{"id":"https://openalex.org/W2099451963","doi":"https://doi.org/10.1109/irws.2009.5383013","title":"Effects of various applications on relative lifetime of processor cores","display_name":"Effects of various applications on relative lifetime of processor cores","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W2099451963","doi":"https://doi.org/10.1109/irws.2009.5383013","mag":"2099451963"},"language":"en","primary_location":{"id":"doi:10.1109/irws.2009.5383013","doi":"https://doi.org/10.1109/irws.2009.5383013","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irws.2009.5383013","pdf_url":null,"source":{"id":"https://openalex.org/S4210230073","display_name":"IEEE International Integrated Reliability Workshop final report","issn_l":"1930-8841","issn":["1930-8841","2374-8036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Integrated Reliability Workshop Final Report","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"T. Gupta","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Gupta","raw_affiliation_strings":["CEA LIST, Gif-sur-Yvette, France","CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA LIST, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]},{"raw_affiliation_string":"CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019691248","display_name":"Cl\u00e9ment Bertolini","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Bertolini","raw_affiliation_strings":["CEA LIST, Gif-sur-Yvette, France","CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA LIST, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]},{"raw_affiliation_string":"CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048586688","display_name":"Olivier H\u00e9ron","orcid":"https://orcid.org/0009-0007-0354-1522","observed_orcids":["https://orcid.org/0009-0007-0354-1522"]},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"O. Heron","raw_affiliation_strings":["CEA LIST, Gif-sur-Yvette, France","CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA LIST, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]},{"raw_affiliation_string":"CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002951583","display_name":"Nicolas Ventroux","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Ventroux","raw_affiliation_strings":["CEA LIST, Gif-sur-Yvette, France","CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA LIST, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]},{"raw_affiliation_string":"CEA LIST, PC94, Gif-Sur-Yvette, F-91191, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008160362","display_name":"Thomas Zimmer","orcid":"https://orcid.org/0000-0002-4311-0969","observed_orcids":["https://orcid.org/0000-0002-4311-0969"]},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Zimmer","raw_affiliation_strings":["Universit\u00e9 Bordeaux 1, Bordeaux, France","Universit\u00e9 Bordeaux I, 351 cours de la Lib\u00e9ration, 33405 TALENCE cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Bordeaux 1, Bordeaux, France","institution_ids":["https://openalex.org/I4396570533"]},{"raw_affiliation_string":"Universit\u00e9 Bordeaux I, 351 cours de la Lib\u00e9ration, 33405 TALENCE cedex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101165777","display_name":"Fran\u00e7ois Marc","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4396570533","display_name":"Universit\u00e9 Bordeaux-I","ror":"https://ror.org/001anga17","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Marc","raw_affiliation_strings":["Universit\u00e9 Bordeaux 1, Bordeaux, France","Universit\u00e9 Bordeaux I, 351 cours de la Lib\u00e9ration, 33405 TALENCE cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Bordeaux 1, Bordeaux, France","institution_ids":["https://openalex.org/I4396570533"]},{"raw_affiliation_string":"Universit\u00e9 Bordeaux I, 351 cours de la Lib\u00e9ration, 33405 TALENCE cedex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4396570533"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4367,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78551704,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"132","last_page":"135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.260699987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.260699987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.23350000381469727,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.18850000202655792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/device-scaling","display_name":"device scaling","score":0.7210000157356262},{"id":"https://openalex.org/keywords/design-robustness","display_name":"design robustness","score":0.7450000047683716}],"concepts":[{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.8304452896118164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7164776921272278},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7001475095748901},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5785458087921143},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.5577526092529297},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.4575752913951874},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.45410358905792236},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43914806842803955},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42717593908309937},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.42069512605667114},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.40643787384033203},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.20437848567962646},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.199951171875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10740381479263306},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irws.2009.5383013","doi":"https://doi.org/10.1109/irws.2009.5383013","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irws.2009.5383013","pdf_url":null,"source":{"id":"https://openalex.org/S4210230073","display_name":"IEEE International Integrated Reliability Workshop final report","issn_l":"1930-8841","issn":["1930-8841","2374-8036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Integrated Reliability Workshop Final Report","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00499480v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00499480","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Integrated Reliability Workshop, Oct 2009, South Lake Tahoe, United States","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:HAL:hal-00674313v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00674313","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IRW, Oct 2009, Lake Tahoe, United States. pp.1","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1586504780","https://openalex.org/W2031683742","https://openalex.org/W2099237366","https://openalex.org/W2102727118","https://openalex.org/W2104225326","https://openalex.org/W2154857344","https://openalex.org/W2165071510","https://openalex.org/W2899305595","https://openalex.org/W3140903683","https://openalex.org/W3149104842","https://openalex.org/W4231523873","https://openalex.org/W4232751114","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2097501715","https://openalex.org/W2171506849","https://openalex.org/W7098570023","https://openalex.org/W2247166899","https://openalex.org/W2104086123","https://openalex.org/W1977655174","https://openalex.org/W4253339627","https://openalex.org/W2026221143","https://openalex.org/W2113647160","https://openalex.org/W4251383832"],"abstract_inverted_index":{"The":[0],"lifetime":[1],"of":[2,38,43,49,58,64],"integrated":[3],"chip":[4],"tends":[5],"to":[6,54],"decrease":[7],"more":[8,10],"and":[9],"with":[11],"technology":[12],"scaling.":[13],"To":[14],"check":[15],"if":[16],"a":[17,31],"design":[18],"is":[19],"robust,":[20],"in":[21],"this":[22],"paper":[23],"we":[24,51],"present":[25],"RTME":[26],"(real":[27],"time":[28],"MTTF":[29],"evaluation),":[30],"simulation":[32],"framework":[33],"that":[34],"enables":[35],"the":[36,47,56,65],"evaluation":[37],"reliability":[39],"at":[40],"higher":[41],"level":[42],"abstraction":[44],"layer.":[45],"Using":[46],"output":[48],"RTME,":[50],"are":[52],"able":[53],"distinguish":[55],"effect":[57],"different":[59,62],"benchmarks":[60],"on":[61],"blocks":[63],"processor.":[66]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}