{"id":"https://openalex.org/W2081100189","doi":"https://doi.org/10.1109/mwsym.2014.6848287","title":"Frequency scalable large signal transistor behavioral model based on admittance domain formulation","display_name":"Frequency scalable large signal transistor behavioral model based on admittance domain formulation","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2081100189","doi":"https://doi.org/10.1109/mwsym.2014.6848287","mag":"2081100189"},"language":"en","primary_location":{"id":"doi:10.1109/mwsym.2014.6848287","doi":"https://doi.org/10.1109/mwsym.2014.6848287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwsym.2014.6848287","pdf_url":null,"source":{"id":"https://openalex.org/S4210185519","display_name":"IEEE MTT-S International Microwave Symposium digest","issn_l":"0149-645X","issn":["0149-645X","2576-7216"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE MTT-S International Microwave Symposium (IMS2014)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022919878","display_name":"M. Koh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M. Koh","raw_affiliation_strings":["School of Engineering, Cardiff University, CF24 3AA, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, Cardiff University, CF24 3AA, United Kingdom","institution_ids":["https://openalex.org/I79510175"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000795871","display_name":"James J. Bell","orcid":"https://orcid.org/0000-0002-4815-2199","observed_orcids":["https://orcid.org/0000-0002-4815-2199"]},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. J. Bell","raw_affiliation_strings":["School of Engineering, Cardiff University, CF24 3AA, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, Cardiff University, CF24 3AA, United Kingdom","institution_ids":["https://openalex.org/I79510175"]}]},{"author_position":"middle","author":{"id":null,"display_name":"D. Williams","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Williams","raw_affiliation_strings":["M/A-COM Technology Solutions, Belfast, BT9 5NW, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"M/A-COM Technology Solutions, Belfast, BT9 5NW, United Kingdom","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064487357","display_name":"A. Patterson","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Patterson","raw_affiliation_strings":["M/A-COM Technology Solutions, Belfast, BT9 5NW, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"M/A-COM Technology Solutions, Belfast, BT9 5NW, United Kingdom","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059942771","display_name":"J. Lees","orcid":"https://orcid.org/0000-0002-6217-7552","observed_orcids":["https://orcid.org/0000-0002-6217-7552"]},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. Lees","raw_affiliation_strings":["School of Engineering, Cardiff University, CF24 3AA, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, Cardiff University, CF24 3AA, United Kingdom","institution_ids":["https://openalex.org/I79510175"]}]},{"author_position":"middle","author":{"id":null,"display_name":"D. E. Root","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. E. Root","raw_affiliation_strings":["Agilent Technologies, Inc., 1400 Fountaingrove Parkway, Santa Rosa, CA 95403, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Inc., 1400 Fountaingrove Parkway, Santa Rosa, CA 95403, USA","institution_ids":["https://openalex.org/I138285227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070199574","display_name":"P.J. Tasker","orcid":"https://orcid.org/0000-0002-6760-7830","observed_orcids":["https://orcid.org/0000-0002-6760-7830"]},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"P. J. Tasker","raw_affiliation_strings":["School of Engineering, Cardiff University, CF24 3AA, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, Cardiff University, CF24 3AA, United Kingdom","institution_ids":["https://openalex.org/I79510175"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0427,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.86798851,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.003599999938160181,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gan-hfet","display_name":"GaN HFET","score":0.9430000185966492},{"id":"https://openalex.org/keywords/load-pull-measurement","display_name":"load-pull measurement","score":0.7429999709129333},{"id":"https://openalex.org/keywords/model-coefficients","display_name":"model coefficients","score":0.45899999141693115}],"concepts":[{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.7720580697059631},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.7688714861869812},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6539474725723267},{"id":"https://openalex.org/C78639753","wikidata":"https://www.wikidata.org/wiki/Q3318160","display_name":"Behavioral modeling","level":2,"score":0.6516687870025635},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6223762035369873},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.577416718006134},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5532368421554565},{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.5012404918670654},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48780468106269836},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.47950679063796997},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.46730729937553406},{"id":"https://openalex.org/C163175372","wikidata":"https://www.wikidata.org/wiki/Q3339222","display_name":"Linear model","level":2,"score":0.4117637574672699},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.320565789937973},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22621020674705505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21360230445861816},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16991117596626282},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mwsym.2014.6848287","doi":"https://doi.org/10.1109/mwsym.2014.6848287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwsym.2014.6848287","pdf_url":null,"source":{"id":"https://openalex.org/S4210185519","display_name":"IEEE MTT-S International Microwave Symposium digest","issn_l":"0149-645X","issn":["0149-645X","2576-7216"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE MTT-S International Microwave Symposium (IMS2014)","raw_type":"proceedings-article"},{"id":"pmh:oai:https://orca.cardiff.ac.uk:64356","doi":null,"is_oa":false,"landing_page_url":"https://orca.cardiff.ac.uk/id/eprint/64356/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401195","display_name":"ORCA Online Research @Cardiff (Cardiff University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79510175","host_organization_name":"Cardiff University","host_organization_lineage":["https://openalex.org/I79510175"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2000472712","https://openalex.org/W2104100206","https://openalex.org/W2115142907","https://openalex.org/W2125232663","https://openalex.org/W2153746256","https://openalex.org/W2156341695","https://openalex.org/W2171708310","https://openalex.org/W3145245125","https://openalex.org/W3151455936"],"related_works":["https://openalex.org/W2485811226","https://openalex.org/W2560437161","https://openalex.org/W7000819130","https://openalex.org/W2614726604","https://openalex.org/W2247006785","https://openalex.org/W2101543247","https://openalex.org/W1977514563","https://openalex.org/W4317555571","https://openalex.org/W2761939455","https://openalex.org/W333192344"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"the":[3,46,58,68],"first":[4],"formulation":[5],"and":[6],"approach":[7],"that":[8,39,57],"enables":[9],"measurement":[10],"based":[11],"non-linear":[12,63],"behavioral":[13,42],"look-up":[14],"table":[15],"transistor":[16],"models":[17,43],"to":[18,33],"be":[19],"frequency":[20,40,50],"scalable.":[21],"The":[22],"experimental":[23],"results":[24,55],"on":[25],"a":[26],"M/A-COM":[27],"GaN":[28],"HFET":[29],"from":[30],"2":[31],"GHz":[32],"8":[34],"GHz,":[35],"support":[36],"theoretical":[37],"analysis":[38],"domain":[41,48],"defined":[44],"in":[45],"admittance":[47],"have":[49],"scalable":[51],"model":[52,59],"coefficients.":[53],"Load-pull":[54],"indicate":[56],"can":[60],"accurately":[61],"predict":[62],"behavior":[64],"at":[65],"frequencies":[66],"where":[67],"large":[69],"signal":[70],"measurements":[71],"were":[72],"not":[73],"performed.":[74]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}