{"id":"https://openalex.org/W2084749169","doi":"https://doi.org/10.1143/jjap.45.8805","title":"Development of Transient Measurement Method for investigating Thermoelectric Properties in High Temperature Region","display_name":"Development of Transient Measurement Method for investigating Thermoelectric Properties in High Temperature Region","publication_year":2006,"publication_date":"2006-11-01","ids":{"openalex":"https://openalex.org/W2084749169","doi":"https://doi.org/10.1143/jjap.45.8805","mag":"2084749169"},"language":"en","primary_location":{"id":"doi:10.1143/jjap.45.8805","doi":"https://doi.org/10.1143/jjap.45.8805","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.45.8805","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.45.8805/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://iopscience.iop.org/article/10.1143/JJAP.45.8805/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Shinichi Fujimoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I882656400","display_name":"Komatsu (Japan)","ror":"https://ror.org/03s23ay81","country_code":"JP","type":"company","lineage":["https://openalex.org/I882656400"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinichi Fujimoto","raw_affiliation_strings":["Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan","institution_ids":["https://openalex.org/I882656400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108628587","display_name":"H.T. Kaibe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I882656400","display_name":"Komatsu (Japan)","ror":"https://ror.org/03s23ay81","country_code":"JP","type":"company","lineage":["https://openalex.org/I882656400"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiromasa Kaibe","raw_affiliation_strings":["Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan","institution_ids":["https://openalex.org/I882656400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109976112","display_name":"Seijirou Sano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I882656400","display_name":"Komatsu (Japan)","ror":"https://ror.org/03s23ay81","country_code":"JP","type":"company","lineage":["https://openalex.org/I882656400"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seijirou Sano","raw_affiliation_strings":["Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Research Center, Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka, Kanagawa 254-8567, Japan","institution_ids":["https://openalex.org/I882656400"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109804678","display_name":"Tsuyoshi Kajitani","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tsuyoshi Kajitani","raw_affiliation_strings":["Department of Applied Physics, Graduate School of Engineering, Tohoku University, Aramaki Aoba, Aoba-ku, Sendai 980-8579, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, Graduate School of Engineering, Tohoku University, Aramaki Aoba, Aoba-ku, Sendai 980-8579, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2210,"currency":"USD","value_usd":2210},"apc_paid":null,"fwci":0.3841,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.55888714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"45","issue":"11R","first_page":"8805","last_page":"8805"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.9860000014305115},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9800000190734863},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.9660000205039978},{"id":"https://openalex.org/keywords/thermal-conductivity","display_name":"thermal conductivity","score":0.9990000128746033},{"id":"https://openalex.org/keywords/high-temperature-measurement","display_name":"high-temperature measurement","score":0.6439999938011169},{"id":"https://openalex.org/keywords/bismuth-telluride","display_name":"Bi2Te3","score":0.8849999904632568},{"id":"https://openalex.org/keywords/n-type-thermoelectric-materials","display_name":"n-type thermoelectric materials","score":0.871999979019165},{"id":"https://openalex.org/keywords/measurement-error-correction","display_name":"measurement error correction","score":0.7540000081062317}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8045143485069275},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.7659236192703247},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7205096483230591},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.6924868226051331},{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.6815584897994995},{"id":"https://openalex.org/C2985596519","wikidata":"https://www.wikidata.org/wiki/Q179635","display_name":"Heat flow","level":3,"score":0.555486798286438},{"id":"https://openalex.org/C102232406","wikidata":"https://www.wikidata.org/wiki/Q7783035","display_name":"Thermal conductivity measurement","level":3,"score":0.5467851758003235},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5331807732582092},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4955497980117798},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.48711705207824707},{"id":"https://openalex.org/C172120300","wikidata":"https://www.wikidata.org/wiki/Q1134348","display_name":"Volumetric flow rate","level":2,"score":0.4389733076095581},{"id":"https://openalex.org/C2778415886","wikidata":"https://www.wikidata.org/wiki/Q1823435","display_name":"Reflector (photography)","level":3,"score":0.4325045645236969},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.36059194803237915},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.34470945596694946},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.32727766036987305},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2842423617839813},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21191412210464478},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20573624968528748},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1257360279560089},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08852335810661316},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0828307569026947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0708169937133789},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C2982854487","wikidata":"https://www.wikidata.org/wiki/Q9128","display_name":"Light source","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1143/jjap.45.8805","doi":"https://doi.org/10.1143/jjap.45.8805","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.45.8805","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.45.8805/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1143/jjap.45.8805","doi":"https://doi.org/10.1143/jjap.45.8805","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.45.8805","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.45.8805/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2084749169.pdf","grobid_xml":"https://content.openalex.org/works/W2084749169.grobid-xml"},"referenced_works_count":3,"referenced_works":["https://openalex.org/W389868541","https://openalex.org/W2011552013","https://openalex.org/W2145601485"],"related_works":["https://openalex.org/W4387955987","https://openalex.org/W2023761509","https://openalex.org/W2922117116","https://openalex.org/W2621014593","https://openalex.org/W2030949230","https://openalex.org/W173811355","https://openalex.org/W2085215245","https://openalex.org/W4387758123","https://openalex.org/W2076862424","https://openalex.org/W2029357201"],"abstract_inverted_index":{"The":[0,26],"measurement":[1,7,78],"equipment":[2,79],"based":[3],"on":[4],"a":[5,36,40,47,84],"transient":[6],"method":[8],"was":[9,32,59,80],"fabricated":[10],"to":[11,23],"characterize":[12],"Seebeck":[13],"coefficient,":[14],"resistivity,":[15],"and":[16,39,46,82],"thermal":[17,37,41],"conductivity":[18],"simultaneously":[19],"from":[20],"room":[21],"temperature":[22],"573":[24],"K.":[25],"rate":[27],"of":[28,67],"ambient":[29],"heat":[30],"flow":[31],"reduced":[33],"by":[34],"employing":[35],"anchor":[38],"reflector":[42],"at":[43],"elevated":[44],"temperatures,":[45],"model":[48],"for":[49,52],"suitable":[50],"corrections":[51],"compensating":[53],"remaining":[54],"errors":[55],"in":[56],"data":[57],"evaluation":[58],"studied.":[60],"Using":[61],"n-type":[62],"Bi2Te3-based":[63],"samples,":[64],"the":[65,71],"comparison":[66],"thermoelectric":[68],"properties":[69],"with":[70],"results":[72],"obtained":[73],"using":[74],"another":[75],"commercial":[76],"conventional":[77],"performed":[81],"showed":[83],"very":[85],"good":[86],"agreement.":[87]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}