{"id":"https://openalex.org/W2081649129","doi":"https://doi.org/10.1117/12.604142","title":"A new approach to wideband scene projection","display_name":"A new approach to wideband scene projection","publication_year":2005,"publication_date":"2005-03-28","ids":{"openalex":"https://openalex.org/W2081649129","doi":"https://doi.org/10.1117/12.604142","mag":"2081649129"},"language":"en","primary_location":{"id":"doi:10.1117/12.604142","doi":"https://doi.org/10.1117/12.604142","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.604142","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056840459","display_name":"Russell M. Kurtz","orcid":"https://orcid.org/0000-0002-4072-7808","observed_orcids":["https://orcid.org/0000-0002-4072-7808"]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Russell M. Kurtz","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112096999","display_name":"Alexander V. Parfenov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander V. Parfenov","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109940431","display_name":"Ranjit D. Pradhan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ranjit D. Pradhan","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079709219","display_name":"Tin M. Aye","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tin M. Aye","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080852959","display_name":"Gajendra D. Savant","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gajendra D. Savant","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091568545","display_name":"Nay Tun","orcid":"https://orcid.org/0009-0000-9058-6807","observed_orcids":["https://orcid.org/0009-0000-9058-6807"]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nay Tun","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010451302","display_name":"Tin Win","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tin M. Win","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015496181","display_name":"Jason Holmstedt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135612","display_name":"Physical Optics Corporation","ror":"https://ror.org/037pmhh38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210135612"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jason Holmstedt","raw_affiliation_strings":["Physical Optics Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Optics Corp. (United States)","institution_ids":["https://openalex.org/I4210135612"]}]},{"author_position":"last","author":{"id":null,"display_name":"Axel Schindler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Axel Schindler","raw_affiliation_strings":["University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.23912222,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"5813","issue":null,"first_page":"312","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.43970000743865967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.43970000743865967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.13619999587535858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.08829999715089798,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infrared-scene-generation","display_name":"infrared scene generation","score":0.5379999876022339},{"id":"https://openalex.org/keywords/visible-and-near-infrared-imaging","display_name":"visible and near-infrared imaging","score":0.5400000214576721},{"id":"https://openalex.org/keywords/mid-wave-infrared","display_name":"mid-wave infrared","score":0.7319999933242798},{"id":"https://openalex.org/keywords/long-wave-infrared","display_name":"long-wave infrared","score":1.0},{"id":"https://openalex.org/keywords/hardware-in-the-loop-testing","display_name":"hardware-in-the-loop testing","score":0.9490000009536743}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6235926747322083},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6154680252075195},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.4900561571121216},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.45753246545791626},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3571678400039673},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.32415956258773804},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10771268606185913},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10629412531852722},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09746277332305908}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.604142","doi":"https://doi.org/10.1117/12.604142","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.604142","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1994515983","https://openalex.org/W2012927361","https://openalex.org/W2018788080","https://openalex.org/W2019758333","https://openalex.org/W2063105742","https://openalex.org/W2067020739","https://openalex.org/W2072432877","https://openalex.org/W2082836432","https://openalex.org/W2087778848"],"related_works":["https://openalex.org/W2044024257","https://openalex.org/W2052369497","https://openalex.org/W2013995543","https://openalex.org/W2039937915","https://openalex.org/W1989296244","https://openalex.org/W1990458101","https://openalex.org/W1964993489","https://openalex.org/W1967926567","https://openalex.org/W2073720373","https://openalex.org/W2009284585"],"abstract_inverted_index":{"Advances":[0],"in":[1,119,125,133,184,205,236,251],"the":[2,12,120,155,175,198,206,252],"development":[3],"of":[4,15,40,47,70,196,234,249],"imaging":[5],"sensors":[6],"depend":[7],"upon":[8],"(among":[9],"other":[10],"things)":[11],"testing":[13],"capabilities":[14],"research":[16],"laboratories.":[17],"Sensors":[18],"and":[19,29,60,63,77,85,106,159,174,191,211,227,230],"sensor":[20],"suites":[21],"need":[22],"to":[23,35,88,144,152,166,208,218,231],"be":[24,232],"rigorously":[25],"tested":[26],"under":[27],"laboratory":[28],"field":[30],"conditions":[31],"before":[32],"being":[33],"put":[34],"use.":[36],"Real-time":[37],"dynamic":[38],"simulation":[39],"real":[41,55],"targets":[42,56],"is":[43,140,150,171,179,203,216],"a":[44,220,237],"key":[45],"component":[46],"such":[48],"testing,":[49],"as":[50],"actual":[51],"full-scale":[52],"tests":[53],"with":[54,254],"are":[57,64,113,116],"extremely":[58],"expensive":[59],"time":[61],"consuming":[62],"not":[65],"suitable":[66,224],"for":[67,82,109,225],"early":[68],"stages":[69],"development.":[71],"Dynamic":[72],"projectors":[73],"simulate":[74,89],"tactical":[75,90],"images":[76],"scenes.":[78],"Several":[79],"technologies":[80,112],"exist":[81],"projecting":[83,104],"IR":[84],"visible":[86,189,207,253],"scenes":[87],"battlefield":[91],"patterns":[92],"-":[93],"large":[94],"format":[95],"resistor":[96],"arrays,":[97,108,229],"liquid":[98],"crystal":[99],"light":[100],"valves,":[101],"Eidophor":[102],"type":[103],"systems,":[105],"micromirror":[107],"example.":[110],"These":[111],"slow,":[114],"or":[115,124],"restricted":[117],"either":[118],"modulator":[121],"array":[122],"size":[123],"spectral":[126],"bandwidth.":[127],"In":[128],"addition,":[129],"many":[130],"operate":[131,153],"only":[132],"specific":[134],"bandwidth":[135],"regions.":[136],"Physical":[137],"Optics":[138],"Corporation":[139],"developing":[141],"an":[142,244],"alternative":[143],"current":[145],"scene":[146,214],"projectors.":[147],"This":[148,213],"projector":[149,215],"designed":[151,176,217],"over":[154],"visible,":[156],"near-IR,":[157,209],"MWIR,":[158,210],"LWIR":[160],"spectra":[161],"simultaneously,":[162],"from":[163],"300":[164],"nm":[165],"20":[167],"\u03bcm.":[168],"The":[169],"resolution":[170],"2":[172],"megapixels,":[173],"frame":[177],"rate":[178],"120":[180],"Hz":[181,183],"(40":[182],"color).":[185],"To":[186],"ensure":[187],"high-resolution":[188],"imagery":[190],"pixel-to-pixel":[192],"apparent":[193],"temperature":[194],"difference":[195],"100\u00b0C,":[197],"contrast":[199,248],"between":[200],"adjacent":[201],"pixels":[202],">100:1":[204],"LWIR.":[212],"produce":[219],"flickerless":[221],"analog":[222],"signal,":[223],"staring":[226],"scanning":[228],"capable":[233],"operation":[235],"hardware-in-the-loop":[238],"test":[239],"system.":[240],"Tests":[241],"performed":[242],"on":[243],"initial":[245],"prototype":[246],"demonstrated":[247],"250:1":[250],"non-optimized":[255],"hardware.":[256]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-02T10:15:12.560889","created_date":"2016-06-24T00:00:00"}