{"id":"https://openalex.org/W2081845239","doi":"https://doi.org/10.1016/j.mee.2011.06.015","title":"Temperature dependence of Al/Ti-based Ohmic contact to GaN devices: HEMT and MOSFET","display_name":"Temperature dependence of Al/Ti-based Ohmic contact to GaN devices: HEMT and MOSFET","publication_year":2011,"publication_date":"2011-06-29","ids":{"openalex":"https://openalex.org/W2081845239","doi":"https://doi.org/10.1016/j.mee.2011.06.015","mag":"2081845239"},"language":"en","primary_location":{"id":"doi:10.1016/j.mee.2011.06.015","doi":"https://doi.org/10.1016/j.mee.2011.06.015","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mee.2011.06.015","pdf_url":null,"source":{"id":"https://openalex.org/S158028765","display_name":"Microelectronic Engineering","issn_l":"0167-9317","issn":["0167-9317","1873-5568"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronic Engineering","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051334872","display_name":"A. Fontser\u00e8","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"A. Fontser\u00e8","raw_affiliation_strings":["IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066438326","display_name":"Amador P\u00e9rez\u2010Tom\u00e1s","orcid":"https://orcid.org/0000-0002-0551-3142","observed_orcids":["https://orcid.org/0000-0002-0551-3142"]},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. P\u00e9rez-Tom\u00e1s","raw_affiliation_strings":["IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070144824","display_name":"Marcel Placidi","orcid":"https://orcid.org/0000-0001-5684-9669","observed_orcids":["https://orcid.org/0000-0001-5684-9669"]},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Placidi","raw_affiliation_strings":["IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067562765","display_name":"P. Fernand\u00e9z Martin\u00e9z","orcid":"https://orcid.org/0000-0002-7818-6971","observed_orcids":["https://orcid.org/0000-0002-7818-6971","https://orcid.org/0000-0001-5155-3420","https://orcid.org/0009-0001-1738-7729"]},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"P. Fern\u00e1ndez-Mart\u00ednez","raw_affiliation_strings":["IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109813554","display_name":"N. Baron","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210124361","display_name":"Centre de Recherche sur l'H\u00e9t\u00e9ro-Epitaxie et ses Applications","ror":"https://ror.org/03y8mpv07","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I201841394","https://openalex.org/I4210098836","https://openalex.org/I4210124361"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Baron","raw_affiliation_strings":["CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France","PICOGIGA International, Place Marcel Rebuffat, Z.A. de Courtaboeuf 7, 91140 Villejust, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210124361"]},{"raw_affiliation_string":"PICOGIGA International, Place Marcel Rebuffat, Z.A. de Courtaboeuf 7, 91140 Villejust, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022874034","display_name":"S\u00e9bastien Chenot","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210124361","display_name":"Centre de Recherche sur l'H\u00e9t\u00e9ro-Epitaxie et ses Applications","ror":"https://ror.org/03y8mpv07","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I201841394","https://openalex.org/I4210098836","https://openalex.org/I4210124361"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Chenot","raw_affiliation_strings":["CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210124361"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011220704","display_name":"Yvon Cordier","orcid":"https://orcid.org/0000-0003-3720-9409","observed_orcids":["https://orcid.org/0000-0003-3720-9409"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210124361","display_name":"Centre de Recherche sur l'H\u00e9t\u00e9ro-Epitaxie et ses Applications","ror":"https://ror.org/03y8mpv07","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I201841394","https://openalex.org/I4210098836","https://openalex.org/I4210124361"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Y. Cordier","raw_affiliation_strings":["CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210124361"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110090245","display_name":"J. C. Moreno","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210124361","display_name":"Centre de Recherche sur l'H\u00e9t\u00e9ro-Epitaxie et ses Applications","ror":"https://ror.org/03y8mpv07","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I201841394","https://openalex.org/I4210098836","https://openalex.org/I4210124361"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.C. Moreno","raw_affiliation_strings":["CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRHEA-CNRS, rue Bernard Gr\u00e9gory, Sophia Antipolis, 06560 Valbonne, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210124361"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011856820","display_name":"Peter Michael Gammon","orcid":"https://orcid.org/0000-0002-8819-3796","observed_orcids":["https://orcid.org/0000-0002-8819-3796"]},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"P.M. Gammon","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry CV4 7AL, England, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry CV4 7AL, England, UK","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049051360","display_name":"Michael R. Jennings","orcid":"https://orcid.org/0000-0003-3270-0805","observed_orcids":["https://orcid.org/0000-0003-3270-0805"]},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M.R. Jennings","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry CV4 7AL, England, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry CV4 7AL, England, UK","institution_ids":["https://openalex.org/I39555362"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5051334872"],"corresponding_institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210160312"],"apc_list":{"value":2860,"currency":"USD","value_usd":2860},"apc_paid":null,"fwci":1.4448,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.82280931,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"88","issue":"10","first_page":"3140","last_page":"3144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9541000127792358,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9541000127792358,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.040699999779462814,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"gallium nitride","score":0.9089999794960022},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.8119999766349792},{"id":"https://openalex.org/keywords/sheet-resistance","display_name":"sheet resistance","score":0.7929999828338623},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"contact resistance","score":0.9980000257492065},{"id":"https://openalex.org/keywords/high-electron-mobility-transistors","display_name":"high electron mobility transistors","score":0.8360000252723694},{"id":"https://openalex.org/keywords/algan-gan-heterostructures","display_name":"AlGaN/GaN heterostructures","score":0.8830000162124634},{"id":"https://openalex.org/keywords/n-gan","display_name":"n-type GaN","score":0.5049999952316284}],"concepts":[{"id":"https://openalex.org/C138230450","wikidata":"https://www.wikidata.org/wiki/Q2016597","display_name":"Ohmic contact","level":3,"score":0.9294719696044922},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7683508396148682},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.7187478542327881},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7102099657058716},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.7045031189918518},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.6368062496185303},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5770713090896606},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.5573272705078125},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5106516480445862},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.41168519854545593},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17716363072395325},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1704922318458557},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12324801087379456},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.11250817775726318},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.mee.2011.06.015","doi":"https://doi.org/10.1016/j.mee.2011.06.015","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mee.2011.06.015","pdf_url":null,"source":{"id":"https://openalex.org/S158028765","display_name":"Microelectronic Engineering","issn_l":"0167-9317","issn":["0167-9317","1873-5568"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronic Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1963878533","https://openalex.org/W1968439198","https://openalex.org/W1978079493","https://openalex.org/W1983899757","https://openalex.org/W1985547241","https://openalex.org/W1997630644","https://openalex.org/W1998005932","https://openalex.org/W2007193978","https://openalex.org/W2009663308","https://openalex.org/W2012564138","https://openalex.org/W2041238156","https://openalex.org/W2043968738","https://openalex.org/W2045116035","https://openalex.org/W2047295367","https://openalex.org/W2049579729","https://openalex.org/W2049587269","https://openalex.org/W2057499416","https://openalex.org/W2058643389","https://openalex.org/W2067470011","https://openalex.org/W2074419573","https://openalex.org/W2086103622","https://openalex.org/W2089924165","https://openalex.org/W2141981815","https://openalex.org/W2164299968","https://openalex.org/W4212833184","https://openalex.org/W4251361952"],"related_works":["https://openalex.org/W2089924165","https://openalex.org/W2148471426","https://openalex.org/W1963878533","https://openalex.org/W1984395040","https://openalex.org/W4391592468","https://openalex.org/W2794037016","https://openalex.org/W2565679973","https://openalex.org/W2781851688","https://openalex.org/W2373893962","https://openalex.org/W2044426106"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}