{"id":"https://openalex.org/W2078620282","doi":"https://doi.org/10.1063/1.3155800","title":"Thermoelectric transport properties of highly oriented FeSb2 thin films","display_name":"Thermoelectric transport properties of highly oriented FeSb2 thin films","publication_year":2009,"publication_date":"2009-08-01","ids":{"openalex":"https://openalex.org/W2078620282","doi":"https://doi.org/10.1063/1.3155800","mag":"2078620282"},"language":"en","primary_location":{"id":"doi:10.1063/1.3155800","doi":"https://doi.org/10.1063/1.3155800","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3155800","pdf_url":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3155800/13758470/033710_1_online.pdf","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3155800/13758470/033710_1_online.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022366791","display_name":"Ye Sun","orcid":"https://orcid.org/0000-0002-5795-6981","observed_orcids":["https://orcid.org/0000-0002-5795-6981"]},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Y. Sun","raw_affiliation_strings":["University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046320339","display_name":"Simon Johnsen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"S. Johnsen","raw_affiliation_strings":["University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036498106","display_name":"Per Eklund","orcid":"https://orcid.org/0000-0003-1785-0864","observed_orcids":["https://orcid.org/0000-0003-1785-0864"]},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]},{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK","SE"],"is_corresponding":false,"raw_author_name":"P. Eklund","raw_affiliation_strings":["Link\u00f6ping University 3 Department of Physics, Chemistry, and Biology (IFM), Thin Film Physics Division, , SE-581 83 Link\u00f6ping, Sweden","University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Link\u00f6ping University 3 Department of Physics, Chemistry, and Biology (IFM), Thin Film Physics Division, , SE-581 83 Link\u00f6ping, Sweden","institution_ids":["https://openalex.org/I102134673"]},{"raw_affiliation_string":"University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064141350","display_name":"Michael Sillassen","orcid":"https://orcid.org/0000-0003-2387-9209","observed_orcids":["https://orcid.org/0000-0003-2387-9209"]},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"M. Sillassen","raw_affiliation_strings":["University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110316427","display_name":"J\u00f8rgen B\u00f8ttiger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"J. B\u00f8ttiger","raw_affiliation_strings":["University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Aarhus 2 Department of Physics and Astronomy and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022794775","display_name":"Niels Oeschler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210105091","display_name":"Max Planck Institute for Chemical Physics of Solids","ror":"https://ror.org/01c997669","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210105091"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"N. Oeschler","raw_affiliation_strings":["Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany","institution_ids":["https://openalex.org/I4210105091"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003958525","display_name":"Peijie Sun","orcid":"https://orcid.org/0000-0003-1504-5634","observed_orcids":["https://orcid.org/0000-0003-1504-5634"]},"institutions":[{"id":"https://openalex.org/I4210105091","display_name":"Max Planck Institute for Chemical Physics of Solids","ror":"https://ror.org/01c997669","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210105091"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Sun","raw_affiliation_strings":["Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany","institution_ids":["https://openalex.org/I4210105091"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026689191","display_name":"F. Steglich","orcid":"https://orcid.org/0000-0001-9774-7036","observed_orcids":["https://orcid.org/0000-0001-9774-7036"]},"institutions":[{"id":"https://openalex.org/I4210105091","display_name":"Max Planck Institute for Chemical Physics of Solids","ror":"https://ror.org/01c997669","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210105091"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Steglich","raw_affiliation_strings":["Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Max Planck Institute for Chemical Physics of Solids 4 , 01187 Dresden, Germany","institution_ids":["https://openalex.org/I4210105091"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014454318","display_name":"Bo B. Iversen","orcid":"https://orcid.org/0000-0002-4632-1024","observed_orcids":["https://orcid.org/0000-0002-4632-1024"]},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"B. B. Iversen","raw_affiliation_strings":["University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Aarhus 1 Centre for Energy Materials, Department of Chemistry and iNANO, , DK-8000 Aarhus C, Denmark","institution_ids":["https://openalex.org/I204337017"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":1.8378,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.8454899,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"106","issue":"3","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fesb2","display_name":"FeSb2","score":0.9879999756813049},{"id":"https://openalex.org/keywords/thermoelectric-transport","display_name":"thermoelectric transport","score":0.7900000214576721},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.8159999847412109},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.7409999966621399},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.6309999823570251},{"id":"https://openalex.org/keywords/hall-mobility","display_name":"Hall mobility","score":0.890999972820282},{"id":"https://openalex.org/keywords/carrier-concentration","display_name":"carrier concentration","score":0.9649999737739563},{"id":"https://openalex.org/keywords/sputtered-thin-films","display_name":"sputtered thin films","score":0.6899999976158142},{"id":"https://openalex.org/keywords/textured-films","display_name":"textured films","score":0.6050000190734863}],"concepts":[{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.8176928758621216},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.7540868520736694},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7005113959312439},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.6899684071540833},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.6229078769683838},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.602453351020813},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.5672896504402161},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.5496776700019836},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5458120107650757},{"id":"https://openalex.org/C2779870107","wikidata":"https://www.wikidata.org/wiki/Q43010","display_name":"Quartz","level":2,"score":0.5353216528892517},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.462979257106781},{"id":"https://openalex.org/C73922627","wikidata":"https://www.wikidata.org/wiki/Q754943","display_name":"Single