{"id":"https://openalex.org/W2089170777","doi":"https://doi.org/10.1063/1.349393","title":"Scanning magnetic force microscopy on Co/Pt magneto-optical disks","display_name":"Scanning magnetic force microscopy on Co/Pt magneto-optical disks","publication_year":1991,"publication_date":"1991-08-15","ids":{"openalex":"https://openalex.org/W2089170777","doi":"https://doi.org/10.1063/1.349393","mag":"2089170777"},"language":"en","primary_location":{"id":"doi:10.1063/1.349393","doi":"https://doi.org/10.1063/1.349393","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.349393","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051666319","display_name":"Hans W. van Kesteren","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. W. van Kesteren","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040203709","display_name":"Arie J. den Boef","orcid":"https://orcid.org/0000-0003-0303-4460","observed_orcids":["https://orcid.org/0000-0003-0303-4460"]},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A. J. den Boef","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084875835","display_name":"W. Bas Zeper","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"W. B. Zeper","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019258824","display_name":"J. H. M. Spruit","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"J. H. M. Spruit","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109213660","display_name":"Ben A. J. Jacobs","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"B. A. J. Jacobs","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090932471","display_name":"Peter F. Carcia","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1316910977","display_name":"DuPont (United States)","ror":"https://ror.org/03g3m1w62","country_code":"US","type":"company","lineage":["https://openalex.org/I1316910977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. F. Carcia","raw_affiliation_strings":["Central Research and Development Department, E. I. du Pont de Nemours and Company, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Research and Development Department, E. I. du Pont de Nemours and Company, Experimental Station, P.O. Box 80356, Wilmington, Delaware 19880-0356","institution_ids":["https://openalex.org/I1316910977"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":2.4871,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.89606049,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"70","issue":"4","first_page":"2413","last_page":"2422"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9717000126838684,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9717000126838684,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.006300000008195639,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magneto-optical-recording","display_name":"magneto-optical recording","score":0.8180000185966492},{"id":"https://openalex.org/keywords/co-pt-multilayers","display_name":"Co/Pt multilayers","score":0.9739999771118164},{"id":"https://openalex.org/keywords/magnetic-domains","display_name":"magnetic domains","score":0.75},{"id":"https://openalex.org/keywords/pt-underlayer","display_name":"Pt underlayer","score":0.9660000205039978},{"id":"https://openalex.org/keywords/laser-writing","display_name":"laser writing","score":0.5569999814033508},{"id":"https://openalex.org/keywords/magnetic-field-modulation","display_name":"magnetic field modulation","score":0.8669999837875366},{"id":"https://openalex.org/keywords/domain-structure","display_name":"domain structure","score":0.7319999933242798},{"id":"https://openalex.org/keywords/coercive-field","display_name":"coercive field","score":0.7639999985694885},{"id":"https://openalex.org/keywords/recording-conditions","display_name":"recording conditions","score":0.30399999022483826}],"concepts":[{"id":"https://openalex.org/C126530901","wikidata":"https://www.wikidata.org/wiki/Q432635","display_name":"Coercivity","level":2,"score":0.715898871421814},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.7057299613952637},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6507102847099304},{"id":"https://openalex.org/C182260160","wikidata":"https://www.wikidata.org/wiki/Q1069637","display_name":"Magnetic domain","level":4,"score":0.6006290316581726},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.564946711063385},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.5309063196182251},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.47912073135375977},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.47696220874786377},{"id":"https://openalex.org/C3020131476","wikidata":"https://www.wikidata.org/wiki/Q763745","display_name":"Magneto optical","level":3,"score":0.4130324721336365},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.40442293882369995},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.23419928550720215},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1746925413608551},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.10900327563285828},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10816565155982971},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.349393","doi":"https://doi.org/10.1063/1.349393","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.349393","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1965500954","https://openalex.org/W1967944127","https://openalex.org/W2010429308","https://openalex.org/W2010501464","https://openalex.org/W2014197186","https://openalex.org/W2014822729","https://openalex.org/W2018214234","https://openalex.org/W2021458230","https://openalex.org/W2025462684","https://openalex.org/W2035045169","https://openalex.org/W2037775721","https://openalex.org/W2051330391","https://openalex.org/W2054199464","https://openalex.org/W2059329887","https://openalex.org/W2063023948","https://openalex.org/W2065129659","https://openalex.org/W2076428080","https://openalex.org/W2078555603","https://openalex.org/W2125757327","https://openalex.org/W2168631642","https://openalex.org/W2319956359"],"related_works":["https://openalex.org/W2319956359","https://openalex.org/W2168193408","https://openalex.org/W1980645952","https://openalex.org/W1973525279","https://openalex.org/W2017304494","https://openalex.org/W3010220208","https://openalex.org/W2073721342","https://openalex.org/W2122960304","https://openalex.org/W2402786194","https://openalex.org/W2041909318"],"abstract_inverted_index":{"High":[0],"resolution":[1],"images":[2],"of":[3,20,39,51,57,64,114,137],"domains":[4,66],"written":[5,72],"on":[6,61,67,123,145],"Co/Pt":[7],"magneto-optical":[8],"disks":[9,31],"were":[10,71,85,96],"obtained":[11,97],"using":[12],"scanning":[13],"magnetic":[14,77],"force":[15],"microscopy.":[16],"The":[17,112],"key":[18],"advantage":[19],"this":[21],"technique":[22],"compared":[23],"to":[24],"electron":[25],"microscopy":[26],"techniques":[27],"is":[28],"that":[29],"regular":[30],"can":[32],"be":[33],"used.":[34],"We":[35],"studied":[36],"the":[37,40,49,52,55,62,65,68,115,124,128,131,135,138,146],"influence":[38,122],"multilayer":[41],"composition":[42],"and":[43,54,76,80,82,89,105,134,149],"preparation":[44,132],"conditions":[45,133,148],"as":[46,48],"well":[47],"effect":[50],"pregrooves":[53],"incorporation":[56],"a":[58,120,142],"Pt":[59,106],"underlayer,":[60],"structure":[63,136],"disk.":[69],"Marks":[70],"both":[73,93],"with":[74,100],"laser":[75],"field":[78,117],"modulation,":[79],"carrier":[81],"noise":[83],"levels":[84],"determined.":[86],"Regularly":[87],"shaped":[88],"subdomain-free":[90],"marks":[91],"for":[92,98],"writing":[94],"schemes":[95],"multilayers":[99],"about":[101],"4-\u00c5-thick":[102],"Co":[103],"layers":[104,107,140],"thinner":[108],"than":[109],"15":[110],"\u00c5.":[111],"magnitude":[113],"coercive":[116],"had":[118],"only":[119],"minor":[121],"domain":[125,150],"structure.":[126],"On":[127],"other":[129],"hand,":[130],"base":[139],"have":[141],"large":[143],"impact":[144],"recording":[147],"structures.":[151]},"counts_by_year":[],"updated_date":"2026-10-17T09:40:24.721904","created_date":"2016-06-24T00:00:00"}