{"id":"https://openalex.org/W2108217496","doi":"https://doi.org/10.1109/14.212242","title":"Use of hidden Markov models for partial discharge pattern classification","display_name":"Use of hidden Markov models for partial discharge pattern classification","publication_year":1993,"publication_date":"1993-04-01","ids":{"openalex":"https://openalex.org/W2108217496","doi":"https://doi.org/10.1109/14.212242","mag":"2108217496"},"language":"en","primary_location":{"id":"doi:10.1109/14.212242","doi":"https://doi.org/10.1109/14.212242","is_oa":false,"landing_page_url":"https://doi.org/10.1109/14.212242","pdf_url":null,"source":{"id":"https://openalex.org/S119769419","display_name":"IEEE Transactions on Electrical Insulation","issn_l":"0018-9367","issn":["0018-9367","1557-962X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electrical Insulation","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082367904","display_name":"L. Satish","orcid":"https://orcid.org/0000-0002-5164-0548","observed_orcids":["https://orcid.org/0000-0002-5164-0548"]},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"L. Satish","raw_affiliation_strings":["Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India","Department of High voltage Engineering, Indian Institute of Science, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of High voltage Engineering, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":null,"display_name":"B.I. Gururaj","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"B.I. Gururaj","raw_affiliation_strings":["Deptartment of High Voltage Engineering, Indian Institute of Science, Bangalore, India","Department of High voltage Engineering, Indian Institute of Science, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Deptartment of High Voltage Engineering, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of High voltage Engineering, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":2.4024,"has_fulltext":false,"cited_by_count":86,"citation_normalized_percentile":{"value":0.87816927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"28","issue":"2","first_page":"172","last_page":"182"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.8452000021934509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.8452000021934509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.01979999989271164,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.011800000444054604,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hidden-markov-models","display_name":"hidden Markov models","score":0.9509999752044678},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"partial discharge","score":0.9789999723434448},{"id":"https://openalex.org/keywords/pattern-classification","display_name":"pattern classification","score":0.6240000128746033},{"id":"https://openalex.org/keywords/model-training","display_name":"model training","score":0.5040000081062317},{"id":"https://openalex.org/keywords/model-selection","display_name":"model selection","score":0.6129999756813049},{"id":"https://openalex.org/keywords/neural-network-comparison","display_name":"neural network comparison","score":0.7649999856948853},{"id":"https://openalex.org/keywords/insulation-monitoring","display_name":"insulation condition monitoring","score":0.4050000011920929}],"concepts":[{"id":"https://openalex.org/C23224414","wikidata":"https://www.wikidata.org/wiki/Q176769","display_name":"Hidden Markov model","level":2,"score":0.9179890155792236},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6195132732391357},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5749516487121582},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.5373749732971191},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.51850426197052},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.48815613985061646},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.47564956545829773},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.47105833888053894},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.4655628204345703},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.43147820234298706},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.41800329089164734},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.3982560634613037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23571985960006714},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/14.212242","doi":"https://doi.org/10.1109/14.212242","is_oa":false,"landing_page_url":"https://doi.org/10.1109/14.212242","pdf_url":null,"source":{"id":"https://openalex.org/S119769419","display_name":"IEEE Transactions on Electrical Insulation","issn_l":"0018-9367","issn":["0018-9367","1557-962X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electrical Insulation","raw_type":"journal-article"},{"id":"pmh:oai:eprints.iisc.ac.in:6782","doi":null,"is_oa":false,"landing_page_url":"http://eprints.iisc.ac.in/6782/1/Use_of_Hidden.pdf","pdf_url":"http://eprints.iisc.ac.in/6782/1/Use_of_Hidden.pdf","source":{"id":"https://openalex.org/S4377196309","display_name":"NOT FOUND REPOSITORY (Indian Institute of Science Bangalore)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I59270414","host_organization_name":"Indian Institute of Science Bangalore","host_organization_lineage":["https://openalex.org/I59270414"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1971278729","https://openalex.org/W2021760654","https://openalex.org/W2075978670","https://openalex.org/W2077574412","https://openalex.org/W2101346879","https://openalex.org/W2105594594","https://openalex.org/W2109063904","https://openalex.org/W2125838338","https://openalex.org/W2163929346","https://openalex.org/W2171850596","https://openalex.org/W2921544823"],"related_works":["https://openalex.org/W2104299962","https://openalex.org/W2743631751","https://openalex.org/W1960667623","https://openalex.org/W2135429009","https://openalex.org/W2116341120","https://openalex.org/W7217887078","https://openalex.org/W2355505501","https://openalex.org/W2246004946","https://openalex.org/W2978041465","https://openalex.org/W7098281631"],"abstract_inverted_index":{"An":[0],"attempt":[1],"was":[2],"made":[3],"to":[4,10,20,55,71],"use":[5],"hidden":[6],"Markov":[7],"models":[8],"(HMM)":[9],"classify":[11],"partial":[12],"discharge":[13],"(PD)":[14],"image":[15,61],"patterns.":[16,62],"After":[17],"an":[18],"introduction":[19],"HMM,":[21],"the":[22,34,40,48,66],"methodology":[23],"and":[24,36,39],"algorithms":[25],"for":[26],"evolving":[27],"them":[28],"are":[29,43],"explained.":[30],"The":[31,45,63],"selection":[32],"of":[33,47,58,65,74],"model":[35],"training":[37],"parameters":[38],"results":[41],"obtained":[42],"discussed.":[44],"utility":[46],"approach":[49,68],"is":[50,69],"evaluated":[51],"by":[52],"applying":[53],"it":[54],"five":[56],"types":[57],"actual":[59],"PD":[60],"performance":[64],"HMM":[67],"shown":[70],"exceed":[72],"that":[73],"neural":[75],"networks.>":[76]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}