crystal","level":2,"score":0.4576278328895569},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.45615923404693604},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.4321989119052887},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26549142599105835},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.1837243139743805},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.17916688323020935},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.16374292969703674},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10824120044708252},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.08900222182273865},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07799500226974487},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.1063/1.3155800","doi":"https://doi.org/10.1063/1.3155800","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3155800","pdf_url":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3155800/13758470/033710_1_online.pdf","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},{"id":"pmh:oai:DiVA.org:liu-20403","doi":null,"is_oa":true,"landing_page_url":"http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-20403","pdf_url":null,"source":{"id":"https://openalex.org/S4306401559","display_name":"KTH Publication Database DiVA (KTH Royal Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I86987016","host_organization_name":"KTH Royal Institute of Technology","host_organization_lineage":["https://openalex.org/I86987016"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:edoc.mpg.de:435804","doi":null,"is_oa":false,"landing_page_url":"http://edoc.mpg.de/435804","pdf_url":null,"source":{"id":"https://openalex.org/S4406922265","display_name":"Max Planck Institute for Plasma Physics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Applied Physics, v.106, 033710-1-033710-4 (2009)","raw_type":"Article"},{"id":"pmh:oai:escidoc.org:escidoc:1918063","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11858/00-001M-0000-0015-2646-0","pdf_url":null,"source":{"id":"https://openalex.org/S7407052962","display_name":"Max Planck Digital Library","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210088280","host_organization_name":"Max Planck Digital Library","host_organization_lineage":["https://openalex.org/I4210088280"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:pure.atira.dk:publications/964ddb90-0b23-11df-b95d-000ea68e967b","doi":null,"is_oa":false,"landing_page_url":"https://pure.au.dk/portal/en/publications/964ddb90-0b23-11df-b95d-000ea68e967b","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sun, Y, Johnsen, S, Eklund, P, Sillassen, M B, B\u00f8ttiger, J, Oeschler, N, Sun, P, Steglich, F & Iversen, B B 2009, 'Thermoelectric transport properties of highly oriented FeSb 2 thin films', Journal of Applied Physics, vol. 106, no. 033710, pp. 1-4. https://doi.org/10.1063/1.3155800","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:pure.mpg.de:item_1918063","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11858/00-001M-0000-0015-2646-0","pdf_url":null,"source":{"id":"https://openalex.org/S4306400654","display_name":"MPG.PuRe (Max Planck Society)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I149899117","host_organization_name":"Max Planck Society","host_organization_lineage":["https://openalex.org/I149899117"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Applied Physics","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1063/1.3155800","doi":"https://doi.org/10.1063/1.3155800","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3155800","pdf_url":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.3155800/13758470/033710_1_online.pdf","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321030","display_name":"VINNOVA","ror":"https://ror.org/01kd5m353"},{"id":"https://openalex.org/F4320321999","display_name":"Lundbeckfonden","ror":"https://ror.org/03hz8wd80"},{"id":"https://openalex.org/F4320322581","display_name":"Vetenskapsr\u00e5det","ror":"https://ror.org/03zttf063"},{"id":"https://openalex.org/F4320327918","display_name":"H. Lundbeck A/S","ror":"https://ror.org/0564cd633"},{"id":"https://openalex.org/F4320335354","display_name":"Strategic Research Council","ror":"https://ror.org/02vtq1a86"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2078620282.pdf","grobid_xml":"https://content.openalex.org/works/W2078620282.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1966302961","https://openalex.org/W1987665045","https://openalex.org/W1994715177","https://openalex.org/W2000625521","https://openalex.org/W2001139162","https://openalex.org/W2008375944","https://openalex.org/W2010734961","https://openalex.org/W2013466497","https://openalex.org/W2017173358","https://openalex.org/W2019189906","https://openalex.org/W2035641663","https://openalex.org/W2042056247","https://openalex.org/W2043388011","https://openalex.org/W2067297550","https://openalex.org/W2070093297","https://openalex.org/W2082409063","https://openalex.org/W2086285274","https://openalex.org/W2090813637","https://openalex.org/W2093778976","https://openalex.org/W2121096056","https://openalex.org/W2148596493","https://openalex.org/W2151592156","https://openalex.org/W4211148203"],"related_works":["https://openalex.org/W2055661074","https://openalex.org/W2007460059","https://openalex.org/W2950639761","https://openalex.org/W2048822896","https://openalex.org/W7104253780","https://openalex.org/W1973863118","https://openalex.org/W2039415405","https://openalex.org/W2604415056","https://openalex.org/W3209053379","https://openalex.org/W1077086494"],"abstract_inverted_index":{"Highly":[0],"textured":[1],"FeSb2":[2,50,59,74,86],"films":[3,75],"were":[4,19,37],"produced":[5],"on":[6],"quartz":[7],"wafers":[8],"by":[9,81],"a":[10,22,88],"sputtering":[11],"method.":[12],"Their":[13],"resistivity":[14],"and":[15,21,45,62],"Seebeck":[16],"coefficient":[17],"(S)":[18],"measured":[20],"maximum":[23],"absolute":[24],"value":[25],"of":[26,48,58,72,85],"S\u223c160":[27],"\u03bcV":[28],"K\u22121":[29],"at":[30,87],"50":[31],"K":[32],"was":[33],"obtained.":[34],"Hall":[35,46],"measurements":[36],"employed":[38],"to":[39,78],"study":[40],"the":[41,49,55,69,73,82],"charge":[42,90],"carrier":[43,91],"concentrations":[44],"mobilities":[47],"films.":[51],"By":[52],"comparing":[53],"with":[54],"transport":[56],"properties":[57,71,84],"single":[60,67],"crystals":[61],"an":[63],"extrinsically":[64],"doped":[65],"FeSb1.98Te0.02":[66],"crystal,":[68],"thermoelectric":[70],"are":[76],"demonstrated":[77],"be":[79],"dominated":[80],"intrinsic":[83],"high":[89],"concentration.":[92]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2016-06-24T00:00:00"}
