{"id":"https://openalex.org/W2102996940","doi":"https://doi.org/10.1109/tasc.2003.812023","title":"Transmission electron microscopy on interface engineered superconducting thin films","display_name":"Transmission electron microscopy on interface engineered superconducting thin films","publication_year":2003,"publication_date":"2003-06-01","ids":{"openalex":"https://openalex.org/W2102996940","doi":"https://doi.org/10.1109/tasc.2003.812023","mag":"2102996940"},"language":"en","primary_location":{"id":"doi:10.1109/tasc.2003.812023","doi":"https://doi.org/10.1109/tasc.2003.812023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tasc.2003.812023","pdf_url":null,"source":{"id":"https://openalex.org/S119074828","display_name":"IEEE Transactions on Applied Superconductivity","issn_l":"1051-8223","issn":["1051-8223","1558-2515"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310321340","host_organization_name":"IEEE Council on Superconductivity","host_organization_lineage":["https://openalex.org/P4310321340"],"host_organization_lineage_names":["IEEE Council on Superconductivity"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Appiled Superconductivity","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.utwente.nl/en/publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013888065","display_name":"Sara Bals","orcid":"https://orcid.org/0000-0002-4249-8017","observed_orcids":["https://orcid.org/0000-0002-4249-8017","https://orcid.org/0000-0002-9303-815X"]},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Bals","raw_affiliation_strings":["EMAT, University of Antwerp, Antwerp, Belgium","University of Antwerp (Belgium)#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EMAT, University of Antwerp, Antwerp, Belgium","institution_ids":["https://openalex.org/I149213910"]},{"raw_affiliation_string":"University of Antwerp (Belgium)#TAB#","institution_ids":["https://openalex.org/I149213910"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104977585","display_name":"Gustaaf Van Tendeloo","orcid":"https://orcid.org/0009-0001-9501-2228","observed_orcids":["https://orcid.org/0009-0001-9501-2228"]},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Van Tendeloo","raw_affiliation_strings":["EMAT, University of Antwerp, Antwerp, Belgium","University of Antwerp (Belgium)#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EMAT, University of Antwerp, Antwerp, Belgium","institution_ids":["https://openalex.org/I149213910"]},{"raw_affiliation_string":"University of Antwerp (Belgium)#TAB#","institution_ids":["https://openalex.org/I149213910"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068067980","display_name":"Guus J. H. M. Rijnders","orcid":"https://orcid.org/0000-0002-4638-0630","observed_orcids":["https://orcid.org/0000-0002-4638-0630"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"G. Rijnders","raw_affiliation_strings":["Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","Univ. of Twente#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ. of Twente#TAB#","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073980747","display_name":"Mark Huijben","orcid":"https://orcid.org/0000-0001-8175-6958","observed_orcids":["https://orcid.org/0000-0001-8175-6958"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"M. Huijben","raw_affiliation_strings":["Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","Univ. of Twente#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ. of Twente#TAB#","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007509007","display_name":"Victor Leca","orcid":"https://orcid.org/0000-0001-7991-8153","observed_orcids":["https://orcid.org/0000-0001-7991-8153"]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"V. Leca","raw_affiliation_strings":["Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","Univ. of Twente#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ. of Twente#TAB#","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111910466","display_name":"Dave H. A. Blank","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"D.H.A. Blank","raw_affiliation_strings":["Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","Univ. of Twente#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Low Temperature Division, Applied Physics and MESA Research Institute, Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ. of Twente#TAB#","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.6291,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.62012291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"13","issue":"2","first_page":"2834","last_page":"2837"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.6991999745368958,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.6991999745368958,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.2012999951839447,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.08139999955892563,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/superconducting-thin-films","display_name":"superconducting thin films","score":0.902999997138977},{"id":"https://openalex.org/keywords/yba2cu3o7-delta","display_name":"YBa2Cu3O7-\u03b4","score":0.8899999856948853},{"id":"https://openalex.org/keywords/srtio3-substrate","display_name":"SrTiO3 substrate","score":0.9509999752044678},{"id":"https://openalex.org/keywords/interface-engineering","display_name":"interface engineering","score":0.7210000157356262},{"id":"https://openalex.org/keywords/epitaxial-strain","display_name":"epitaxial strain","score":0.9480000138282776},{"id":"https://openalex.org/keywords/critical-temperature","display_name":"critical temperature","score":0.9259999990463257},{"id":"https://openalex.org/keywords/compressive-stress","display_name":"compressive stress","score":0.6209999918937683},{"id":"https://openalex.org/keywords/tensile-strain","display_name":"tensile