{"id":"https://openalex.org/W2098280680","doi":"https://doi.org/10.1109/ets.2014.6847799","title":"A true random number generator with on-line testability","display_name":"A true random number generator with on-line testability","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2098280680","doi":"https://doi.org/10.1109/ets.2014.6847799","mag":"2098280680"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2014.6847799","doi":"https://doi.org/10.1109/ets.2014.6847799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847799","pdf_url":null,"source":{"id":"https://openalex.org/S4210202864","display_name":"IEEE European Test Symposium (ETS)","issn_l":"1530-1877","issn":["1530-1877","1558-1780"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077182197","display_name":"Eberhard Bohl","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"E. Bohl","raw_affiliation_strings":["Automotive Electronics Division, Robert Bosch GmbH, Germany","Automotive Electron. Div., Robert Bosch GmbH, Reutlingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automotive Electronics Division, Robert Bosch GmbH, Germany","institution_ids":["https://openalex.org/I889804353"]},{"raw_affiliation_string":"Automotive Electron. Div., Robert Bosch GmbH, Reutlingen, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021443153","display_name":"Matthew Lewis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Lewis","raw_affiliation_strings":["Automotive Electronics Division, Robert Bosch GmbH, Germany","Automotive Electron. Div., Robert Bosch GmbH, Reutlingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automotive Electronics Division, Robert Bosch GmbH, Germany","institution_ids":["https://openalex.org/I889804353"]},{"raw_affiliation_string":"Automotive Electron. Div., Robert Bosch GmbH, Reutlingen, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075078080","display_name":"S. Galkin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I27469343","display_name":"Pforzheim University of Applied Sciences","ror":"https://ror.org/00qakfc35","country_code":"DE","type":"education","lineage":["https://openalex.org/I27469343"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Galkin","raw_affiliation_strings":["Hochschule Pforzheim, Bereich Informationstechnik, Germany","Hochschule Pforzheim, Bereich Informationstechnik, Pforzheim, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hochschule Pforzheim, Bereich Informationstechnik, Germany","institution_ids":["https://openalex.org/I27469343"]},{"raw_affiliation_string":"Hochschule Pforzheim, Bereich Informationstechnik, Pforzheim, Germany","institution_ids":["https://openalex.org/I27469343"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9416,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.70395749,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/true-random-number-generator","display_name":"true random number generator","score":0.9549999833106995},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"ring oscillator","score":0.9850000143051147},{"id":"https://openalex.org/keywords/fpga","display_name":"FPGA","score":0.32199999690055847},{"id":"https://openalex.org/keywords/post-processing","display_name":"post-processing","score":0.656000018119812},{"id":"https://openalex.org/keywords/randomness","display_name":"randomness","score":0.42899999022483826},{"id":"https://openalex.org/keywords/test-chip","display_name":"test chip","score":0.4620000123977661},{"id":"https://openalex.org/keywords/power-analysis-attacks","display_name":"power analysis attacks","score":0.5720000267028809}],"concepts":[{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.9252663850784302},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8416587114334106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6806135177612305},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.6335955858230591},{"id":"https://openalex.org/C2780615836","wikidata":"https://www.wikidata.org/wiki/Q2471869","display_name":"USable","level":2,"score":0.6295621991157532},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.6005834937095642},{"id":"https://openalex.org/C18017163","wikidata":"https://www.wikidata.org/wiki/Q13560113","display_name":"Randomness tests","level":3,"score":0.5176542401313782},{"id":"https://openalex.org/C163173736","wikidata":"https://www.wikidata.org/wiki/Q3308558","display_name":"Key generation","level":3,"score":0.49915146827697754},{"id":"https://openalex.org/C148417208","wikidata":"https://www.wikidata.org/wiki/Q4825882","display_name":"Authentication (law)","level":2,"score":0.4218895435333252},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34418725967407227},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2683006525039673},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2242269515991211},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19215047359466553},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17739564180374146},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.13113906979560852},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09366470575332642},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2014.6847799","doi":"https://doi.org/10.1109/ets.2014.6847799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847799","pdf_url":null,"source":{"id":"https://openalex.org/S4210202864","display_name":"IEEE European Test Symposium (ETS)","issn_l":"1530-1877","issn":["1530-1877","1558-1780"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1541097170","https://openalex.org/W1568780897","https://openalex.org/W1969844298","https://openalex.org/W1979092306","https://openalex.org/W2696718061","https://openalex.org/W3140517496"],"related_works":["https://openalex.org/W2065762964","https://openalex.org/W1969844298","https://openalex.org/W2810470976","https://openalex.org/W2802302584","https://openalex.org/W2696718061","https://openalex.org/W2572659925","https://openalex.org/W4382565725","https://openalex.org/W2996954728","https://openalex.org/W2164056072","https://openalex.org/W2523104764"],"abstract_inverted_index":{"True":[0],"random":[1,44],"number":[2],"generators":[3],"(TRNGs)":[4],"are":[5,11,114],"widely":[6],"used":[7,12],"throughout":[8],"cryptography.":[9],"They":[10],"in":[13,94,100],"the":[14,112],"challenge":[15],"response":[16],"authentication":[17],"procedures,":[18],"key":[19],"generation":[20],"and":[21,98],"for":[22,56],"hardening":[23],"measures":[24,110],"against":[25],"power":[26],"analysis":[27],"attacks.":[28],"An":[29],"important":[30],"feature":[31],"of":[32,73,111],"each":[33],"TRNG":[34,54,74,91,113],"is":[35,84,118],"true":[36],"randomness.":[37],"Such":[38,89],"randomness":[39],"can":[40,67,76],"be":[41,68,77],"obtained":[42],"from":[43],"physical":[45],"effects":[46],"like":[47],"noise.":[48],"In":[49],"order":[50],"to":[51],"make":[52],"a":[53,90,95,103],"usable":[55],"different":[57],"semiconductor":[58],"technologies":[59],"(including":[60],"FPGAs)":[61],"only":[62,80],"digital":[63],"standard":[64,81],"library":[65,82],"cells":[66,83],"used.":[69],"One":[70],"possible":[71],"type":[72],"that":[75],"realized":[78],"with":[79,102,120],"based":[85],"on":[86],"ring":[87],"os-cillators.":[88],"was":[92],"implemented":[93],"test":[96],"chip":[97],"investigated":[99],"combination":[101],"simple":[104],"post":[105],"processing.":[106],"Different":[107],"on-line":[108],"testability":[109],"proposed.":[115],"The":[116],"solution":[117],"compared":[119],"other":[121],"ones.":[122]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}