{"id":"https://openalex.org/W2102135455","doi":"https://doi.org/10.1109/tc.2006.61","title":"Self-stabilizing microprocessor: analyzing and overcoming soft errors","display_name":"Self-stabilizing microprocessor: analyzing and overcoming soft errors","publication_year":2006,"publication_date":"2006-03-22","ids":{"openalex":"https://openalex.org/W2102135455","doi":"https://doi.org/10.1109/tc.2006.61","mag":"2102135455"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2006.61","doi":"https://doi.org/10.1109/tc.2006.61","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2006.61","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-a","cwts-core","dongbi-a","jufo-3","norway-2","poland-140","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060182415","display_name":"Shlomi Dolev","orcid":"https://orcid.org/0000-0001-5418-6670","observed_orcids":["https://orcid.org/0000-0001-5418-6670"]},"institutions":[{"id":"https://openalex.org/I124227911","display_name":"Ben-Gurion University of the Negev","ror":"https://ror.org/05tkyf982","country_code":"IL","type":"education","lineage":["https://openalex.org/I124227911"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"S. Dolev","raw_affiliation_strings":["Department of Computer Science, Ben Gurion University, Beer Sheva, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ben Gurion University, Beer Sheva, Israel","institution_ids":["https://openalex.org/I124227911"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070881595","display_name":"Yinnon A. Haviv","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I124227911","display_name":"Ben-Gurion University of the Negev","ror":"https://ror.org/05tkyf982","country_code":"IL","type":"education","lineage":["https://openalex.org/I124227911"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Y.A. Haviv","raw_affiliation_strings":["Department of Computer Science, Ben Gurion University, Beer Sheva, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ben Gurion University, Beer Sheva, Israel","institution_ids":["https://openalex.org/I124227911"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I124227911"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":6.1465,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.96093487,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"55","issue":"4","first_page":"385","last_page":"399"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.006099999882280827,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-errors","display_name":"soft errors","score":0.8500000238418579},{"id":"https://openalex.org/keywords/self-stabilization","display_name":"self-stabilization","score":0.777999997138977},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"fault tolerance","score":0.5210000276565552},{"id":"https://openalex.org/keywords/reliability-analysis","display_name":"reliability analysis","score":0.5270000100135803},{"id":"https://openalex.org/keywords/np-hardness","display_name":"NP-hardness","score":0.9110000133514404}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6308255195617676},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6024789214134216},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.41636183857917786},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36647194623947144},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2343353033065796},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.20832014083862305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13196995854377747}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.2006.61","doi":"https://doi.org/10.1109/tc.2006.61","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2006.61","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-a","cwts-core","dongbi-a","jufo-3","norway-2","poland-140","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1487623494","https://openalex.org/W1501584870","https://openalex.org/W1547900895","https://openalex.org/W1548975601","https://openalex.org/W1555915743","https://openalex.org/W1715248483","https://openalex.org/W1864485850","https://openalex.org/W1983804562","https://openalex.org/W2013570814","https://openalex.org/W2044444099","https://openalex.org/W2102480715","https://openalex.org/W2106622045","https://openalex.org/W2116097016","https://openalex.org/W2136884623","https://openalex.org/W2158848208","https://openalex.org/W2159080219","https://openalex.org/W2169213530","https://openalex.org/W2497735908","https://openalex.org/W2725179571","https://openalex.org/W2739826888","https://openalex.org/W3182208082","https://openalex.org/W4254970788"],"related_works":["https://openalex.org/W15096891","https://openalex.org/W7099201522","https://openalex.org/W144170181","https://openalex.org/W2053248871","https://openalex.org/W2581929266","https://openalex.org/W2367617207","https://openalex.org/W204573052","https://openalex.org/W2791974206","https://openalex.org/W7100249344","https://openalex.org/W7098804106"],"abstract_inverted_index":{"Soft":[0],"errors":[1,139,171,220],"are":[2,35,228],"changes":[3],"in":[4,15,40,117,221],"memory":[5],"value":[6],"caused":[7],"by":[8,62,133,231],"external":[9],"radiation":[10],"or":[11],"electrical":[12],"noise.":[13],"Decreases":[14],"computing":[16,240],"feature":[17],"sizes":[18],"and":[19,22,52,69,83,152,187,199],"power":[20],"usages":[21],"shorting":[23],"the":[24,28,63,67,78,95,99,125,135,158,167,189,194,197,206,216,225,232,237,241],"microcycle":[25],"period":[26],"enhance":[27],"influence":[29],"of":[30,66,77,110,137,160,169,196,208,224,239,243],"soft":[31,50,111,138,161,170,212],"errors.":[32,162],"Self-stabilizing":[33],"systems":[34],"designed":[36],"to":[37,53,55,92,114,192,200,211],"be":[38],"started":[39],"an":[41,255],"arbitrary,":[42],"possibly":[43],"a":[44,56,72,87,149,153,181,244],"corrupted,":[45],"state":[46,64],"due":[47],"to,":[48],"say,":[49],"errors,":[51,112,213],"converge":[54],"desired":[57],"behavior.":[58],"Self-stabilization":[59],"is":[60,70,101,122,250,254],"defined":[61,75],"space":[65],"components":[68],"essentially":[71],"well-founded,":[73],"clearly":[74],"form":[76],"terms":[79],"self-healing,":[80],"automatic-recovery,":[81],"automatic-repair,":[82],"autonomic-computing.":[84],"To":[85],"implement":[86],"self-stabilizing":[88,104,150],"system,":[89],"one":[90],"needs":[91],"ensure":[93],"that":[94,97,124,227,236,247],"microprocessor":[96,105,126,151,185,190],"executes":[98],"program":[100],"self-stabilizing.":[102],"A":[103],"copes":[106],"with":[107],"any":[108],"combination":[109],"converging":[113],"perform":[115],"fetch-decode-execute":[116],"fault-free":[118],"periods.":[119],"Still,":[120],"it":[121],"important":[123],"will":[127],"avoid":[128],"convergence":[129],"periods":[130],"if":[131],"possible":[132],"masking":[134,249],"effect":[136,159,168],"immediately.":[140],"In":[141,176],"this":[142],"work,":[143],"we":[144,214],"present":[145],"design":[146,198],"schemes":[147,164],"for":[148,156,165],"new":[154],"technique":[155],"analyzing":[157,166,205],"Previous":[163],"were":[172],"based":[173],"on":[174,184],"simulations.":[175],"contrast,":[177],"our":[178],"scheme":[179],"computes":[180],"lower":[182],"bound":[183],"reliability":[186,195,202,242],"enables":[188],"designer":[191],"evaluate":[193],"identify":[201],"bottlenecks.":[203],"When":[204],"resiliency":[207],"digital":[209],"circuits":[210,226],"examine":[215],"logical":[217,248],"masking,":[218],"i.e.,":[219],"internal":[222],"nodes":[223],"masked":[229],"later":[230],"computation.":[233],"We":[234],"show":[235],"problem":[238],"circuit":[245],"such":[246],"taken":[251],"into":[252],"account":[253],"NP-hard":[256],"problem.":[257]},"counts_by_year":[{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}