{"id":"https://openalex.org/W2085307133","doi":"https://doi.org/10.1115/1.2899295","title":"An Enhanced Quality Evaluation System for Continuous Manufacturing Processes, Part 1: Theory","display_name":"An Enhanced Quality Evaluation System for Continuous Manufacturing Processes, Part 1: Theory","publication_year":1990,"publication_date":"1990-02-01","ids":{"openalex":"https://openalex.org/W2085307133","doi":"https://doi.org/10.1115/1.2899295","mag":"2085307133"},"language":"en","primary_location":{"id":"doi:10.1115/1.2899295","doi":"https://doi.org/10.1115/1.2899295","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.2899295","pdf_url":null,"source":{"id":"https://openalex.org/S4210206908","display_name":"Journal of Engineering for Industry","issn_l":"0022-0817","issn":["0022-0817","2161-9433"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Engineering for Industry","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086180730","display_name":"Kevin J. Dooley","orcid":"https://orcid.org/0000-0001-9993-5161","observed_orcids":["https://orcid.org/0000-0001-9993-5161"]},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. J. Dooley","raw_affiliation_strings":["University of Minnesota, Twin Cities, Mechanical Engineering Department, 111 Church St. S. E., Minneapolis, MN 55455"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota, Twin Cities, Mechanical Engineering Department, 111 Church St. S. E., Minneapolis, MN 55455","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070289024","display_name":"S. G. Kapoor","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. G. Kapoor","raw_affiliation_strings":["University of Illinois, Urbana-Champaign, Mechanical and Industrial Engineering Department, 1206 W. Green St., Urbana, IL 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois, Urbana-Champaign, Mechanical and Industrial Engineering Department, 1206 W. Green St., Urbana, IL 61801","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7737,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.94140625,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"112","issue":"1","first_page":"57","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.04430000111460686,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality-evaluation-system","display_name":"quality evaluation system","score":0.8109999895095825},{"id":"https://openalex.org/keywords/stochastic-time-series-models","display_name":"stochastic time series models","score":0.7799999713897705},{"id":"https://openalex.org/keywords/change-detection","display_name":"change detection","score":0.6309999823570251},{"id":"https://openalex.org/keywords/process-mean-shift","display_name":"process mean shift","score":0.7089999914169312},{"id":"https://openalex.org/keywords/variance-shifts","display_name":"variance shifts","score":0.7929999828338623},{"id":"https://openalex.org/keywords/rule-base","display_name":"rule base","score":0.7979999780654907},{"id":"https://openalex.org/keywords/cusum-charts","display_name":"CUSUM charts","score":0.8519999980926514},{"id":"https://openalex.org/keywords/chi-square-test","display_name":"chi-square test","score":0.9010000228881836},{"id":"https://openalex.org/keywords/statistical-process-monitoring","display_name":"statistical process monitoring","score":0.5630000233650208}],"concepts":[{"id":"https://openalex.org/C178518018","wikidata":"https://www.wikidata.org/wiki/Q1024555","display_name":"CUSUM","level":2,"score":0.8533058166503906},{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.7614184617996216},{"id":"https://openalex.org/C190812933","wikidata":"https://www.wikidata.org/wiki/Q28923","display_name":"Chart","level":2,"score":0.6517872214317322},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5990664958953857},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.5678423047065735},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5670387148857117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5268563032150269},{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.5055358409881592},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.40734052658081055},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3479887843132019},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34019914269447327},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.268108069896698},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2647857069969177},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1115/1.2899295","doi":"https://doi.org/10.1115/1.2899295","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.2899295","pdf_url":null,"source":{"id":"https://openalex.org/S4210206908","display_name":"Journal of Engineering for Industry","issn_l":"0022-0817","issn":["0022-0817","2161-9433"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Engineering for Industry","raw_type":"journal-article"},{"id":"mag:2609822796","doi":null,"is_oa":false,"landing_page_url":"https://asu.pure.elsevier.com/en/publications/enhanced-quality-evaluation-system-for-continuous-manufacturing-p-3","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2609822796","https://openalex.org/W2075772774","https://openalex.org/W271779105","https://openalex.org/W2146801358","https://openalex.org/W2007262378","https://openalex.org/W1992506236","https://openalex.org/W2023957548","https://openalex.org/W2350436382","https://openalex.org/W2884131175","https://openalex.org/W2972665447"],"abstract_inverted_index":{"A":[0,45],"quality":[1,14,24],"evaluation":[2],"system":[3,21],"is":[4],"presented":[5],"which":[6],"gives":[7],"enhanced":[8],"information":[9],"about":[10],"the":[11,27,38,49,67,70,74,78,91,106],"nature":[12],"of":[13,26,51,60,66,90,105],"changes":[15],"in":[16,37],"continuous":[17],"manufacturing":[18],"processes.":[19],"The":[20,88],"monitors":[22],"a":[23],"characteristic":[25],"process":[28,39,86],"via":[29],"stochastic":[30],"time":[31,59],"series":[32],"models":[33],"and":[34,42,55,58,81,96],"detects":[35],"shifts":[36],"mean,":[40],"variance,":[41],"dynamic":[43],"parameters.":[44],"rule":[46,79],"base":[47,80],"classifies":[48],"type":[50],"change":[52,56,108],"that":[53],"occurred,":[54],"magnitude":[57],"occurrence":[61],"are":[62,99],"estimated.":[63],"Part":[64],"1":[65],"work":[68],"addresses":[69],"theoretical":[71],"issues":[72],"concerning":[73],"statistics":[75],"used":[76],"by":[77],"their":[82],"behavior":[83],"under":[84],"various":[85],"changes.":[87],"characteristics":[89],"cusum":[92],"chart,":[93,95],"autocorrelation":[94],"Chi-Square":[97],"test":[98],"derived":[100],"with":[101],"respect":[102],"to":[103],"each":[104],"possible":[107],"mechanisms.":[109]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}