strain","score":0.7360000014305115},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.5210000276565552},{"id":"https://openalex.org/keywords/structural-defects","display_name":"structural defects","score":0.5049999952316284},{"id":"https://openalex.org/keywords/high-temperature-superconductors","display_name":"high-temperature superconductors","score":0.7210000157356262}],"concepts":[{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.8336053490638733},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8024155497550964},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.7806153297424316},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.679017186164856},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.6174545288085938},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.5662033557891846},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5230715870857239},{"id":"https://openalex.org/C109613756","wikidata":"https://www.wikidata.org/wiki/Q846667","display_name":"High-temperature superconductivity","level":3,"score":0.4384165406227112},{"id":"https://openalex.org/C2779942774","wikidata":"https://www.wikidata.org/wiki/Q414015","display_name":"Yttrium barium copper oxide","level":4,"score":0.4251364469528198},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.36242473125457764},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.34902316331863403},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3278051018714905},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.23372310400009155},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07136771082878113},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tasc.2003.812023","doi":"https://doi.org/10.1109/tasc.2003.812023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tasc.2003.812023","pdf_url":null,"source":{"id":"https://openalex.org/S119074828","display_name":"IEEE Transactions on Applied Superconductivity","issn_l":"1051-8223","issn":["1051-8223","1558-2515"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310321340","host_organization_name":"IEEE Council on Superconductivity","host_organization_lineage":["https://openalex.org/P4310321340"],"host_organization_lineage_names":["IEEE Council on Superconductivity"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Appiled Superconductivity","raw_type":"journal-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Bals, S, van Tendeloo, G, Rijnders, A J H M, Huijben, M, Leca, V & Blank, D H A 2003, 'Transmission Electron Microscopy on Interface Engineered Superconducting Thin Films', IEEE transactions on applied superconductivity, vol. 13, no. 2, pp. 2834-2837. https://doi.org/10.1109/TASC.2003.812023","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","doi":null,"is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE transactions on applied superconductivity, 13(2), 2834 - 2837. IEEE","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:ut:oai:ris.utwente.nl:publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","doi":null,"is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/f7aeedb7-67ea-4571-8806-e0171c7b20e1","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE transactions on applied superconductivity, 13(2), 2834 - 2837. IEEE","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W5931460","https://openalex.org/W1506501852","https://openalex.org/W1608164701","https://openalex.org/W1967644351","https://openalex.org/W2016352588","https://openalex.org/W2059872633","https://openalex.org/W2067466928","https://openalex.org/W2068310265","https://openalex.org/W2073593525","https://openalex.org/W2078279248","https://openalex.org/W2088595913","https://openalex.org/W2118053194","https://openalex.org/W2138261224"],"related_works":["https://openalex.org/W1929901948","https://openalex.org/W1514093155","https://openalex.org/W13764249","https://openalex.org/W2048028308","https://openalex.org/W2076586774","https://openalex.org/W2502114291","https://openalex.org/W2070976377","https://openalex.org/W3036228621","https://openalex.org/W2014469251","https://openalex.org/W2000716417"],"abstract_inverted_index":{"Transmission":[0],"electron":[1,22],"microscopy":[2,23],"is":[3,106],"used":[4],"to":[5,126],"evaluate":[6],"different":[7],"deposition":[8],"techniques,":[9],"which":[10,70,115],"optimize":[11],"the":[12,26,93,102,119,128,132],"microstructure":[13],"and":[14,77],"physical":[15],"properties":[16],"of":[17,28,96,131],"superconducting":[18],"thin":[19,48,90],"films.":[20],"High-resolution":[21],"proves":[24],"that":[25],"use":[27],"an":[29,61],"YBa/sub":[30,43],"2/Cu/sub":[31,44],"2/O/sub":[32],"x/":[33],"buffer":[34],"layer":[35,68,89],"can":[36,56],"avoid":[37],"a":[38,109,112],"variable":[39],"interface":[40],"configuration":[41],"in":[42,72,83],"3/O/sub":[45],"7-/spl":[46],"delta//":[47],"films":[49,73,91],"grown":[50],"on":[51],"SrTiO/sub":[52],"3/.":[53],"The":[54],"growth":[55],"also":[57,122],"be":[58],"controlled":[59],"at":[60],"atomic":[62],"level":[63],"by":[64,108],"using":[65],"sub-unit":[66],"cell":[67],"epitaxy,":[69],"results":[71],"with":[74],"high":[75],"quality":[76],"few":[78],"structural":[79],"defects.":[80],"Epitaxial":[81],"strain":[82,124],"Sr/sub":[84],"0.85/La/sub":[85],"0.15/CuO/sub":[86],"2/":[87],"infinite":[88,133],"influences":[92],"critical":[94,129],"temperature":[95,130],"these":[97],"films,":[98],"as":[99,101],"well":[100],"microstructure.":[103],"Compressive":[104],"stress":[105],"released":[107],"modulated":[110],"or":[111],"twinned":[113],"microstructure,":[114],"eliminates":[116],"superconductivity.":[117],"On":[118],"other":[120],"hand,":[121],"tensile":[123],"seems":[125],"lower":[127],"layer.":[134]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2016-06-24T00:00:00"}