{"id":"https://openalex.org/W2074385451","doi":"https://doi.org/10.1007/s100510050760","title":"Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty?","display_name":"Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty?","publication_year":1999,"publication_date":"1999-05-01","ids":{"openalex":"https://openalex.org/W2074385451","doi":"https://doi.org/10.1007/s100510050760","mag":"2074385451"},"language":"en","primary_location":{"id":"doi:10.1007/s100510050760","doi":"https://doi.org/10.1007/s100510050760","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s100510050760","pdf_url":null,"source":{"id":"https://openalex.org/S9051360","display_name":"The European Physical Journal B","issn_l":"1434-6028","issn":["1434-6028","1434-6036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal B","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049350809","display_name":"A. Bergamin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Bergamin","raw_affiliation_strings":["CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027707905","display_name":"Giovanni Cavagnero","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Cavagnero","raw_affiliation_strings":["CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007724858","display_name":"G. Mana","orcid":"https://orcid.org/0000-0002-4109-7254","observed_orcids":["https://orcid.org/0000-0002-4109-7254"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Mana","raw_affiliation_strings":["CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNR, Istituto di Metrologia \u201cG. Colonnetti\u201d, strada delle Cacce 73, 10135 Torino, Italy, IT","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110074607","display_name":"G. Zosi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I55143463","display_name":"University of Turin","ror":"https://ror.org/048tbm396","country_code":"IT","type":"education","lineage":["https://openalex.org/I55143463"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Zosi","raw_affiliation_strings":["Universit\u00e0 di Torino, Dipartimento di Fisica Generale, via P. Giuria 1, 10125 Torino, Italy, , IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Torino, Dipartimento di Fisica Generale, via P. Giuria 1, 10125 Torino, Italy, , IT","institution_ids":["https://openalex.org/I55143463"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3490,"currency":"USD","value_usd":3490},"apc_paid":null,"fwci":4.8763,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.95833333,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"9","issue":"2","first_page":"225","last_page":"232"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.7490000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.7490000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.156700000166893,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.07739999890327454,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.7559999823570251},{"id":"https://openalex.org/keywords/error-budget","display_name":"error budget","score":0.9160000085830688},{"id":"https://openalex.org/keywords/relative-uncertainty","display_name":"relative uncertainty","score":0.6399999856948853},{"id":"https://openalex.org/keywords/single-crystal-silicon","display_name":"monocrystalline silicon","score":0.8320000171661377}],"concepts":[{"id":"https://openalex.org/C26953177","wikidata":"https://www.wikidata.org/wiki/Q3960534","display_name":"Monocrystalline silicon","level":3,"score":0.7998316287994385},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.768377959728241},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7502306699752808},{"id":"https://openalex.org/C2776654903","wikidata":"https://www.wikidata.org/wiki/Q2601463","display_name":"SAFER","level":2,"score":0.6839689016342163},{"id":"https://openalex.org/C2781204021","wikidata":"https://www.wikidata.org/wiki/Q6497091","display_name":"Lattice (music)","level":2,"score":0.5813032984733582},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5795319080352783},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.5321138501167297},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.5072957873344421},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4908908009529114},{"id":"https://openalex.org/C132612359","wikidata":"https://www.wikidata.org/wiki/Q625641","display_name":"Lattice constant","level":3,"score":0.48440390825271606},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.46789753437042236},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4006309509277344},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37851250171661377},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3618270754814148},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2981151044368744},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24630701541900635},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23466706275939941},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13824597001075745},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.1303015947341919},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.11356052756309509},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s100510050760","doi":"https://doi.org/10.1007/s100510050760","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s100510050760","pdf_url":null,"source":{"id":"https://openalex.org/S9051360","display_name":"The European Physical Journal B","issn_l":"1434-6028","issn":["1434-6028","1434-6036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal B","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1007/s100510050760","doi":null,"is_oa":false,"landing_page_url":"http://www.springerlink.com/content/fulltext.pdf?id=doi:10.1007/s100510050760","pdf_url":"http://www.springerlink.com/content/fulltext.pdf?id=doi:10.1007/s100510050760","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1007/s100510050760","raw_type":"Text"},{"id":"pmh:oai:iris.inrim.it:11696/34717","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11696/34717","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5099999904632568}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1658856141"],"related_works":["https://openalex.org/W1810710416","https://openalex.org/W1678204188","https://openalex.org/W2099141342","https://openalex.org/W2068286759","https://openalex.org/W2899019437","https://openalex.org/W1964886906","https://openalex.org/W2162554495","https://openalex.org/W2040059868","https://openalex.org/W2101737336","https://openalex.org/W2161602068"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}