{"id":"https://openalex.org/W2087026314","doi":"https://doi.org/10.1117/12.339841","title":"Advanced electronic phase stepped interferometry (EPSI) for detection and characterization of early-stage damage in aerospace materials","display_name":"Advanced electronic phase stepped interferometry (EPSI) for detection and characterization of early-stage damage in aerospace materials","publication_year":1999,"publication_date":"1999-02-08","ids":{"openalex":"https://openalex.org/W2087026314","doi":"https://doi.org/10.1117/12.339841","mag":"2087026314"},"language":"en","primary_location":{"id":"doi:10.1117/12.339841","doi":"https://doi.org/10.1117/12.339841","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.339841","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027781261","display_name":"James L. Blackshire","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James L. Blackshire","raw_affiliation_strings":["Univ. of Dayton (United States)","University of Dayton, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Dayton (United States)","institution_ids":["https://openalex.org/I127591826"]},{"raw_affiliation_string":"University of Dayton, USA","institution_ids":["https://openalex.org/I127591826"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038646284","display_name":"Russell C. Hardie","orcid":"https://orcid.org/0000-0002-1216-3865","observed_orcids":["https://orcid.org/0000-0002-1216-3865"]},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Russell C. Hardie","raw_affiliation_strings":["Univ. of Dayton (United States)","University of Dayton, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Dayton (United States)","institution_ids":["https://openalex.org/I127591826"]},{"raw_affiliation_string":"University of Dayton, USA","institution_ids":["https://openalex.org/I127591826"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111852413","display_name":"Maryam Younus","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. I. Younus","raw_affiliation_strings":["Univ. of Dayton (United States)","University of Dayton, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Dayton (United States)","institution_ids":["https://openalex.org/I127591826"]},{"raw_affiliation_string":"University of Dayton, USA","institution_ids":["https://openalex.org/I127591826"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I127591826"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27045566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3585","issue":null,"first_page":"134","last_page":"141"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/out-of-plane-displacement-measurement","display_name":"out-of-plane displacement measurement","score":0.8550000190734863},{"id":"https://openalex.org/keywords/surface-topography-measurement","display_name":"surface topography measurement","score":0.9559999704360962},{"id":"https://openalex.org/keywords/phase-unwrapping","display_name":"phase unwrapping","score":0.871999979019165},{"id":"https://openalex.org/keywords/noise-robustness","display_name":"noise robustness","score":0.9049999713897705},{"id":"https://openalex.org/keywords/image-processing-techniques","display_name":"image processing algorithms","score":0.7950000166893005},{"id":"https://openalex.org/keywords/aerospace-materials","display_name":"aerospace materials","score":0.9309999942779541},{"id":"https://openalex.org/keywords/ti-6al-4v","display_name":"Ti-6Al-4V","score":0.9810000061988831},{"id":"https://openalex.org/keywords/non-destructive-testing","display_name":"non-destructive testing","score":0.902999997138977}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8716448545455933},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6718142032623291},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.6460437774658203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5972477793693542},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.5277339220046997},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.507286012172699},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4288574457168579},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.41630133986473083},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22372320294380188},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.220879465341568},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2166059911251068},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.1965031623840332},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18193376064300537},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08753430843353271},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.339841","doi":"https://doi.org/10.1117/12.339841","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.339841","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1527364778","https://openalex.org/W1604455366","https://openalex.org/W2044171374","https://openalex.org/W2066612446","https://openalex.org/W2080636812","https://openalex.org/W2135252863"],"related_works":["https://openalex.org/W168883694","https://openalex.org/W2376737182","https://openalex.org/W1998838682","https://openalex.org/W1983215217","https://openalex.org/W2905972966","https://openalex.org/W2007875169","https://openalex.org/W2589996665","https://openalex.org/W2511989849","https://openalex.org/W289921203","https://openalex.org/W2054507785"],"abstract_inverted_index":{"An":[0],"advanced":[1,139],"electronic":[2],"phase":[3,67,102],"stepped":[4],"interferometry":[5],"(EPSI)":[6],"system":[7,82],"is":[8,42,70],"described":[9],"for":[10,18,131,158],"quantitative":[11],"out-of-plane":[12,46],"displacement":[13,47,95],"and":[14,35,48,65,75,85,89,127,151,162],"surface":[15,49],"topography":[16,50],"measurements":[17,51],"NDE":[19],"applications.":[20],"Image":[21],"processing":[22],"algorithms":[23,140],"were":[24],"developed":[25,84],"using":[26,87],"novel":[27],"techniques":[28],"to":[29,44,125],"extend":[30],"the":[31,53,111,120,142],"sensitivity":[32],"of":[33,55,93,113,137,144],"EPSI":[34,41,81,146],"provide":[36,45],"near":[37,152],"real-time":[38,153],"measurement":[39],"capability.":[40],"known":[43,94],"on":[52],"order":[54],"1/20-1/100":[56],"microns.":[57],"Noise":[58],"can":[59],"be":[60],"a":[61],"limiting":[62],"factor,":[63],"however,":[64],"robust":[66,98],"unwrapping,":[68],"which":[69],"required,":[71],"remains":[72],"an":[73],"open":[74],"active":[76],"research":[77],"area.":[78],"A":[79,97],"prototype":[80],"was":[83,105],"tested":[86],"simulated":[88],"real":[90],"data":[91],"sets":[92],"fields.":[96],"maximum-likelihood":[99],"binary-tree":[100],"(MLBT)":[101],"unwrapping":[103],"technique":[104],"developed,":[106],"providing":[107,148],"greater":[108],"robustness":[109,150],"in":[110,160],"presence":[112],"noise":[114],"than":[115],"standard":[116],"techniques.":[117],"In":[118],"addition,":[119],"MLBT":[121],"algorithm":[122],"lends":[123],"itself":[124],"efficient":[126],"fast":[128],"parallel":[129],"implementations":[130],"near-real":[132],"time":[133],"implementation.":[134],"The":[135],"use":[136],"these":[138],"improves":[141],"capabilities":[143],"existing":[145],"techniques,":[147],"more":[149],"measurements.":[154],"Results":[155],"are":[156],"provided":[157],"deformations":[159],"Ti-6Al-4V":[161],"Al2024-T3":[163],"aerospace":[164],"materials.":[165]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}