{"id":"https://openalex.org/W2094835375","doi":"https://doi.org/10.1149/1.1394116","title":"Dishing Effects during Chemical Mechanical Polishing of Copper in Acidic Media","display_name":"Dishing Effects during Chemical Mechanical Polishing of Copper in Acidic Media","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W2094835375","doi":"https://doi.org/10.1149/1.1394116","mag":"2094835375"},"language":"en","primary_location":{"id":"doi:10.1149/1.1394116","doi":"https://doi.org/10.1149/1.1394116","is_oa":false,"landing_page_url":"https://doi.org/10.1149/1.1394116","pdf_url":null,"source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058959244","display_name":"Qiuliang Luo","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Q. Luo","raw_affiliation_strings":["Rodel Incorporated, Newark, Delaware 19713, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rodel Incorporated, Newark, Delaware 19713, United States of America","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013475838","display_name":"Suryadevara V. Babu","orcid":"https://orcid.org/0000-0002-5171-261X","observed_orcids":["https://orcid.org/0000-0002-5171-261X"]},"institutions":[{"id":"https://openalex.org/I16944753","display_name":"Clarkson University","ror":"https://ror.org/03rwgpn18","country_code":"US","type":"education","lineage":["https://openalex.org/I16944753"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. V. Babu","raw_affiliation_strings":["Department of Chemical Engineering and Center for Advanced Materials Processing, Clarkson University, Potsdam, New York 13699, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering and Center for Advanced Materials Processing, Clarkson University, Potsdam, New York 13699, United States of America","institution_ids":["https://openalex.org/I16944753"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1950,"currency":"USD","value_usd":1950},"apc_paid":null,"fwci":5.6768,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.94555293,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"147","issue":"12","first_page":"4639","last_page":"4639"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12092","display_name":"Erosion and Abrasive Machining","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11200","display_name":"Electrodeposition and Electroless Coatings","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chemical-mechanical-polishing","display_name":"chemical mechanical polishing","score":0.7630000114440918},{"id":"https://openalex.org/keywords/copper","display_name":"copper","score":0.7409999966621399},{"id":"https://openalex.org/keywords/dishing","display_name":"dishing","score":0.9800000190734863},{"id":"https://openalex.org/keywords/benzotriazole","display_name":"benzotriazole","score":0.8510000109672546},{"id":"https://openalex.org/keywords/inhibitors","display_name":"inhibitors","score":0.3790000081062317},{"id":"https://openalex.org/keywords/slurry-formulation","display_name":"slurry formulation","score":0.5460000038146973}],"concepts":[{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.9298033118247986},{"id":"https://openalex.org/C2777844968","wikidata":"https://www.wikidata.org/wiki/Q220672","display_name":"Benzotriazole","level":2,"score":0.8779739141464233},{"id":"https://openalex.org/C180088628","wikidata":"https://www.wikidata.org/wiki/Q1069404","display_name":"Chemical-mechanical planarization","level":3,"score":0.8735765218734741},{"id":"https://openalex.org/C138113353","wikidata":"https://www.wikidata.org/wiki/Q611639","display_name":"Polishing","level":2,"score":0.8354862928390503},{"id":"https://openalex.org/C94293008","wikidata":"https://www.wikidata.org/wiki/Q23925154","display_name":"Slurry","level":2,"score":0.7415464520454407},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.5912365317344666},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.5292792916297913},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.508562445640564},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.401686429977417},{"id":"https://openalex.org/C179104552","wikidata":"https://www.wikidata.org/wiki/Q11165","display_name":"Inorganic chemistry","level":1,"score":0.3953099250793457},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10677048563957214},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.05848115682601929},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.04174894094467163}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1149/1.1394116","doi":"https://doi.org/10.1149/1.1394116","is_oa":false,"landing_page_url":"https://doi.org/10.1149/1.1394116","pdf_url":null,"source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1977885484","https://openalex.org/W2348159075","https://openalex.org/W1968083733","https://openalex.org/W2897908021","https://openalex.org/W1958325000","https://openalex.org/W2389280664","https://openalex.org/W2088679661","https://openalex.org/W4387417842","https://openalex.org/W2109754701","https://openalex.org/W3217504142"],"abstract_inverted_index":{"Chemical":[0],"mechanical":[1],"polishing":[2,101,146],"of":[3,64,118,124,142],"copper":[4,17,68,80,100,145],"has":[5,83],"been":[6,84],"conducted":[7],"using":[8],"Fe":[9,40,54,108],"(":[10,41,55,109],"NO":[11,42,56,110],"3":[12,14,43,45,57,59,97,111,113,129],")":[13,44,58,112],"as":[15,21,27],"the":[16,22,28,36,62,87,116,133,143],"etchant,":[18],"benzotriazole":[19],"(BTA)":[20],"inhibitor,":[23],"and":[24,46],"\u03b3\u2010alumina":[25],"particles":[26],"abrasives.":[29],"The":[30,99,150],"dishing":[31,50,69,81],"effects":[32],"were":[33],"evaluated":[34],"for":[35],"slurries":[37],"containing":[38],"various":[39],"BTA":[47,66,72,88,122],"concentrations.":[48],"Copper":[49],"increases":[51],"dramatically":[52],"with":[53],"concentration":[60,73,89,123],"in":[61,79,115,132],"absence":[63,117],"BTA.":[65,119],"reduces":[67],"significantly":[70],"when":[71,86],"is":[74,90,103],"increased.":[75],"No":[76],"significant":[77],"improvement":[78],"reduction":[82],"observed":[85],"higher":[91,131],"than":[92],"0.005":[93,125],"mol":[94,126],"/":[95,127],"dm":[96,128],".":[98],"process":[102],"not":[104],"successful":[105],"at":[106],"high":[107],"concentrations":[114],"However,":[120],"a":[121,139],"or":[130],"slurry":[134],"formulation":[135],"can":[136],"lead":[137],"to":[138],"reliable":[140],"implementation":[141],"acidic":[144],"process.":[147],"\u00a9":[148],"2000":[149],"Electrochemical":[151],"Society.":[152],"All":[153],"rights":[154],"reserved.":[155]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}
