542044639587402},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.543023943901062},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.505465030670166},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.47627466917037964},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.35213911533355713},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24292436242103577},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.21202018857002258},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1961095631122589},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.14859914779663086},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13069304823875427},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.07721540331840515},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06442898511886597},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05652013421058655},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.microrel.2010.07.141","doi":"https://doi.org/10.1016/j.microrel.2010.07.141","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.141","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00585073v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00585073","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Microelectronics Reliability, 2010, 50, pp.1548-1553. ⟨10.1016/j.microrel.2010.07.141⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W177721895","https://openalex.org/W1979178760","https://openalex.org/W1986311927","https://openalex.org/W2035847201","https://openalex.org/W2036277097","https://openalex.org/W2052514097","https://openalex.org/W2060662215","https://openalex.org/W2104517116","https://openalex.org/W2120522085","https://openalex.org/W2124765030","https://openalex.org/W2152594827","https://openalex.org/W4232625894"],"related_works":["https://openalex.org/W1825767781","https://openalex.org/W1979104784","https://openalex.org/W1972116034","https://openalex.org/W2052514097","https://openalex.org/W2152594827","https://openalex.org/W2044007249","https://openalex.org/W2085944206","https://openalex.org/W1968877090","https://openalex.org/W1634849233","https://openalex.org/W1955189200"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}