{"id":"https://openalex.org/W2101123742","doi":"https://doi.org/10.1109/elmagc.1999.801344","title":"Ground bouncing analysis using a program linking FDTD and SPICE","display_name":"Ground bouncing analysis using a program linking FDTD and SPICE","publication_year":2003,"publication_date":"2003-01-20","ids":{"openalex":"https://openalex.org/W2101123742","doi":"https://doi.org/10.1109/elmagc.1999.801344","mag":"2101123742"},"language":"en","primary_location":{"id":"doi:10.1109/elmagc.1999.801344","doi":"https://doi.org/10.1109/elmagc.1999.801344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/elmagc.1999.801344","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1999 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.99EX147)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000237676","display_name":"Akinori Nishizawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Nishizawa","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Amagasaki, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Amagasaki, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Shimazaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Shimazaki","raw_affiliation_strings":["Design System Engineering Center, Mitsubishi Electric Corporation Limited, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Design System Engineering Center, Mitsubishi Electric Corporation Limited, Yokohama, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"last","author":{"id":null,"display_name":"S. Tanabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Tanabe","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Amagasaki, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Amagasaki, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210133125"],"apc_list":null,"apc_paid":null,"fwci":0.897,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.72030922,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"381","last_page":"384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.024800000712275505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-noise","display_name":"power supply noise","score":0.515999972820282},{"id":"https://openalex.org/keywords/printed-circuit-boards","display_name":"printed circuit boards","score":0.8309999704360962},{"id":"https://openalex.org/keywords/distributed-parameter-modeling","display_name":"distributed parameter modeling","score":0.597000002861023},{"id":"https://openalex.org/keywords/electromagnetic-radiation","display_name":"electromagnetic radiation","score":0.7829999923706055},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.4180000126361847}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.9584781527519226},{"id":"https://openalex.org/C184880428","wikidata":"https://www.wikidata.org/wiki/Q1417308","display_name":"Finite-difference time-domain method","level":2,"score":0.9545658826828003},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6193014979362488},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5142002105712891},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5053597092628479},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.48053866624832153},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45083487033843994},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4406869113445282},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3721802532672882},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32753175497055054},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3132215738296509},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2838071882724762},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20531892776489258},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/elmagc.1999.801344","doi":"https://doi.org/10.1109/elmagc.1999.801344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/elmagc.1999.801344","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1999 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.99EX147)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2003017040","https://openalex.org/W2102292158","https://openalex.org/W2120380916","https://openalex.org/W2142063750"],"related_works":["https://openalex.org/W1631262220","https://openalex.org/W2212886262","https://openalex.org/W2128260583","https://openalex.org/W3147850758","https://openalex.org/W1618636229","https://openalex.org/W1513650455","https://openalex.org/W1995666366","https://openalex.org/W2003877246","https://openalex.org/W2937821187","https://openalex.org/W2141067521"],"abstract_inverted_index":{"Ground":[0],"bouncing":[1,54],"noise":[2],"was":[3],"analyzed":[4],"by":[5,28,51,62],"a":[6,35],"link":[7],"program":[8],"of":[9,23,34],"finite":[10],"difference":[11],"time":[12],"domain":[13],"(FDTD)":[14],"and":[15,40,56],"SPICE.":[16],"In":[17],"this":[18,63],"program,":[19],"the":[20,31,46,70],"electric":[21],"characteristics":[22],"buffer":[24],"ICs":[25],"is":[26],"computed":[27,50,66],"SPICE,":[29],"whereas":[30],"distributed":[32],"parameter":[33],"printed":[36],"circuit":[37],"board":[38],"(PCB)":[39],"electromagnetic":[41],"(EM)":[42],"wave":[43],"radiation":[44],"to":[45],"open":[47],"air":[48],"are":[49],"FDTD.":[52],"Typical":[53],"voltage":[55],"current":[57],"waveforms":[58],"can":[59],"be":[60],"obtained":[61],"program.":[64],"The":[65],"results":[67],"agree":[68],"with":[69],"measurement":[71],"results.":[72]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}