{"id":"https://openalex.org/W2081363469","doi":"https://doi.org/10.1109/proc.1965.4043","title":"Resistors having stair-shape characteristics","display_name":"Resistors having stair-shape characteristics","publication_year":1965,"publication_date":"1965-01-01","ids":{"openalex":"https://openalex.org/W2081363469","doi":"https://doi.org/10.1109/proc.1965.4043","mag":"2081363469"},"language":"en","primary_location":{"id":"doi:10.1109/proc.1965.4043","doi":"https://doi.org/10.1109/proc.1965.4043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/proc.1965.4043","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","ccf-a","cwts-core","dongbi-b","jufo-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075389238","display_name":"H.E. Kallmann","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"H.E. Kallmann","raw_affiliation_strings":["417 Riverside Drive, New York, N.Y"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"417 Riverside Drive, New York, N.Y","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5075389238"],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.6849,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.74008223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"53","issue":"7","first_page":"763","last_page":"763"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.9179999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.9179999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12899","display_name":"Engineering and Technology Innovations","score":0.025200000032782555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.020600000396370888,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistors","display_name":"resistors","score":0.8640000224113464},{"id":"https://openalex.org/keywords/current-voltage-characteristics","display_name":"current-voltage characteristics","score":0.675000011920929},{"id":"https://openalex.org/keywords/nonlinear-resistors","display_name":"nonlinear resistors","score":0.4580000042915344}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7099714875221252},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3937719762325287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21587106585502625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20552954077720642},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09453779458999634}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/proc.1965.4043","doi":"https://doi.org/10.1109/proc.1965.4043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/proc.1965.4043","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","ccf-a","cwts-core","dongbi-b","jufo-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2005894230"],"related_works":["https://openalex.org/W2058371415","https://openalex.org/W2069467466","https://openalex.org/W4245145545","https://openalex.org/W6996259789","https://openalex.org/W935486896","https://openalex.org/W943034499","https://openalex.org/W2048656588","https://openalex.org/W2158740383","https://openalex.org/W1979322506","https://openalex.org/W7019839681"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}