{"id":"https://openalex.org/W2075813257","doi":"https://doi.org/10.1016/j.eswa.2008.05.016","title":"Application of self-organizing maps in analysis of wave soldering process","display_name":"Application of self-organizing maps in analysis of wave soldering process","publication_year":2008,"publication_date":"2008-05-12","ids":{"openalex":"https://openalex.org/W2075813257","doi":"https://doi.org/10.1016/j.eswa.2008.05.016","mag":"2075813257"},"language":"en","primary_location":{"id":"doi:10.1016/j.eswa.2008.05.016","doi":"https://doi.org/10.1016/j.eswa.2008.05.016","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.eswa.2008.05.016","pdf_url":null,"source":{"id":"https://openalex.org/S13144211","display_name":"Expert Systems with Applications","issn_l":"0957-4174","issn":["0957-4174","1873-6793"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-c","doyens","fnege-3","jufo-2","ki-jl-2","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Expert Systems with Applications","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045394947","display_name":"Mika Liukkonen","orcid":"https://orcid.org/0000-0002-8656-5226","observed_orcids":["https://orcid.org/0000-0002-8656-5226"]},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"M. Liukkonen","raw_affiliation_strings":["University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland","University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]},{"raw_affiliation_string":"University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland#TAB#","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008284647","display_name":"Elina Havia","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. Havia","raw_affiliation_strings":["Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland","Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland","institution_ids":[]},{"raw_affiliation_string":"Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland#TAB#","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066024356","display_name":"Hannu Leinonen","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Leinonen","raw_affiliation_strings":["Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland","Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland","institution_ids":[]},{"raw_affiliation_string":"Elektroniikan 3K-tehdas, Laitaatsillantie 3, 57170 Savonlinna, Finland#TAB#","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108498841","display_name":"Y. Hiltunen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Y. Hiltunen","raw_affiliation_strings":["University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland","University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]},{"raw_affiliation_string":"University of Kuopio, Department of Environmental Science, P.O. Box 1627, 70211 Kuopio, Finland#TAB#","institution_ids":["https://openalex.org/I175532246"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5045394947"],"corresponding_institution_ids":["https://openalex.org/I175532246"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":6.0587,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.95868275,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"36","issue":"3","first_page":"4604","last_page":"4609"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.048500001430511475,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.016699999570846558,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/self-organizing-maps","display_name":"self-organizing maps","score":0.996999979019165},{"id":"https://openalex.org/keywords/wave-soldering","display_name":"wave soldering","score":0.984000027179718},{"id":"https://openalex.org/keywords/lead-free-soldering","display_name":"lead-free soldering","score":0.9810000061988831},{"id":"https://openalex.org/keywords/soldering-defects","display_name":"soldering defects","score":0.7400000095367432},{"id":"https://openalex.org/keywords/printed-circuit-boards","display_name":"printed circuit boards","score":0.7770000100135803},{"id":"https://openalex.org/keywords/process-parameter-analysis","display_name":"process parameter analysis","score":0.7680000066757202},{"id":"https://openalex.org/keywords/unsupervised-neural-networks","display_name":"unsupervised neural networks","score":0.7649999856948853},{"id":"https://openalex.org/keywords/clustering","display_name":"clustering","score":0.5929999947547913},{"id":"https://openalex.org/keywords/variable-interactions","display_name":"variable interactions","score":0.5839999914169312},{"id":"https://openalex.org/keywords/electronics-manufacturing","display_name":"electronics manufacturing","score":0.5690000057220459}],"concepts":[{"id":"https://openalex.org/C50296614","wikidata":"https://www.wikidata.org/wiki/Q211387","display_name":"Soldering","level":2,"score":0.7467900514602661},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7153735160827637},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.7006616592407227},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6863148212432861},{"id":"https://openalex.org/C97850793","wikidata":"https://www.wikidata.org/wiki/Q1622830","display_name":"Wave soldering","level":3,"score":0.6426552534103394},{"id":"https://openalex.org/C111168008","wikidata":"https://www.wikidata.org/wiki/Q1136838","display_name":"Self-organizing map","level":3,"score":0.6127527952194214},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5565541982650757},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5316035747528076},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5228508114814758},{"id":"https://openalex.org/C2780720960","wikidata":"https://www.wikidata.org/wiki/Q5282052","display_name":"Discrete manufacturing","level":3,"score":0.45759400725364685},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.45578306913375854},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37273305654525757},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36189910769462585},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11502605676651001},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11138835549354553},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.eswa.2008.05.016","doi":"https://doi.org/10.1016/j.eswa.2008.05.016","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.eswa.2008.05.016","pdf_url":null,"source":{"id":"https://openalex.org/S13144211","display_name":"Expert Systems with Applications","issn_l":"0957-4174","issn":["0957-4174","1873-6793"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-c","doyens","fnege-3","jufo-2","ki-jl-2","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Expert Systems with Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1479986428","https://openalex.org/W1562687546","https://openalex.org/W1965557938","https://openalex.org/W2083085982","https://openalex.org/W2124776405","https://openalex.org/W2127218421","https://openalex.org/W2170423728","https://openalex.org/W2299467264","https://openalex.org/W2565956516","https://openalex.org/W3036192984","https://openalex.org/W4232881723"],"related_works":["https://openalex.org/W2068295300","https://openalex.org/W2048109323","https://openalex.org/W1544577158","https://openalex.org/W1527237082","https://openalex.org/W2125242196","https://openalex.org/W2046712608","https://openalex.org/W2045606791","https://openalex.org/W1980719866","https://openalex.org/W1614662662","https://openalex.org/W1965575466"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}